Search Results - "Kothnur, Prashanth"

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  1. 1

    Experimental and numerical study of external plume Characteristics in microhollow cathode discharges by Kothnur, P.S., Shin, J., Raja, L.L.

    Published in IEEE transactions on plasma science (01-04-2005)
    “…Microhollow cathode (MHC) discharges are a class of miniature nonequilibrium high-pressure plasma discharges characterized by intense radiation and high gas…”
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    Journal Article
  2. 2

    Modeling and Optimizing the Impact of Process and Equipment Parameters in Sputtering Deposition Systems Using a Gaussian Process Machine Learning Framework by Lang, Christopher I., Jansen, Alexander, Didari, Sima, Kothnur, Prashanth, Boning, Duane S.

    “…We present a method for empirically modeling and optimizing variations in sputtering deposition processes using Gaussian Process (GP) machine learning methods…”
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    Journal Article
  3. 3

    Structure of direct-current microdischarge plasmas in helium by Kothnur, Prashanth S., Yuan, Xiaohui, Raja, Laxminarayan L.

    Published in Applied physics letters (27-01-2003)
    “…A one-dimensional, self-consistent, continuum model is used to elucidate plasma phenomena in a parallel-plate dc microdischarge with a 250 μm gap at a pressure…”
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    Journal Article
  4. 4

    Simulation of direct current microdischarges for microthruster applications by Kothnur, Prashanth Srinivasa

    Published 01-01-2005
    “…The structure of direct-current microdischarges (MDs) is investigated using a detailed two-dimensional multispecies continuum model. MDs are direct-current…”
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    Dissertation
  5. 5

    Simulation of direct current microdischarges for microthruster applications by Kothnur, Prashanth Srinivasa

    “…The structure of direct-current microdischarges (MDs) is investigated using a detailed two-dimensional multispecies continuum model. MDs are direct-current…”
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    Dissertation
  6. 6

    Decoration of particles by thin tantalum films by Pandit, Viraj, Prater, Walter, Tran, Natalie, Kothnur, Prashanth

    “…Surface particle defects smaller than the minimum detection limit (MDL) of particle detection metrology, may, after a thin-film deposition step, get decorated…”
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    Conference Proceeding