Titanium ion effects on the spectroscopic and electrical characteristics of germano silicate lead alumino tellurite glass ceramics for dielectric applications

Titanium ion effects on the spectroscopic and electrical characteristics of germano silicate lead alumino tellurite glass ceramics for dielectric applications

The Glass-ceramics 10GeO2-(55-x) SiO2–29PbO–5Al2O3–1TeO2 doped with varying amounts of TiO2 (0 < x < 5 mol %) were prepared through the process of melt quenching followed by heat treatment. X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and Differential Thermal Analysis (DTA) were...

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Bibliographic Details
Published in:Optical materials Vol. 157; p. 116235
Main Authors: Tirupataiah, Ch, Sambasiva Rao, M.V., Suneel Kumar, A., Krishna Rao, D., Suragani, Suresh, Kotcharla, Hanumantha Rao, Vijayalakshmi, L., Kwon, Seong Jin
Format: Journal Article
Language:English
Published: Elsevier B.V 01-11-2024
Subjects:
FTIR
Glass ceramics
Impedance
Melt quenching
Optical absorption
XRD
XRD
Glass ceramics
Impedance
Melt quenching
FTIR
Optical absorption
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Summary:The Glass-ceramics 10GeO2-(55-x) SiO2–29PbO–5Al2O3–1TeO2 doped with varying amounts of TiO2 (0 < x < 5 mol %) were prepared through the process of melt quenching followed by heat treatment. X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and Differential Thermal Analysis (DTA) were used to analyze these glass ceramics besides the usual spectral studies like optical absorption, Electron Paramagnetic Resonance (EPR), Fourier Transform Infrared Spectroscopy (FTIR) and Raman. These investigations demonstrated the existence of crystalline phases that comprise complexes of Ti4+ as well as Ti3+ ions that were dispersed randomly. Additionally, it is seen that Ti3+ ions, which are more prevalent as TiO2 concentration rises, take up the tetragonally deformed octahedral positions inside the network of glass ceramics. FTIR spectra of the synthesized samples provided information regarding the existence of different structural units in the glass ceramic matrix, which included SiO4, GeO4, GeO6, PbO4, PbO6, AlO6, TeO4, TeO3, TiO4, and TiO6. At 30 °C, the 3 mol % Ti-doped sample has a minimum conductivity of 1.623 × 10−9 S cm−1. Therefore, the dielectric and spectroscopic investigations suggest that glass ceramics containing 3 mol% of TiO2 are rigid and appropriate for dielectric applications. •Titled glass ceramics were prepared by melt quenching followed by heat treatment.•Characterization techniques employed on the samples were XRD, SEM, EDS and DTA.•Optical absorption, FTIR, Raman and EPR studies were also carried out.•Studies showed the presence of randomly dispersed complexes of Ti4+ and Ti3+ ions.•At higher content, 3–5 mol %, of TiO2 reduction of Ti4+ to Ti3+ ions resulted.
ISSN:0925-3467
DOI:10.1016/j.optmat.2024.116235