Search Results - "Kosonocky, W.F."
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Visible and infrared solid-state image sensors
Published in 1983 International Electron Devices Meeting (1983)“…This paper reviews the progress, major issues, and trends in the development of solid-state visible and infrared image sensors. The most common photodetector…”
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Free charge transfer in charge-coupled devices
Published in IEEE transactions on electron devices (01-06-1972)“…The free charge-transfer characteristics of charge-coupled devices (CCD's) are analyzed in terms of the charge motion due to thermal diffusion, self-induced…”
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360×360 element three-phase very high frame rate burst image sensor: design, operation and performance
Published in IEEE transactions on electron devices (01-10-1997)Get full text
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360/spl times/360 element three-phase very high frame rate burst image sensor: design, operation and performance
Published in IEEE transactions on electron devices (01-10-1997)“…Design, fabrication, operation and performance are described for a 360/spl times/360 element very high frame rate (VHFR) image sensor that can capture images…”
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Foreword
Published in IEEE transactions on electron devices (01-08-1985)Get full text
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Foreword
Published in IEEE transactions on electron devices (01-08-1985)Get full text
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160 × 244 Element PtSi Schottky-barrier IR-CCD image sensor
Published in IEEE transactions on electron devices (01-08-1985)“…A 160 × 244 element IR-CCD image sensor was developed with PtSi Schottky-barrier detectors (SBD's) for thermal imaging in the 3.0-5.0-µm IR band. This imager…”
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Dark current analysis and characterization of In/sub x/Ga/sub 1-x/As/InAs/sub y/P/sub 1-y/ graded photodiodes with x>0.53 for response to longer wavelengths (>1.7 mu m)
Published in Journal of lightwave technology (01-08-1992)“…The dark current properties of In/sub x/Ga/sub 1-x/As photodiodes, where x is varied from 0.53 to 0.82 for extending the long wavelength cutoff from 1.7 to 2.6…”
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Signal processing computer system for multi-wavelength imaging pyrometer
Published in 1996 IEEE International Conference on Systems, Man and Cybernetics. Information Intelligence and Systems (Cat. No.96CH35929) (1996)“…The development of the multi-wavelength imaging pyrometer (M-WIP) workstation, a signal processing computer system for multi-wavelength imaging pyrometer, is…”
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10
Changes in the editorial board
Published in IEEE transactions on electron devices (01-10-1987)Get full text
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11
Foreword
Published in IEEE transactions on electron devices (01-04-1982)Get full text
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Foreword
Published in IEEE transactions on electron devices (01-04-1982)Get full text
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Foreword
Published in IEEE transactions on electron devices (01-08-1980)Get full text
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Foreword
Published in IEEE transactions on electron devices (01-08-1980)Get full text
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360/spl times/360-element very-high-frame-rate burst image sensor
Published in 1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC (1996)“…A 360/spl times/360-element very high frame rate (VHFR) burst image sensor captures images at maximum frame rate up to 10/sup g/ frame/s. This is accomplished…”
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16
Foreword
Published in IEEE transactions on electron devices (01-04-1979)Get full text
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Foreword
Published in IEEE transactions on electron devices (01-04-1979)Get full text
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Infrared solder joint inspection on surface mount printed circuit boards
Published in 38th Midwest Symposium on Circuits and Systems. Proceedings (1995)“…This paper reported some experimental work and the result of applying an infrared inspection system developed in the Machine Vision Laboratory, NJIT to inspect…”
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19
Shortwave infrared 512 × 2 line sensor for earth resources applications
Published in IEEE transactions on electron devices (01-08-1985)“…A buttable 512 × 2 IRCCD line image sensor was developed with Pd 2 Si Schottky-barrier detectors for operation with passive cooling at 120 K in the shortwave…”
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20
Experimental measurement of noise in charge-coupled devices
Published in 1972 International Electron Devices Meeting (1972)“…Various workers have predicted that the CCD should be a low-noise device. This paper will discuss measurements of noise in 32, 64 and 128 bit 2-phase…”
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