Search Results - "Korytar, D."

Refine Results
  1. 1

    Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties by Zaťko, B., Hrubčín, L., Šagátová, A., Osvald, J., Boháček, P., Zápražný, Z., Sedlačková, K., Sekáčová, M., Dubecký, F., Skuratov, V.A., Korytár, D., Nečas, V.

    Published in Applied surface science (15-12-2018)
    “…•Schottky diodes based on 4H-SiC high quality epitaxial layer were fabricated.•The typical reverse current of measured diodes was below 30 pA up to bias of…”
    Get full text
    Journal Article
  2. 2

    Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation by Wachulak, P. W., Węgrzyński, Ł., Zápražný, Z., Bartnik, A., Fok, T., Jarocki, R., Kostecki, J., Szczurek, M., Korytár, D., Fiedorowicz, H.

    Published in Applied physics. B, Lasers and optics (01-10-2014)
    “…A volume, tomographic reconstruction of a novel, multi-jet gas puff target, developed for possible applications in high-order harmonic generation (HHG), is…”
    Get full text
    Journal Article
  3. 3

    Laboratory-based multi-modal X-ray microscopy and micro-CT with Bragg magnifiers by Vagovič, P, Korytár, D, Cecilia, A, Hamann, E, Baumbach, T, Pelliccia, D

    Published in Optics express (13-07-2015)
    “…We report on the successful demonstration of X-ray phase contrast microscopy and micro computed tomography (CT) with a Bragg magnifier microscope (BMM) in a…”
    Get full text
    Journal Article
  4. 4

    Study of subsurface damage in Ge optics machined by SPDT by Zaprazny, Z., Korytar, D., Zat'ko, B., Jergel, M., Halahovets, Y., Dobrovodsky, Jozef, Noga, Pavol

    “…Single point diamond turning (SPDT) allows to finish Ge surfaces with a high shape accuracy, low surface roughness and low subsurface damage. We use SPDT for…”
    Get full text
    Conference Proceeding
  5. 5

    X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval by Vagovič, P, Svéda, L, Cecilia, A, Hamann, E, Pelliccia, D, Gimenez, E N, Korytár, D, Pavlov, K M, Zápražný, Z, Zuber, M, Koenig, T, Olbinado, M, Yashiro, W, Momose, A, Fiederle, M, Baumbach, T

    Published in Optics express (08-09-2014)
    “…We present the theoretical description of the image formation with the in-line germanium Bragg Magnifier Microscope (BMM) and the first successful phase…”
    Get full text
    Journal Article
  6. 6

    A monolithic monochromator-collimator for high-resolution X-ray diffraction by Ferrari, Claudio, Korytar, Dusan

    Published in Journal of applied crystallography (01-10-2001)
    “…The possibility of finding, for a given X‐ray wavelength, the conditions for obtaining multiple coplanar reflections in a single block of crystal is…”
    Get full text
    Journal Article
  7. 7

    Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging by Korytár, D., Vagovič, P., Végsö, K., Šiffalovič, P., Dobročka, E., Jark, W., Áč, V., Zápražný, Z., Ferrari, C., Cecilia, A., Hamann, E., Mikulík, P., Baumbach, T., Fiederle, M., Jergel, M.

    Published in Journal of applied crystallography (01-08-2013)
    “…While channel‐cut crystals, in which the diffracting surfaces in an asymmetric cut are kept parallel, can provide beam collimation and spectral beam shaping,…”
    Get full text
    Journal Article
  8. 8

    Linearly graded GeSi beam-expanding/compressing X-ray monochromator by Korytár, D., Ferrari, C., Mikulík, P., Vagovič, P., Dobročka, E., Áč, V., Konopka, P., Erko, A., Abrosimov, N.

    Published in Journal of applied crystallography (01-02-2010)
    “…In standard single‐crystal V‐channel germanium (220) X‐ray beam‐expanding/compressing monochromators for Cu Kα1 radiation, a total beam expansion/compression…”
    Get full text
    Journal Article
  9. 9

    X-ray Multiple-Beam Analysis in High-Resolution Diffractometry of III-V Heterostructures by Korytár, D., Ferrari, C., Bochníček, Z.

    Published in Journal of applied crystallography (01-08-1998)
    “…High‐resolution X‐ray diffractometry is used to measure such parameters of heteroepitaxic III–V layers as the substrate miscut angle α, the relative lattice…”
    Get full text
    Journal Article
  10. 10

    Analysis of SR thermal load studied by FEA by AC, V, KORYTAR, D

    “…This work deals with analysis of the thermal effects and inherent mechanical deformations under absorption of the X‐ray beam heat. The work is motivated by…”
    Get full text
    Journal Article Conference Proceeding
  11. 11

    Curved focusing crystals for hard X-ray astronomy by Ferrari, C., Buffagni, E., Bonnini, E., Korytar, D.

    Published in Crystallography reports (01-12-2013)
    “…A lens made by a properly arranged array of crystals can be used to focus x-rays of energy ranging from 30 to 500 keV for x-ray astronomy. Mosaic or curved…”
    Get full text
    Journal Article
  12. 12

    Two-beam dynamical approach to multiple successive diffractors in X-ray crystal optics by Korytar, D, Besse, I, Bohacek, P

    Published in Czechoslovak journal of physics (01-11-1996)
    “…To devise and optimize new monolithic components for XRD optics, more and more refined theoretical procedures are required. In addition to the simple…”
    Get full text
    Journal Article
  13. 13
  14. 14

    Correlation of crystal defects and galvanomagnetic parameters of semi-insulating InP with performance of radiation detectors fabricated from characterised materials by Boháček, P, Korytár, D, Ferrari, C, Dubecký, F, Surma, B, Zat'ko, B, Šmatko, V, Huran, J, Fornari, R, Sekáčová, M, Strzelecka, S

    “…Semi-insulating (SI) InP substrates from four producers have been studied by galvanomagnetic methods, X-ray diffraction, laser scattering tomography, and…”
    Get full text
    Journal Article Conference Proceeding
  15. 15

    Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging by Ferrari, Claudio, Pernot, Petra, Mikulík, Petr, Helfen, Lukas, Verdi, Nicola, Baumbach, Tilo, Lübbert, Daniel, Korytár, Dušan

    Published in Journal of applied crystallography (01-02-2005)
    “…The method called `rocking‐curve imaging' (RCI) has recently been developed to visualize lattice imperfections in large crystals such as semiconductor wafers…”
    Get full text
    Journal Article
  16. 16
  17. 17
  18. 18
  19. 19
  20. 20