Search Results - "Korytar, D."
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Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties
Published in Applied surface science (15-12-2018)“…•Schottky diodes based on 4H-SiC high quality epitaxial layer were fabricated.•The typical reverse current of measured diodes was below 30 pA up to bias of…”
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Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation
Published in Applied physics. B, Lasers and optics (01-10-2014)“…A volume, tomographic reconstruction of a novel, multi-jet gas puff target, developed for possible applications in high-order harmonic generation (HHG), is…”
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Laboratory-based multi-modal X-ray microscopy and micro-CT with Bragg magnifiers
Published in Optics express (13-07-2015)“…We report on the successful demonstration of X-ray phase contrast microscopy and micro computed tomography (CT) with a Bragg magnifier microscope (BMM) in a…”
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Study of subsurface damage in Ge optics machined by SPDT
Published in 2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) (11-10-2020)“…Single point diamond turning (SPDT) allows to finish Ge surfaces with a high shape accuracy, low surface roughness and low subsurface damage. We use SPDT for…”
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Conference Proceeding -
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X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval
Published in Optics express (08-09-2014)“…We present the theoretical description of the image formation with the in-line germanium Bragg Magnifier Microscope (BMM) and the first successful phase…”
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A monolithic monochromator-collimator for high-resolution X-ray diffraction
Published in Journal of applied crystallography (01-10-2001)“…The possibility of finding, for a given X‐ray wavelength, the conditions for obtaining multiple coplanar reflections in a single block of crystal is…”
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Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging
Published in Journal of applied crystallography (01-08-2013)“…While channel‐cut crystals, in which the diffracting surfaces in an asymmetric cut are kept parallel, can provide beam collimation and spectral beam shaping,…”
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Linearly graded GeSi beam-expanding/compressing X-ray monochromator
Published in Journal of applied crystallography (01-02-2010)“…In standard single‐crystal V‐channel germanium (220) X‐ray beam‐expanding/compressing monochromators for Cu Kα1 radiation, a total beam expansion/compression…”
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X-ray Multiple-Beam Analysis in High-Resolution Diffractometry of III-V Heterostructures
Published in Journal of applied crystallography (01-08-1998)“…High‐resolution X‐ray diffractometry is used to measure such parameters of heteroepitaxic III–V layers as the substrate miscut angle α, the relative lattice…”
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Analysis of SR thermal load studied by FEA
Published in Physica status solidi. A, Applications and materials science (01-08-2007)“…This work deals with analysis of the thermal effects and inherent mechanical deformations under absorption of the X‐ray beam heat. The work is motivated by…”
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Journal Article Conference Proceeding -
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Curved focusing crystals for hard X-ray astronomy
Published in Crystallography reports (01-12-2013)“…A lens made by a properly arranged array of crystals can be used to focus x-rays of energy ranging from 30 to 500 keV for x-ray astronomy. Mosaic or curved…”
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Two-beam dynamical approach to multiple successive diffractors in X-ray crystal optics
Published in Czechoslovak journal of physics (01-11-1996)“…To devise and optimize new monolithic components for XRD optics, more and more refined theoretical procedures are required. In addition to the simple…”
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Study of residual strains in wafer crystals by means of lattice tilt mapping
Published in Il nuovo cimento della Società italiana di fisica. Sezione D (01-02-1997)Get full text
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Correlation of crystal defects and galvanomagnetic parameters of semi-insulating InP with performance of radiation detectors fabricated from characterised materials
Published in Materials science & engineering. B, Solid-state materials for advanced technology (30-04-2002)“…Semi-insulating (SI) InP substrates from four producers have been studied by galvanomagnetic methods, X-ray diffraction, laser scattering tomography, and…”
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Journal Article Conference Proceeding -
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Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
Published in Journal of applied crystallography (01-02-2005)“…The method called `rocking‐curve imaging' (RCI) has recently been developed to visualize lattice imperfections in large crystals such as semiconductor wafers…”
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Electrical and detection performance of radiation detector based on bulk semi-insulating InP:Fe: role of detector volume
Published in ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) (2000)“…In this work study of bulk semi-insulating (SI) InP:Fe-based particle detectors with emphasise to the role of detector volume is presented. Detectors based on…”
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Conference Proceeding -
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On the physical parameters and crystal defects of bulk semi-insulating InP for radiation detector fabrication
Published in 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI (Cat. No.00CH37046) (2000)“…Semi-insulating (SI) InP substrates from various producers have been studied by the Hall technique, X-ray diffraction, laser scattering tomography and…”
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Monolithic devices for high-resolution X-ray diffractometry and topography
Published in Il nuovo cimento della Società italiana di fisica. Sezione D (01-02-1997)Get full text
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Lateral lattice parameter variation measurement by means of a double crystal X-ray method with oscillating slit
Published in Czechoslovak journal of physics (01-12-1984)Get full text
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