Search Results - "Korkian, Golnaz"

Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories by Korkian, Golnaz, Leon, Daniel, Franco, Francisco J., Fabero, Juan C., Letiche, Manon, Morilla, Yolanda, Martin-Holgado, Pedro, Puchner, Helmut, Mecha, Hortensia, Clemente, Juan A.

“…In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers…”
Get full text

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode by Fabero, Juan Carlos, Mecha, Hortensia, Franco, Francisco J., Clemente, Juan Antonio, Korkian, Golnaz, Rey, Solenne, Cheymol, Benjamin, Baylac, Maud, Hubert, Guillaume, Velazco, Raoul

“…A sensitivity characterization of a Xilinx Artix-7 field programmable gate array (FPGA) against 14.2-MeV neutrons is presented. The content of the internal…”
Get full text

Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests by Franco, Francisco J., Clemente, Juan A., Korkian, Golnaz, Fabero, Juan C., Mecha, Hortensia, Velazco, Raoul

“…In radiation tests on SRAMs or field-programmable gate arrays (FPGAs), two or more independent bitflips can be misled with a multiple event if they…”
Get full text

Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles by Korkian, Golnaz, Fabero, Juan Carlos, Hubert, Guillaume, Rezaei, Mohammadreza, Mecha, Hortensia, Franco, Francisco J., Puchner, Helmut, Clemente, Juan Antonio

“…In harsh radiation environments, it is well known that the angle of incidence of impinging particles against the surface of the operating devices has…”
Get full text

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles by Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Hubert, Guillaume, Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.

“…This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation of a 28-nm bulk…”
Get full text

Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles by Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.

“…This paper presents an experimental study of the SEU susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS)…”
Get full text

Exploration of ring oscillator based temperature sensors network accuracy on FPGA by Korkian, Golnaz, Rahmanikia, Navid, Noori, Hamid, Clemente, Juan Antonio

“…During the last decades, technology scaling in reconfigurable logic devices enabled implementing complicated designs which results in higher power density and…”
Get full text

Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories by Korkian, Golnaz, Leon, Daniel, Franco, Francisco J, Fabero, Juan C, Letiche, Manon, Morilla, Yolanda, Martin-Holgado, Pedro, Puchner, Helmut, Mecha, Hortensia, Clemente, Juan A

“…In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers…”
Get full text