Search Results - "Kopalko Krzysztof"

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  1. 1

    Structural Properties of Thin ZnO Films Deposited by ALD under O-Rich and Zn-Rich Growth Conditions and Their Relationship with Electrical Parameters by Mishra, Sushma, Przezdziecka, Ewa, Wozniak, Wojciech, Adhikari, Abinash, Jakiela, Rafal, Paszkowicz, Wojciech, Sulich, Adrian, Ozga, Monika, Kopalko, Krzysztof, Guziewicz, Elzbieta

    Published in Materials (20-07-2021)
    “…The structural, optical, and electrical properties of ZnO are intimately intertwined. In the present work, the structural and transport properties of 100 nm…”
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    Journal Article
  2. 2

    Impact of GaAs(100) surface preparation on EQE of AZO/Al2O3/p-GaAs photovoltaic structures by Caban Piotr, Pietruszka Rafał, Kaszewski Jarosław, Ożga Monika, Witkowski, Bartłomiej S, Kopalko Krzysztof, Kuźmiuk Piotr, Gwóźdź Katarzyna, Płaczek-Popko Ewa, Lawniczak-Jablonska Krystyna, Godlewski Marek

    “…In order to effectively utilize the photovoltaic properties of gallium arsenide, its surface/interface needs to be properly prepared. In the experiments…”
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    Journal Article
  3. 3

    Photovoltaic properties of ZnO nanorods/p-type Si heterojunction structures by Pietruszka, Rafal, Witkowski, Bartlomiej Slawomir, Luka, Grzegorz, Wachnicki, Lukasz, Gieraltowska, Sylwia, Kopalko, Krzysztof, Zielony, Eunika, Bieganski, Piotr, Placzek-Popko, Ewa, Godlewski, Marek

    Published in Beilstein journal of nanotechnology (14-02-2014)
    “…Selected properties of photovoltaic (PV) structures based on n-type zinc oxide nanorods grown by a low temperature hydrothermal method on p-type silicon…”
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    Journal Article
  4. 4

    Electrical properties of ZnO films implanted with rare earth and their relationship with structural and optical parameters by Krajewski, Tomasz A., Ratajczak, Renata, Kobyakov, Serhiy, Wozniak, Wojciech, Kopalko, Krzysztof, Guziewicz, Elzbieta

    “…[Display omitted] •High-quality ZnO films were obtained by low temperature Atomic Layer Deposition.•Implantation-induced structural and optical response of…”
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    Journal Article
  5. 5

    Correlations between the structural transformations and concentration quenching effect for RE-implanted ZnO systems by Ratajczak, Renata, Mieszczynski, Cyprian, Prucnal, Sławomir, Krajewski, Tomasz A., Guziewicz, Elżbieta, Wozniak, Wojciech, Kopalko, Krzysztof, Heller, Rene, Akhmadaliev, Shavkat

    Published in Applied surface science (15-08-2020)
    “…[Display omitted] •Defect accumulation process leads to the defect transformation into a new form.•Above plastic deformation producing dislocation tangles and…”
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    Journal Article
  6. 6
  7. 7

    Tuning the properties of ALD-ZnO-based rectifying structures by thin dielectric film insertion – Modeling and experimental studies by Krajewski, Tomasz A., Smertenko, Petro S., Luka, Grzegorz, Snigurenko, Dymitr, Kopalko, Krzysztof, Lusakowska, Elzbieta, Jakiela, Rafal, Guziewicz, Elzbieta

    Published in Journal of alloys and compounds (05-02-2017)
    “…This paper is devoted to the electrophysical diagnostics of the ZnO-based rectifying structures in which the semiconducting oxide layer has been obtained by…”
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    Journal Article
  8. 8

    Investigation of Defects Origin in p-Type Si for Solar Applications by Gwóźdź, Katarzyna, Placzek-Popko, Ewa, Mikosza, Maciej, Zielony, Eunika, Pietruszka, Rafal, Kopalko, Krzysztof, Godlewski, Marek

    Published in Journal of electronic materials (01-07-2017)
    “…In order to improve the efficiency of a solar cell based on silicon, one must find a compromise between its price and crystalline quality. That is precisely…”
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    Journal Article
  9. 9
  10. 10

    Electrical and optical properties of zinc oxide layers grown by the low-temperature atomic layer deposition technique by Krajewski, Tomasz A., Dybko, Krzysztof, Luka, Grzegorz, Wachnicki, Lukasz, Witkowski, Bartlomiej S., Duzynska, Anna, Kopalko, Krzysztof, Lusakowska, Elzbieta, Kowalski, Bogdan J., Godlewski, Marek, Guziewicz, Elzbieta

    Published in Physica status solidi. B. Basic research (01-07-2010)
    “…This paper reports on the electrical and optical properties of zinc oxide thin films grown at the temperature range between 160 and 240 °C by the atomic layer…”
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    Journal Article Conference Proceeding