Search Results - "Kon’kov, O.I"
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Modification of the structure and percolation of current in an array of single-walled carbon nanotubes
Published in Physics of the solid state (01-07-2014)“…Percolation and electrical instability processes in an array of single-walled carbon nanotubes have been studied experimentally. The experiment is based on…”
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Percolation, self-organized criticality, and electrical instability in carbon nanostructures
Published in Physics of the solid state (01-11-2012)“…The processes of avalanche formation, percolation, and electrical instability have been investigated experimentally using multi-walled and single-walled carbon…”
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3
On the collection of photocarriers in high-resistance silicon amorphous-crystalline heterostructures
Published in Semiconductors (Woodbury, N.Y.) (01-09-2014)“…The mechanism of electron transport in amorphous-crystalline heterostructures fabricated on the basis of high-resistivity p -Si is considered in order to…”
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Carbon nanostructures as an example of the self-organized criticality
Published in Physics of the solid state (01-03-2012)“…The mechanism of self-organized criticality in the region of the nano- and microsizes has been studied experimentally using carbon multiwalled nanotubes and…”
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I-V characteristics of high-voltage 4H-SiC diodes with a 1.1-eV Schottky barrier
Published in Semiconductors (Woodbury, N.Y.) (01-10-2011)“…The I - V characteristics of high-voltage 4 H -SiC diodes with a Schottky barrier ∼1.1 eV in height are measured and analyzed. The forward I - V…”
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6
High-voltage (3.3 kV) 4H-SiC JBS diodes
Published in Semiconductors (Woodbury, N.Y.) (01-05-2011)“…High-voltage 4 H -SiC junction-barrier Schottky (JBS) diodes have been fabricated and studied. The working area of the diodes (anode contact area) is 1.44 mm 2…”
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Microdetermination of titanium on the developed silicon surface using cells made of perfluorinated proton-conducting membranes
Published in Technical physics (01-05-2013)“…A technique for microdetermination of titanium on the developed silicon surface is suggested. In this technique, thin titanium layers are dissolved in an…”
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Leakage currents in 4H-SiC JBS diodes
Published in Semiconductors (Woodbury, N.Y.) (01-03-2012)“…Leakage currents in high-voltage 4 H -SiC diodes, which have an integrated ( p - n ) Schottky structure (Junction Barrier Schottky, JBS), have been studied…”
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Excess leakage currents in high-voltage 4H-SiC Schottky diodes
Published in Semiconductors (Woodbury, N.Y.) (01-05-2010)“…The high-voltage 4 H -SiC Schottky diodes are fabricated with a nickel barrier and a guard system in the form of “floating” planar p-n junctions. The analysis…”
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10
Specific features of amorphous silicon layers grown by plasma-enhanced chemical vapor deposition with tetrafluorosilane
Published in Semiconductors (Woodbury, N.Y.) (01-03-2011)“…Hydrogenated amorphous silicon layers with crystalline nanoparticles have been produced by plasma-enhanced chemical vapor deposition, with tetrafluorosilane…”
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Lithium insertion into amorphous silicon thin-film electrodes
Published in Journal of electroanalytical chemistry (Lausanne, Switzerland) (01-02-2007)“…The electrochemical lithium insertion into a-Si:H thin-film electrodes, CVD-grown on stainless-steel substrates at 100 and 250 °C, is studied using…”
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12
Dynamic characteristics of 4H-SiC drift step recovery diodes
Published in Semiconductors (Woodbury, N.Y.) (01-11-2015)“…The dynamic characteristics of 4 H -SiC p + – p – n 0 – n + diodes are experimentally studied in the pulsed modes characteristic of the operation of drift step…”
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Effect of the femtosecond laser treatment of hydrogenated amorphous silicon films on their structural, optical, and photoelectric properties
Published in Semiconductors (Woodbury, N.Y.) (01-06-2012)“…The effect of the femtosecond laser treatment of hydrogenated amorphous silicon ( a -Si:H) films on their structural, optical, and photoelectric properties is…”
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Resistance of 4H-SiC Schottky barriers at high forward-current densities
Published in Semiconductors (Woodbury, N.Y.) (01-07-2015)“…The resistance of Schottky barriers based on 4 H -SiC is experimentally determined at high forward-current densities. The measured resistance is found to be…”
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15
A large area silicon UCN detector with the analysis of UCN polarization
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11-06-2005)“…A silicon UCN detector with an area of 45 cm 2 and with a 6 LiF converter was developed at PNPI. The spectral efficiency of the silicon UCN detector was…”
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Iron disilicide formed in a-Si〈Fe〉 thin films by magnetron co-sputtering
Published in Physica. B, Condensed matter (31-12-2003)“…The formation of β-FeSi2 precipitates was observed for the first time in microcrystalline Si films. The Fe-doped amorphous Si films (a-Si:Fe) were obtained…”
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Erbium incorporation in plasma-deposited amorphous silicon
Published in Journal of non-crystalline solids (01-05-2000)“…Erbium doped amorphous silicon has been prepared by the evaporation of Er containing metallo-organics inside the plasma of a plasma enhanced chemical vapor…”
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Amorphous carbon: how much of free hydrogen?
Published in Diamond and related materials (01-04-2000)Get full text
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Electronic properties of Erbium doped amorphous silicon
Published in Materials science & engineering. B, Solid-state materials for advanced technology (24-04-2001)“…The electronic properties of Er doped PECVD a-Si:H films, produced by the evaporation of an Er containing metal-organic compound into the glow discharge have…”
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Structure and properties of a-Si:H films grown by cyclic deposition
Published in Semiconductors (Woodbury, N.Y.) (01-01-2000)Get full text
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