Search Results - "Kolpin, K."
-
1
Hot topic: Black spot defect in Cheddar cheese linked to intramammary teat sealant
Published in Journal of dairy science (01-11-2007)“…The objective of this work was to characterize a novel appearance defect found in Cheddar cheese, heretofore referred to as black spot defect (BSD), and to…”
Get more information
Journal Article -
2
New insights on the PBTI phenomena in SiON pMOSFETs
Published in Microelectronics and reliability (01-09-2012)“…The physical origin of both Negative- and Positive Bias Temperature Instability (N-/PBTI) is still unclear and under debate. We analyzed the rarely studied…”
Get full text
Journal Article Conference Proceeding -
3
A fWLR test structure and method for device reliability monitoring using product relevant circuits
Published in 2015 IEEE International Reliability Physics Symposium (01-04-2015)“…The measurement of device degradation in product relevant circuits during production monitoring is described. Ring oscillators with local on-chip heaters are…”
Get full text
Conference Proceeding -
4
Degradates provide insight to spatial and temporal trends of herbicides in ground water
Published in Ground water (01-07-2004)“…Since 1995, a network of municipal wells in Iowa, representing all major aquifer types (alluvial, bedrock/karst region, glacial drift, bedrock/nonkarst…”
Get full text
Journal Article