Search Results - "Kolbesen, B.O."

Refine Results
  1. 1

    Formation of tantalum nitride films by rapid thermal processing by Angelkort, C, Berendes, A, Lewalter, H, Bock, W, Kolbesen, B.O

    Published in Thin solid films (01-08-2003)
    “…As part of an investigation of transition metal nitrides formed by means of rapid thermal processing, the reactivity of 200/500-nm thick tantalum films…”
    Get full text
    Journal Article
  2. 2

    Formation of vanadium nitride by rapid thermal processing by GALESIC, I, KOLBESEN, B. O

    Published in Thin solid films (30-07-1999)
    “…In the manufacturing of submicron semiconductor devices rapid thermal processing (RTP) is increasingly applied for annealing and preparation of thin films such…”
    Get full text
    Journal Article
  3. 3

    Evaluation of the protein concentration in enzymes via determination of sulfur by total reflection X-ray fluorescence spectrometry — limitations of the method by Mertens, M, Rittmeyer, C, Kolbesen, B.O

    Published in SPECTROCHIM. ACTA PART B AT. SPECTROSC (30-11-2001)
    “…Total reflection X-ray fluorescence spectrometry (TXRF) offers many advantages for the identification of trace elements in biological samples like proteins,…”
    Get full text
    Journal Article Conference Proceeding
  4. 4

    A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films by Kothleitner, Gerald, Rogers, M., Berendes, A., Bock, W., Kolbesen, B.O.

    Published in Applied surface science (30-09-2005)
    “…We investigated the diffusion profiles and core-loss fine-structures (ELNES) of thin vanadium nitride films by electron energy-loss spectroscopy (EELS) and…”
    Get full text
    Journal Article Conference Proceeding
  5. 5

    Formation of niobium oxynitrides by rapid thermal processing (RTP) by Matylitskaya, V.A., Bock, W., Thoma, K., Kolbesen, B.O.

    Published in Applied surface science (30-09-2005)
    “…The potential of rapid thermal processing (RTP) for the preparation of thin films of niobium oxynitrides was investigated. The 200 and 500 nm niobium films…”
    Get full text
    Journal Article Conference Proceeding
  6. 6

    Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(1 0 0) wafers – preparation of oxynitride films by Brunkahl, O., Bock, W., Thoma, K., Kolbesen, B.O.

    Published in Applied surface science (30-09-2005)
    “…Five hundred nanometers of niobium films have been deposited on silicon(1 0 0) wafers with 100 or 300 nm thermally grown oxide by electron beam evaporation and…”
    Get full text
    Journal Article Conference Proceeding
  7. 7

    Niobium nitride films formed by rapid thermal processing (RTP): a study of depth profiles and interface reactions by complementary analytical techniques by Berendes, A, Brunkahl, O, Angelkort, C, Bock, W, Hofer, F, Warbichler, P, Kolbesen, B. O

    Published in Analytical and bioanalytical chemistry (01-06-2004)
    “…The nitridation of niobium films approximately 250 and 650 nm thick by rapid thermal processing (RTP) at 800 °C in molecular nitrogen or ammonia was…”
    Get full text
    Journal Article
  8. 8

    Capability and limitations of the determination of sulfur in inorganic and biological matrices by total reflection X-ray fluorescence spectrometry by Steinmeyer, S, Kolbesen, B.O

    Published in SPECTROCHIM. ACTA PART B AT. SPECTROSC (30-11-2001)
    “…The capability and limitations of TXRF were explored for the determination of the light element sulfur in inorganic and biological samples. The recovery rates…”
    Get full text
    Journal Article Conference Proceeding
  9. 9

    Defects Due to Metal Silicide Precipitation in Microelectronic Device Manufacturing: The Unlovely Face of Transition Metal Silicides by Kolbesen, B.O., Cerva, H.

    Published in Physica status solidi. B. Basic research (01-11-2000)
    “…In microelectronics technology transition metals and their silicides play a prominent, but twofold role: On the one hand, selected metals like Ti, Co, Mo and W…”
    Get full text
    Journal Article
  10. 10

    Formation of niobium nitride by rapid thermal processing by Angelkort, C, Lewalter, H, Warbichler, P, Hofer, F, Bock, W, Kolbesen, B.O

    “…The formation of group V transition metal nitride films by means of rapid thermal processing (RTP) has been investigated. Here we focus on the nitridation of…”
    Get full text
    Journal Article
  11. 11

    Scanning probe microscopy — a tool for the investigation of high- k materials by Landau, S.A, Junghans, N, Weiß, P.-A, Kolbesen, B.O, Olbrich, A, Schindler, G, Hartner, W, Hintermaier, F, Dehm, C, Mazuré, C

    Published in Applied surface science (01-04-2000)
    “…Dielectric/ferroelectric materials such as Ba x Sr 1− x TiO 3 (BST), PbZr x Ti 1− x O 3 (PZT), and SrBi 2Ta 2O 9 (SBT) are currently being investigated for…”
    Get full text
    Journal Article Conference Proceeding
  12. 12

    Asp-193 and Glu-218 of subunit II are involved in the Mn 2+-binding of Paracoccus denitrificans cytochrome c oxidase by Witt, Heike, Wittershagen, Axel, Bill, Eckhard, Kolbesen, B.O, Ludwig, Bernd

    Published in FEBS letters (09-06-1997)
    “…Cytochrome c oxidase contains a binding site for a non-redox-active metal at the interface of subunits I and II, usually a magnesium ion. In Paracoccus…”
    Get full text
    Journal Article
  13. 13

    Nitridation of vanadium in molecular nitrogen: a comparison of rapid thermal processing (RTP) and conventional furnace annealing by Galesic, I, Reusch, U, Angelkort, C, Lewalter, H, Berendes, A, Schweda, E, Kolbesen, B.O

    Published in Vacuum (14-05-2001)
    “…The nitridation processes of thin V films in molecular nitrogen at atmospheric pressure in a RTP-system, a conventional tube furnace and a high temperature in…”
    Get full text
    Journal Article Conference Proceeding
  14. 14

    Asp‐193 and Glu‐218 of subunit II are involved in the Mn2+‐binding of Paracoccus denitrificans cytochrome c oxidase by Witt, Heike, Wittershagen, Axel, Bill, Eckhard, Kolbesen, B.O, Ludwig, Bernd

    Published in FEBS letters (09-06-1997)
    “…Cytochrome c oxidase contains a binding site for a non‐redox‐active metal at the interface of subunits I and II, usually a magnesium ion. In Paracoccus…”
    Get full text
    Journal Article
  15. 15

    Influence of silicon crystal defects and contamination on the electrical behavior of power devices by Schulze, H.-J, Kolbesen, B.O

    Published in Solid-state electronics (01-12-1998)
    “…Since power devices require a thick electrically active n-type silicon layer with high resistivity and a large area, their electrical characteristics are…”
    Get full text
    Journal Article
  16. 16

    Formation of Transition Metal Nitrides by Rapid Thermal Processing (RTP) by Galesic, I., Angelkort, C., Lewalter, H., Berendes, A., Kolbesen, B.O.

    Published in Physica status solidi. A, Applied research (01-01-2000)
    “…Rapid thermal processing (RTP) was used to prepare group‐5 transition metal (V, Nb, Ta) nitride films and to study the early stages of nitrogen incorporation…”
    Get full text
    Journal Article
  17. 17

    Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface by Alov, N.V, Oskolok, K.V, Wittershagen, A, Mertens, M, Rittmeyer, C, Rostam-Khani, P, Kolbesen, B.O

    “…The features of electrochemical deposition and co-deposition of copper, cadmium and lead from aqueous solutions on disc glass-ceramic carbon (GCC) electrode…”
    Get full text
    Journal Article
  18. 18

    Some aspects of the high-temperature behavior of bismuth, strontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry by Kilian, G, Rommel, M, Pamler, W, Unger, E, Höpfner, A, Kolbesen, B.O

    Published in SPECTROCHIM. ACTA PART B AT. SPECTROSC (30-11-2001)
    “…Thin films of novel dielectric and ferroelectric materials, such as barium strontium titanate (BST) and strontium bismuth tantalate (SBT), which are scheduled…”
    Get full text
    Journal Article Conference Proceeding
  19. 19

    Trace element determination in drugs by total-reflection X-ray fluorescence spectrometry by Wagner, M., Rostam-Khani, P., Wittershagen, A., Rittmeyer, Claudia, Kolbesen, B.O., Hoffmann, H.

    “…The capability of total-reflection X-ray fluorescence spectrometry (TXRF) for the determination of trace elements in drugs is described. Various samples of…”
    Get full text
    Journal Article Conference Proceeding
  20. 20

    Alkaline cleaning of silicon wafers: additives for the prevention of metal contamination by Martin, A.R., Baeyens, M., Hub, W., Mertens, P.W., Kolbesen, B.O.

    Published in Microelectronic engineering (01-07-1999)
    “…The paper presents a new strategy for cleaning of silicon wafers. A novel class of chelating agents added to alkaline cleaning mixtures provides promising…”
    Get full text
    Journal Article