Search Results - "Kolbesen, B.O."
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Formation of tantalum nitride films by rapid thermal processing
Published in Thin solid films (01-08-2003)“…As part of an investigation of transition metal nitrides formed by means of rapid thermal processing, the reactivity of 200/500-nm thick tantalum films…”
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Formation of vanadium nitride by rapid thermal processing
Published in Thin solid films (30-07-1999)“…In the manufacturing of submicron semiconductor devices rapid thermal processing (RTP) is increasingly applied for annealing and preparation of thin films such…”
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3
Evaluation of the protein concentration in enzymes via determination of sulfur by total reflection X-ray fluorescence spectrometry — limitations of the method
Published in SPECTROCHIM. ACTA PART B AT. SPECTROSC (30-11-2001)“…Total reflection X-ray fluorescence spectrometry (TXRF) offers many advantages for the identification of trace elements in biological samples like proteins,…”
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Journal Article Conference Proceeding -
4
A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films
Published in Applied surface science (30-09-2005)“…We investigated the diffusion profiles and core-loss fine-structures (ELNES) of thin vanadium nitride films by electron energy-loss spectroscopy (EELS) and…”
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5
Formation of niobium oxynitrides by rapid thermal processing (RTP)
Published in Applied surface science (30-09-2005)“…The potential of rapid thermal processing (RTP) for the preparation of thin films of niobium oxynitrides was investigated. The 200 and 500 nm niobium films…”
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6
Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(1 0 0) wafers – preparation of oxynitride films
Published in Applied surface science (30-09-2005)“…Five hundred nanometers of niobium films have been deposited on silicon(1 0 0) wafers with 100 or 300 nm thermally grown oxide by electron beam evaporation and…”
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7
Niobium nitride films formed by rapid thermal processing (RTP): a study of depth profiles and interface reactions by complementary analytical techniques
Published in Analytical and bioanalytical chemistry (01-06-2004)“…The nitridation of niobium films approximately 250 and 650 nm thick by rapid thermal processing (RTP) at 800 °C in molecular nitrogen or ammonia was…”
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Capability and limitations of the determination of sulfur in inorganic and biological matrices by total reflection X-ray fluorescence spectrometry
Published in SPECTROCHIM. ACTA PART B AT. SPECTROSC (30-11-2001)“…The capability and limitations of TXRF were explored for the determination of the light element sulfur in inorganic and biological samples. The recovery rates…”
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Defects Due to Metal Silicide Precipitation in Microelectronic Device Manufacturing: The Unlovely Face of Transition Metal Silicides
Published in Physica status solidi. B. Basic research (01-11-2000)“…In microelectronics technology transition metals and their silicides play a prominent, but twofold role: On the one hand, selected metals like Ti, Co, Mo and W…”
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10
Formation of niobium nitride by rapid thermal processing
Published in Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy (01-09-2001)“…The formation of group V transition metal nitride films by means of rapid thermal processing (RTP) has been investigated. Here we focus on the nitridation of…”
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Scanning probe microscopy — a tool for the investigation of high- k materials
Published in Applied surface science (01-04-2000)“…Dielectric/ferroelectric materials such as Ba x Sr 1− x TiO 3 (BST), PbZr x Ti 1− x O 3 (PZT), and SrBi 2Ta 2O 9 (SBT) are currently being investigated for…”
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12
Asp-193 and Glu-218 of subunit II are involved in the Mn 2+-binding of Paracoccus denitrificans cytochrome c oxidase
Published in FEBS letters (09-06-1997)“…Cytochrome c oxidase contains a binding site for a non-redox-active metal at the interface of subunits I and II, usually a magnesium ion. In Paracoccus…”
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Nitridation of vanadium in molecular nitrogen: a comparison of rapid thermal processing (RTP) and conventional furnace annealing
Published in Vacuum (14-05-2001)“…The nitridation processes of thin V films in molecular nitrogen at atmospheric pressure in a RTP-system, a conventional tube furnace and a high temperature in…”
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Journal Article Conference Proceeding -
14
Asp‐193 and Glu‐218 of subunit II are involved in the Mn2+‐binding of Paracoccus denitrificans cytochrome c oxidase
Published in FEBS letters (09-06-1997)“…Cytochrome c oxidase contains a binding site for a non‐redox‐active metal at the interface of subunits I and II, usually a magnesium ion. In Paracoccus…”
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15
Influence of silicon crystal defects and contamination on the electrical behavior of power devices
Published in Solid-state electronics (01-12-1998)“…Since power devices require a thick electrically active n-type silicon layer with high resistivity and a large area, their electrical characteristics are…”
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Formation of Transition Metal Nitrides by Rapid Thermal Processing (RTP)
Published in Physica status solidi. A, Applied research (01-01-2000)“…Rapid thermal processing (RTP) was used to prepare group‐5 transition metal (V, Nb, Ta) nitride films and to study the early stages of nitrogen incorporation…”
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17
Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface
Published in Spectrochimica acta. Part B: Atomic spectroscopy (30-11-2001)“…The features of electrochemical deposition and co-deposition of copper, cadmium and lead from aqueous solutions on disc glass-ceramic carbon (GCC) electrode…”
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Some aspects of the high-temperature behavior of bismuth, strontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry
Published in SPECTROCHIM. ACTA PART B AT. SPECTROSC (30-11-2001)“…Thin films of novel dielectric and ferroelectric materials, such as barium strontium titanate (BST) and strontium bismuth tantalate (SBT), which are scheduled…”
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19
Trace element determination in drugs by total-reflection X-ray fluorescence spectrometry
Published in Spectrochimica acta. Part B : Atomic spectroscopy (01-07-1997)“…The capability of total-reflection X-ray fluorescence spectrometry (TXRF) for the determination of trace elements in drugs is described. Various samples of…”
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20
Alkaline cleaning of silicon wafers: additives for the prevention of metal contamination
Published in Microelectronic engineering (01-07-1999)“…The paper presents a new strategy for cleaning of silicon wafers. A novel class of chelating agents added to alkaline cleaning mixtures provides promising…”
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