Search Results - "Koduri, Pavan Sri Ram"
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Logic Obfuscation Technique for Securing Test Pattern Generators
Published in 2021 Second International Conference on Electronics and Sustainable Communication Systems (ICESC) (04-08-2021)“…As the economic process of integrated circuit (IC) process proceeds, various supply chain components will copy ICs to introduce hardware Trojans, and overbuild…”
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Conference Proceeding -
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Secured Test Pattern Generators for BIST
Published in 2021 5th International Conference on Computing Methodologies and Communication (ICCMC) (08-04-2021)“…With the development in IC technology, testing the designs is becoming more and more complex. In the design, process testing consumes 60-80% of the time. The…”
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Conference Proceeding