Search Results - "Knollmeyer, Simon"
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Unlocking the Potential of Information Modeling for Root Cause Analysis in a Production Environment: A Comprehensive State-of-the-Art Review Using the Kitchenham Methodology
Published in IEEE access (2024)“…Data from production environments is now available in unprecedented volumes, making the problem-solving of incidents through root cause analysis…”
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Journal Article -
2
Document Knowledge Graph to Enhance Question Answering with Retrieval Augmented Generation
Published in 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA) (10-09-2024)“…Reusing and managing existing knowledge from available documents is crucial for success in the factory planning domain. By leveraging Artificial Intelligence…”
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Conference Proceeding -
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Addressing the Complexity of AI Integration in Manufacturing: A Morphological Analysis
Published in 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA) (10-09-2024)“…This paper introduces a novel methodological approach to transform a traditional model-centric machine learning pipeline into a morphological box. Utilizing a…”
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Conference Proceeding -
4
Supervised Anomaly Detection for Production Line Images using Data Augmentation and Convolutional Neural Network
Published in 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA) (10-09-2024)“…In the manufacturing industry, automated optical inspection aims to improve the detection and classification of anomalies by utilizing artificial intelligence…”
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Conference Proceeding -
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Ontology based knowledge graph for information and knowledge management in factory planning
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12-09-2023)“…The amount of necessary information and knowledge to fulfill the tasks within the factory planning domain is rapidly growing. Currently, data and documents…”
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Conference Proceeding -
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A Conceptual Framework for Addressing Class Imbalance in Image Data: Challenges and Strategies
Published in 2024 IEEE 12th International Conference on Intelligent Systems (IS) (29-08-2024)“…The presence of class imbalance, denoting a dis-proportionate distribution of class instances in a dataset, has emerged as a significant challenge in the era…”
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Conference Proceeding