Search Results - "Knapp, J.A."

Hall–Petch relationship in pulsed-laser deposited nickel films by Knapp, J.A., Follstaedt, D.M.

“…Thin-film mechanical properties can be measured using nanoindentation combined with detailed finite element modeling. This technique was used for a study of…”
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Mechanics of microcantilever beams subject to combined electrostatic and adhesive forces by Knapp, J.A., de Boer, M.P.

“…One of the most important issues facing the continued development and application of microelectromechanical systems (MEMS) is that of adhesion and friction…”
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Mechanical properties of ion-implanted amorphous silicon by Follstaedt, D.M., Knapp, J.A., Myers, S.M.

“…We used nanoindentation coupled with finite element modeling to determine the mechanical properties of amorphous Si layers formed by self-ion implantation of…”
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The ion photon emission microscope on SNL’s nuclear microprobe and in LBNL’s cyclotron facility by Branson, J.V., Doyle, B.L., Vizkelethy, G., Rossi, P., Knapp, J.A., McMahan, M.A.

“…Radiation effects microscopy (REM) has evolved into an essential tool for the study, diagnostics and remedy of single event effects (SEE) in microelectronics…”
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Impact of passivation layers on enhanced low-dose-rate sensitivity and pre-irradiation elevated-temperature stress effects in bipolar linear ICs by Shaneyfelt, M.R., Pease, R.L., Schwank, J.R., Maher, M.C., Hash, G.L., Fleetwood, D.M., Dodd, P.E., Reber, C.A., Witczak, S.C., Riewe, L.C., Hjalmarson, H.P., Banks, J.C., Doyle, B.L., Knapp, J.A.

“…Final chip passivation layers are shown to have a major impact on the total dose hardness of bipolar linear technologies. It is found that devices fabricated…”
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Monte Carlo simulations of multiple scattering effects in ERD measurements by Arstila, K., Knapp, J.A., Nordlund, K., Doyle, B.L.

“…Multiple scattering effects in ERD measurements are studied by comparing two Monte Carlo simulation codes, representing different approaches to obtain…”
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Grain Boundary-Mediated Plasticity in Nanocrystalline Nickel by Shan, Zhiwei, Stach, E. A., Wiezorek, J. M. K., Knapp, J. A., Follstaedt, D. M., Mao, S. X.

“…The plastic behavior of crystalline materials is mainly controlled by the nucleation and motion of lattice dislocations. We report in situ dynamic transmission…”
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In-situ TEM tensile testing of DC magnetron sputtered and pulsed laser deposited Ni thin films by Hugo, R.C., Kung, H., Weertman, J.R., Mitra, R., Knapp, J.A., Follstaedt, D.M.

“…Two nanocrystalline Ni thin films, one prepared via DC Magnetron Sputtering and the other prepared via Pulsed Laser Deposition, were strained in-situ in the…”
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Aging of ErT 2 thin films: ERD analysis and mechanical property changes by Knapp, J.A., Browning, J.F., Bond, G.M.

“…Rare earth tritide films evolve as tritium decays into 3He, which forms bubbles that influence long-term film stability in applications such as neutron…”
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Evidence of metastable hcp phase grains in as-deposited nanocrystalline nickel films by Rajasekhara, S., Ganesh, K.J., Hattar, K., Knapp, J.A., Ferreira, P.J.

“…Precession microscopy is applied to determine the morphology of pulsed laser deposited and unannealed Ni films. The nanostructure of these films, nominally…”
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3He bubble evolution in ErT2: A survey of experimental results by Snow, C.S., Browning, J.F., Bond, G.M., Rodriguez, M.A., Knapp, J.A.

“…For the past several years we have been carrying out a long term experimental study of 3He in ErT2 (erbium di-tritide). This study has attempted to answer…”
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Nanoindentation characterization of ErT 2 thin films by Knapp, J.A., Browning, J.F.

“…The properties of ErT 2 films change as the tritium decays into 3He, which has important implications for long-term film stability in applications such as…”
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Defect structures created during abnormal grain growth in pulsed-laser deposited nickel by Hattar, K., Follstaedt, D.M., Knapp, J.A., Robertson, I.M.

“…The thermal stability of nanograined pulsed-laser deposited nickel was studied by annealing free-standing thin films in situ in a transmission electron…”
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Thick stress-free amorphous-tetrahedral carbon films with hardness near that of diamond by Friedmann, T. A., Sullivan, J. P., Knapp, J. A., Tallant, D. R., Follstaedt, D. M., Medlin, D. L., Mirkarimi, P. B.

“…We have developed a process for making thick, stress-free, amorphous-tetrahedrally bonded carbon (a-tC) films with hardness and stiffness near that of diamond…”
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Aging of ErT2 thin films: ERD analysis and mechanical property changes by Knapp, J.A., Browning, J.F., Bond, G.M.

“…Rare earth tritide films evolve as tritium decays into 3He, which forms bubbles that influence long-term film stability in applications such as neutron…”
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Adhesion hysteresis of silane coated microcantilevers by de Boer, M.P, Knapp, J.A, Michalske, T.A, Srinivasan, U, Maboudian, R

“…We have developed a new experimental approach for measuring hysteresis in the adhesion between a free standing thin film and a substrate. By accurately…”
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Nanoindentation characterization of ErT2 thin films by KNAPP, J. A, BROWNING, J. F

“…The properties of ErT2 films change as the tritium decays into 3He, which has important implications for long-term film stability in applications such as…”
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Elastic recoil detection analysis of 3He by Knapp, J.A., Arstila, K., Wampler, W.R., Banks, J.C., Doyle, B.L.

“…We give the results of a study using Monte Carlo ion interaction codes to simulate and optimize elastic recoil detection analysis for 3He buildup in tritide…”
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The mechanical properties of alumina films formed by plasma deposition and by ion irradiation of sapphire by Barbour, J.C, Knapp, J.A, Follstaedt, D.M, Mayer, T.M, Minor, K.G, Linam, D.L

“…This paper examines the correlation between mechanical properties and the density, phase and hydrogen content of deposited alumina layers, and compares them to…”
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Finite-element modeling of nanoindentation for evaluating mechanical properties of MEMS materials by Knapp, J.A, Follstaedt, D.M, Myers, S.M, Barbour, J.C, Friedmann, T.A, Ager, J.W, Monteiro, O.R, Brown, I.G

“…We have developed procedures based on finite-element modeling of nanoindentation data to extract mechanical properties from thin, hard films and…”
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