Search Results - "Klug, Jeffrey"

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  1. 1

    Achieving high spatial resolution in a large field-of-view using lensless x-ray imaging by Jiang, Yi, Deng, Junjing, Yao, Yudong, Klug, Jeffrey A., Mashrafi, Sheikh, Roehrig, Christian, Preissner, Curt, Marin, Fabricio S., Cai, Zhonghou, Lai, Barry, Vogt, Stefan

    Published in Applied physics letters (20-09-2021)
    “…X-ray ptychography, a powerful scanning lensless imaging technique, has become attractive for nondestructively imaging internal structures at nanoscale. Stage…”
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    Journal Article
  2. 2

    Ferroelectric Oxide Made Directly on Silicon by Warusawithana, Maitri P, Cen, Cheng, Sleasman, Charles R, Woicik, Joseph C, Li, Yulan, Kourkoutis, Lena Fitting, Klug, Jeffrey A, Li, Hao, Ryan, Philip, Wang, Li-Peng, Bedzyk, Michael, Muller, David A, Chen, Long-Qing, Levy, Jeremy, Schlom, Darrell G

    “…Metal oxide semiconductor field-effect transistors, formed using silicon dioxide and silicon, have undergone four decades of staggering technological…”
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    Journal Article
  3. 3

    High-resolution ptychographic imaging enabled by high-speed multi-pass scanning by Deng, Junjing, Yao, Yudong, Jiang, Yi, Chen, Si, Mooney, Tim M., Klug, Jeffrey A., Marin, Fabricio S., Roehrig, Christian, Yue, Ke, Preissner, Curt, Cai, Zhonghou, Lai, Barry, Vogt, Stefan

    Published in Optics express (18-07-2022)
    “…As a coherent diffraction imaging technique, ptychography provides high-spatial resolution beyond Rayleigh’s criterion of the focusing optics, but it is also…”
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    Journal Article
  4. 4

    Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging by Yao, Yudong, Jiang, Yi, Klug, Jeffrey A., Wojcik, Michael, Maxey, Evan R., Sirica, Nicholas S., Roehrig, Christian, Cai, Zhonghou, Vogt, Stefan, Lai, Barry, Deng, Junjing

    Published in Scientific reports (11-11-2020)
    “…X-ray ptychography is a rapidly developing coherent diffraction imaging technique that provides nanoscale resolution on extended field-of-view. However, the…”
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    Journal Article
  5. 5

    Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time by Kang, Iksung, Wu, Ziling, Jiang, Yi, Yao, Yudong, Deng, Junjing, Klug, Jeffrey, Vogt, Stefan, Barbastathis, George

    Published in Light, science & applications (30-05-2023)
    “…Noninvasive X-ray imaging of nanoscale three-dimensional objects, such as integrated circuits (ICs), generally requires two types of scanning: ptychographic,…”
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    Journal Article
  6. 6

    Multinodular and Vacuolating Neuronal Tumor: A Rare Seizure-associated Entity by Cathcart, Sahara J, Klug, Jeffrey R, Helvey, Jason T, L. White, Matthew, Gard, Andrew P, McComb, Rodney D

    Published in The American journal of surgical pathology (01-07-2017)
    “…Multinodular and vacuolating neuronal tumor is a recently described seizure-associated entity with overlapping features of a malformative and neoplastic…”
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    Journal Article
  7. 7

    Phase Discrimination through Oxidant Selection in Low-Temperature Atomic Layer Deposition of Crystalline Iron Oxides by Riha, Shannon C, Racowski, Joy M, Lanci, Michael P, Klug, Jeffrey A, Hock, Adam S, Martinson, Alex B. F

    Published in Langmuir (12-03-2013)
    “…Control over the oxidation state and crystalline phase of thin-film iron oxides was achieved by low-temperature atomic layer deposition (ALD), utilizing a…”
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    Journal Article
  8. 8

    Tunneling spectroscopy of superconducting MoN and NbTiN grown by atomic layer deposition by Groll, Nickolas R., Klug, Jeffrey A., Cao, Chaoyue, Altin, Serdar, Claus, Helmut, Becker, Nicholas G., Zasadzinski, John F., Pellin, Michael J., Proslier, Thomas

    Published in Applied physics letters (03-03-2014)
    “…A tunneling spectroscopy study is presented of superconducting MoN and Nb0.8Ti0.2N thin films grown by atomic layer deposition (ALD). The films exhibited a…”
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    Journal Article
  9. 9

    Atomic Layer Deposition of Amorphous Niobium Carbide-Based Thin Film Superconductors by Klug, Jeffrey A, Proslier, Thomas, Elam, Jeffrey W, Cook, Russell E, Hiller, Jon M, Claus, Helmut, Becker, Nicholas G, Pellin, Michael J

    Published in Journal of physical chemistry. C (22-12-2011)
    “…Niobium carbide thin films were synthesized by atomic layer deposition (ALD) using trimethylaluminum (TMA), NbF5, and NbCl5 precursors. In situ quartz crystal…”
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    Journal Article
  10. 10

    Atomic Layer Deposition and Superconducting Properties of NbSi Films by Proslier, Thomas, Klug, Jeffrey A, Elam, Jeffrey W, Claus, Helmut, Becker, Nicholas G, Pellin, Michael J

    Published in Journal of physical chemistry. C (19-05-2011)
    “…Atomic layer deposition was used to synthesize niobium silicide (NbSi) films with a 1:1 stoichiometry, using NbF5 and Si2H6 as precursors. The growth mechanism…”
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    Journal Article
  11. 11

    Heteroepitaxy of group IV-VI nitrides by atomic layer deposition by Klug, Jeffrey A., Becker, Nicholas G., Groll, Nickolas R., Cao, Chaoyue, Weimer, Matthew S., Pellin, Michael J., Zasadzinski, John F., Proslier, Thomas

    Published in Applied physics letters (18-11-2013)
    “…Heteroepitaxial growth of selected group IV-VI nitrides on various orientations of sapphire (α-Al2O3) is demonstrated using atomic layer deposition. High…”
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    Journal Article
  12. 12

    Three-dimensional ferroelectric domain imaging of epitaxial BiFeO3 thin films using angle-resolved piezoresponse force microscopy by Park, Moonkyu, Hong, Seungbum, Klug, Jeffrey A., Bedzyk, Michael J., Auciello, Orlando, No, Kwangsoo, Petford-Long, Amanda

    Published in Applied physics letters (13-09-2010)
    “…Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30° increments around the surface normal vector and…”
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    Journal Article
  13. 13

    Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures by Nath, Ramesh, Hong, Seungbum, Klug, Jeffrey A., Imre, Alexandra, Bedzyk, Michael J., Katiyar, Ram S., Auciello, Orlando

    Published in Applied physics letters (19-04-2010)
    “…Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in…”
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    Journal Article
  14. 14

    Broadband X‐ray ptychography using multi‐wavelength algorithm by Yao, Yudong, Jiang, Yi, Klug, Jeffrey, Nashed, Youssef, Roehrig, Christian, Preissner, Curt, Marin, Fabricio, Wojcik, Michael, Cossairt, Oliver, Cai, Zhonghou, Vogt, Stefan, Lai, Barry, Deng, Junjing

    Published in Journal of synchrotron radiation (01-01-2021)
    “…Ptychography is a rapidly developing scanning microscopy which is able to view the internal structures of samples at a high resolution beyond the illumination…”
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    Journal Article
  15. 15

    Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time by Kang, Iksung, Wu, Ziling, Jiang, Yi, Yao, Yudong, Deng, Junjing, Klug, Jeffrey, Vogt, Stefan, Barbastathis, George

    Published in Light, science & applications (30-05-2023)
    “…Abstract Noninvasive X-ray imaging of nanoscale three-dimensional objects, such as integrated circuits (ICs), generally requires two types of scanning:…”
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    Journal Article
  16. 16

    Three-dimensional nanoscale reduced-angle ptycho-tomographic imaging with deep learning (RAPID) by Wu, Ziling, Kang, Iksung, Yao, Yudong, Jiang, Yi, Deng, Junjing, Klug, Jeffrey, Vogt, Stefan, Barbastathis, George

    Published in eLight (03-04-2023)
    “…X-ray ptychographic tomography is a nondestructive method for three dimensional (3D) imaging with nanometer-sized resolvable features. The size of the volume…”
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    Journal Article
  17. 17

    Accelerated deep self-supervised ptycho-laminography for three-dimensional nanoscale imaging of integrated circuits by Kang, Iksung, Jiang, Yi, Holler, Mirko, Guizar-Sicairos, Manuel, Levi, A. F. J., Klug, Jeffrey, Vogt, Stefan, Barbastathis, George

    Published in Optica (20-08-2023)
    “…Three-dimensional inspection of nanostructures such as integrated circuits is important for security and reliability assurance. Two scanning operations are…”
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    Journal Article
  18. 18

    Three-dimensional ferroelectric domain imaging of epitaxial BiFeO 3 thin films using angle-resolved piezoresponse force microscopy by Park, Moonkyu, Hong, Seungbum, Klug, Jeffrey A., Bedzyk, Michael J., Auciello, Orlando, No, Kwangsoo, Petford-Long, Amanda

    Published in Applied physics letters (17-09-2010)
    “…Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30° increments around the surface normal vector and…”
    Get full text
    Journal Article
  19. 19

    The Role of Whiteness in Access Disparities in College Counseling Services by Klug, Jeffrey Alan

    Published 01-01-2021
    “…Access barriers to campus mental health counseling services for persons of color have been previously identified in the literature. These barriers are known to…”
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    Dissertation
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