Search Results - "KleinOsowski, K." :: Katalog Arama

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Exploring Fine-Grained Fault Tolerance for Nanotechnology Devices With the Recursive NanoBox Processor Grid by KleinOsowski, A., Pai, V.V., Rangarajan, V., Ranganath, P., KleinOsowski, K., Subramony, M., Lilja, D.J.

Published in IEEE transactions on nanotechnology (01-09-2006)
“…Advanced molecular nanotechnology devices are predicted to have exceedingly high transient fault rates and large numbers of inherent device defects compared to…”

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The recursive nanobox processor grid: a reliable system architecture for unreliable nanotechnology devices by KleinOsowski, A.J., KleinOsowski, K., Rangarajan, V., Ranganath, P., Lilja, D.J.

Published in International Conference on Dependable Systems and Networks, 2004 (2004)
“…Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to…”

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Communicating quality of service requirements to an object-based storage device by Kleinosowski, K., Ruwart, T., Lilja, D.J.

Published in 22nd IEEE / 13th NASA Goddard Conference on Mass Storage Systems and Technologies (MSST'05) (2005)
“…Obtaining consistent bandwidth with predictable latency from disk-based storage systems has proven difficult due to the storage system's inability to…”

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