Search Results - "Kladovscikov, Leonid"

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  1. 1

    Review of V2X–IoT Standards and Frameworks for ITS Applications by Kiela, Karolis, Barzdenas, Vaidotas, Jurgo, Marijan, Macaitis, Vytautas, Rafanavicius, Justas, Vasjanov, Aleksandr, Kladovscikov, Leonid, Navickas, Romualdas

    Published in Applied sciences (01-06-2020)
    “…The intelligent transport system (ITS) has become one of the most globally researched topics with a lot of investment and development resources being dedicated…”
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    Journal Article
  2. 2

    Verification of a Fabless Device Model Using TCAD Tools: from Bipolar Transistor Formation to I-V Characteristics Extraction by Barzdenas, Vaidotas, Grazulevicius, Gediminas, Liobe, John, Vasjanov, Aleksandr, Kladovscikov, Leonid

    Published in Ingeniería e investigación (01-12-2021)
    “…This paper describes the analysis of processes used in microand nanoelectronic device manufacturing. It also presents an exemplary and novel laboratory…”
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    Journal Article
  3. 3

    DESIGN AND INVESTIGATION OF RESISTOR MATRIX FOR ACTIVE ANALOG RC FILTERS by Kladovščikov, Leonid, Navickas, Romualdas

    Published in Science future of Lithuania (01-01-2020)
    “…Resistor matrixes are widely used in active RC filters as well as in self-tuning systems. Using self-tuning systems for active RC filters, it is possible to…”
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    Journal Article
  4. 4

    BELAIDŽIO RYŠIO SIŲSTUVŲ-IMTUVŲ SUSIDERINIMO BŪDŲ ANALIZĖ / ANALYSIS OF SELF TUNING METHODS FOR DIRECT CONVERSION TRANSCEIVERS by Kladovščikov, Leonid, Navickas, Romualdas

    Published in Science future of Lithuania (09-10-2018)
    “…Integrinių grandynų gamybos technologinių procesų paklaidos didina daugiastandarčių siųstuvų-imtuvų komponentų parametrų sklaidą ir blogina jų veiką, tad…”
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    Journal Article
  5. 5

    Verification of a Fabless Device Model Using TCAD Tools: from Bipolar Transistor Formation to I-V Characteristics Extraction by Barzdenas, Vaidotas, Kladovscikov, Leonid, Grazulevicius, Gediminas, Vasjanov, Aleksandr, Liobe, John

    Published in Ingeniería e investigación (2021)
    “…This paper describes the analysis of processes used in microand nanoelectronic device manufacturing. It also presents an exemplary and novel laboratory…”
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    Journal Article
  6. 6

    INTEGRATED ANALOGIC FILTER TUNING SYSTEM DESIGN / INTEGRINIŲ ANALOGINIŲ FILTRŲ SAVAIMINIO DERINIMO SISTEMOS PROJEKTAVIMAS by Kiela, Karolis, Jurgo, Marijan, Kladovščikov, Leonid

    Published in Science future of Lithuania (29-06-2016)
    “…Parameters of integrated analog filters can vary due to temperatu-re change, IC process variation and therefore they should have dedicated tuning circuits that…”
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    Journal Article
  7. 7

    Self-tuning system for multistandard active RC filters by Kladovščikov, Leonid, Navickas, Romualdas, Kiela, Karolis

    Published in Microelectronics (01-08-2019)
    “…In this paper a new self-tuning system for active-RC filter with tunable bandwidth is presented. This self-tuning system compensates PVT inducted parameter…”
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    Journal Article
  8. 8

    Integrated analog filter tuning system design/Integriniu analoginiu filtru savaiminio derinimo sistemos projektavimas by Kiela, Karolis, Jurgo, Marijan, Kladovscikov, Leonid

    Published in Science future of Lithuania (01-06-2016)
    “…Parameters of integrated analog filters can vary due to temperature change, IC process variation and therefore they should have dedicated tuning circuits that…”
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    Journal Article
  9. 9

    Integrated Analogic Filter Tuning System Design by Kiela, Karolis, Jurgo, Marijan, Kladovscikov, Leonid

    Published in Science future of Lithuania (01-05-2016)
    “…Parameters of integrated analog filters can vary due to temperatu-re change, IC process variation and therefore they should have dedicated tuning circuits that…”
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    Journal Article
  10. 10

    Application of oscillation-based self-testing systems for higher order active RC low-pass filters by Kladovscikov, Leonid, Navickas, Romualdas

    “…In this paper, different number of stages of the active RC low-pass filters were investigated for detection range of parametric faults using on-chip built-in…”
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    Conference Proceeding
  11. 11

    Review of self tuning methods for direct conversion transceivers by Kladovscikov, Leonid, Navickas, Romualdas

    “…Integrated circuit fabrication technological processes affect error of transceiver's components, thus aims to minimize such deviation. This paper analyzes…”
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    Conference Proceeding
  12. 12

    Investigation of feedback circuit for oscillation-based self-testing systems by Kladovscikov, Leonid, Navickas, Romualdas

    “…In this paper, different types of feedback circuits for on-chip built-in self-test were investigated. As testing system, an oscillation type built-in self-test…”
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    Conference Proceeding
  13. 13

    Design of self-test and self-calibration systems for analog active RC filters by Kladovscikov, Leonid, Navickas, Romualdas

    “…Integrated circuit fabrication technological processes affect error of transceiver's parameters. Such deviation of parameters are meant to be estimated and…”
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    Conference Proceeding