Search Results - "Kitchen, D.R."

Observation of electromigration at low temperature by Rhoden, W.E., Banton, D.W., Kitchen, D.R., Maskowitz, J.V.

“…Electromigration and mean time-to-failure were investigated for unglassed thin Al stripes over the temperature range of 223 K to 347 K. Thermal effects are…”
Get full text

Design of enhanced Schottky-barrier AlGaAs/GaAs MODFET's using highly doped p+surface layers by Priddy, K.L., Kitchen, D.R., Grzyb, J.A., Litton, C.W., Henderson, T.S., Chin-Kun Peng, Kopp, W.F., Morkoc, H.

“…The design and performance of enhanced Schottky-barrier height modulation-doped AlGaAs/GaAs field-effect transistors (ESMODFET's) is discussed. Results are…”
Get full text