Search Results - "Kitami, Yoshizo"
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Two-Dimensional Diffraction of Molecular Nanosheet Crystallites of Titanium Oxide
Published in The journal of physical chemistry. B (05-07-2001)“…We have examined two-dimensional diffraction features of novel nanosheet crystallites of quasi-TiO2. A single crystallite gave a face-centered orthogonal array…”
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High-resolution Observation of SrTiO 3 Interface by Convergent Beam Illumination
Published in Japanese Journal of Applied Physics (01-10-1999)“…The convergent beam illumination method has previously been proposed in order to determine the atomic arrangement in surface or interface structures on the…”
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3
Needle-Like SiC Nanorods
Published in Japanese Journal of Applied Physics (01-10-2001)“…SiC nanorods with a needle-like shape have been synthesized by carbothermal reduction of SiO at 1410°C, where the reductant is highly curled carbon nanotubes…”
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HIGH-RESOLUTION OBSERVATION OF SrTiO3 INTERFACE BY CONVERGENT BEAM ILLUMINATION
Published in Jpn.J.Appl.Phys ,Part 1. Vol. 38, no. 10, pp. 6138-6141. 1999 (1999)“…The atomic arrangement near a SrTiO3 interface is determined from a TEM image taken with convergent beam illumination. A cycloidal undulated structure can be…”
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Reduction mechanism of dislocation density in GaAs films on Si substrates
Published in Japanese Journal of Applied Physics (1993)“…Significant reduction of dislocation densities in GaAs films grown on Si substrates have been demonstrated. High-quality GaAs films on Si with average etch-pit…”
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A newly developed 300 kV field-emission analytical transmission electron microscope
Published in Japanese Journal of Applied Physics (01-11-1993)“…In order to carry out high-spatial-resolution analysis at the nanometer level, a 300 kV analytical transmission electron microscope with a field-emission gun…”
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Some results obtained by a newly constructed ultra-high-resolution 1300 kV electron microscope
Published in Japanese Journal of Applied Physics (1991)“…A new ultra-high-resolution electron microscope with a point-to-point resolution of 0.1 nm at 1300 kV was constructed. A lattice fringe image of 0.07 nm due to…”
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An outline of the structure of oxide-ion conductors Bi 23V 4−4 xP 4 xO 44.5 (0≤ x≤1)
Published in Solid state ionics (1998)“…A complete solid-solution series, Bi 23V 4−4 x P 4 x O 44.5 (0≤ x≤1), has been formed between two isomorphous compounds, Bi 23M 4O 44.5 (M=P and V). The series…”
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A 400 kV high resolution-analytical electron microscope newly constructed
Published in Japanese Journal of Applied Physics (01-01-1984)“…A resolution limit of 0.23 nm has been achieved successfully by a newly constructed 400 kV analytical electron microscope equipped with an energy dispersive…”
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An outline of the structure of oxide-ion conductors Bi23V4−4xP4xO44.5 (0≤x≤1)
Published in Solid state ionics (01-12-1998)Get full text
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Microstructural characterization and high-temperature strength of hot-pressed silicon nitride ceramics with Lu2O3 additives
Published in Philosophical magazine letters (01-06-2003)“…The microstructures of two hot-pressed Si 3 N 4 ceramics, with 3.33 and 12.51 wt% Lu 2 O 3 additive, have been characterized using transmission electron…”
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Microstructural characterization and high-temperature strength of hot-pressed silicon nitride ceramics with Lu 2 O 3 additives
Published in Philosophical magazine letters (01-06-2003)Get full text
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Synthesis, Structural Characterizations, and Some Chemical Properties of a Fibrous Titanate with a Novel Layer/Tunnel Intergrown Structure
Published in Chemistry of materials (01-10-1994)Get full text
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Erratum: Microstructural characterization and high-temperature strength of hot-pressed silicon nitride ceramics with Lu2O3 additives
Published in Philosophical magazine letters (01-03-2004)“…Philosophical Magazine Letters, 83(6), pp. 357-365. 1. On page 362 the correct caption for figure 3 is: HRTEM images of the grain boundary of the hot-pressed…”
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New 300 kV Energy-Filtering Field Emission Electron Microscope
Published in Japanese Journal of Applied Physics (01-11-2001)“…In order to observe high-spatial-resolution elemental images using inelastic electrons, a 300 kV energy-filtering transmission electron microscope with an…”
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Polymorphism in Bi5Pb3O10.5
Published in Journal of solid state chemistry (01-04-1999)“…This paper describes the phase and structural relations between three polymorphs of Bi5Pb3O10.5. The low-temperature stable phase namedβLcrystallizes in the…”
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Pseudo-binary system Bi2O3-TeO2 in air
Published in Journal of materials science (01-12-1989)“…The phase equilibria at 600-950 C in air were examined by solid-state reaction techniques and X-ray powder diffraction. Four pseudo-binary compounds appeared,…”
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Structure and Composition Analysis of High-T c Superconducting Bi-Ca-Sr-Cu-O Oxide by High-Resolution Analytical Electron Microscopy
Published in Japanese Journal of Applied Physics (01-03-1988)“…The chemical composition and the crystal structure of the Bi-Ca-Sr-Cu-O oxide with a high- T c of about 75 K have been studied by the combined techniques of…”
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