Search Results - "Kim, Chung Yi"
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Uncertainty compensation methods for quantitative hardness measurement of materials using atomic force microscope nanoindentation technique
Published in Thin solid films (01-11-2013)“…We suggest uncertainty compensation methods for the quantification of nanoscale indentation using atomic force microscopy (AFM). The main error factors in the…”
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Journal Article Conference Proceeding -
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Control of the interfacial reaction in HfO2 on Si-passivated GaAs
Published in Applied surface science (15-10-2013)“…•The physical and electrical effects by interfacial reactions of HfO2/Si/GaAs were investigated.•The results showed that the Si layer decreases the diffusion…”
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Journal Article -
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Structural Evolution and the Control of Defects in Atomic Layer Deposited HfO2–Al2O3 Stacked Films on GaAs
Published in ACS applied materials & interfaces (27-03-2013)“…The structural characteristics and interfacial reactions of bilayered dielectric stacks of 3 nm HfO2/2 nm Al2O3 and 3 nm Al2O3/2 nm HfO2 on GaAs, prepared by…”
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Journal Article -
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Structural Evolution and the Control of Defects in Atomic Layer Deposited HfO 2 –Al 2 O 3 Stacked Films on GaAs
Published in ACS applied materials & interfaces (27-03-2013)Get full text
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Effect of oxygen incorporation in a-plane GaN on p-type ohmic contact property
Published in Japanese Journal of Applied Physics (01-09-2014)“…We report on the origin of the non-ohmic behavior of Ni/Au-based p-type contacts on a nonpolar a-plane GaN layer. The contact properties of Ga-polar c-plane…”
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Journal Article