Search Results - "Kieft, E. R."

Photodiode-based time zero determination for ultrafast electron microscopy by Kempers, S. T., Borrelli, S., Kieft, E. R., van Doorn, H. A., Mutsaers, P. H. A., Luiten, O. J.

“…Pump-probe experiments in ultrafast electron microscopy require temporal overlap between the pump and probe pulses. Accurate measurements of the time delay…”
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Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities by Verhoeven, W., van Rens, J. F. M., Toonen, W. F., Kieft, E. R., Mutsaers, P. H. A., Luiten, O. J.

“…The possibility to perform high-resolution time-resolved electron energy loss spectroscopy has the potential to impact a broad range of research fields…”
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Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities by Verhoeven, W., van Rens, J. F. M., van Ninhuijs, M. A. W., Toonen, W. F., Kieft, E. R., Mutsaers, P. H. A., Luiten, O. J.

“…We demonstrate the use of two TM110 resonant cavities to generate ultrashort electron pulses and subsequently measure electron energy losses in a…”
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In multi electron beam systems, “Neighbours Matter” by Mohammadi-Gheidari, A., Kieft, E.R., Guo, X., Wisse, M., Kruit, P.

“…In the Multi beam source (MBS) of our Multi Beam Scanning Electron Microscope (MBSEM), an aperture lens array (ALA) splits the emission cone of the Schottky…”
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High quality ultrafast transmission electron microscopy using resonant microwave cavities by Verhoeven, W., van Rens, J.F.M., Kieft, E.R., Mutsaers, P.H.A., Luiten, O.J.

“…•A TM110 microwave cavity has been inserted in a TEM to create electron pulses.•For the pulsed beam, no increase in either the emittance or energy spread is…”
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Dual mode microwave deflection cavities for ultrafast electron microscopy by van Rens, J. F. M., Verhoeven, W., Kieft, E. R., Mutsaers, P. H. A., Luiten, O. J.

“…This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate of 75 MHz based on a single compact…”
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Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopy by van Rens, J.F.M., Verhoeven, W., Franssen, J.G.H., Lassise, A.C., Stragier, X.F.D., Kieft, E.R., Mutsaers, P.H.A., Luiten, O.J.

“…•Derivation of optical transfer matrix of RF cavity in TM110 mode and 6D phase space propagation of Gaussian electron distribution using Courant-Snyder…”
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Optoelectronic properties of expanding thermal plasma deposited textured zinc oxide: Effect of aluminum doping by Groenen, R., Kieft, E. R., Linden, J. L., Van de Sanden, M. C. M.

“…Aluminum-doped zinc oxide films exhibiting a rough surface morphology are deposited on glass substrates utilizing expanding thermal plasma. Spectroscopic…”
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Comparison of experimental and simulated extreme ultraviolet spectra of xenon and tin discharges by Kieft, E R, Garloff, K, van der Mullen, J J A M, Banine, V

“…Xenon and tin both are working elements applied in discharge plasmas that are being developed for application in extreme ultraviolet (EUV) lithography. Their…”
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Subnanosecond Thomson scattering on a vacuum arc discharge in tin vapor by Kieft, E R, van der Mullen, J J A M, Banine, V

“…In a previous series of Thomson scattering (TS) experiments on an extreme ultraviolet producing vacuum arc discharge in tin vapor, background radiation emitted…”
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Characterization of a vacuum-arc discharge in tin vapor using time-resolved plasma imaging and extreme ultraviolet spectrometry by Kieft, E R, van der Mullen, J J A M, Kroesen, G M W, Banine, V, Koshelev, K N

“…Discharge sources in tin vapor have recently been receiving increased attention as candidate extreme ultraviolet (EUV) light sources for application in…”
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Collective Thomson scattering experiments on a tin vapor discharge in the prepinch phase by Kieft, E R, van der Mullen, J J A M, Kroesen, G M W, Banine, V, Koshelev, K N

“…Partially collective Thomson scattering measurements have been performed on a triggered vacuum arc in tin vapor, which is a candidate source of extreme…”
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Study of Surface Damage in Silicon by Irradiation with Focused Rubidium Ions by Xu, S, Li, Y, Verheijen, M. A, Kieft, E. R, Vredenbregt, E. J. D

“…Cold atom ion sources have been developed and commercialized as alternative sources for focused ion beams (FIB). So far, applications and related research have…”
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Dual mode microwave deflection cavities for ultrafast electron microscopy by van Rens, J. F. M, Verhoeven, W, Kieft, E. R, Mutsaers, P. H. A, Luiten, O. J

“…Applied Physics Letters 113, 163104 (2018) This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate…”
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High quality ultrafast transmission electron microscopy using resonant microwave cavities by Verhoeven, W, van Rens, J. F. M, Kieft, E. R, Mutsaers, P. H. A, Luiten, O. J

“…Ultramicroscopy 188 (2018) 85-89 Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM$_{110}$ deflection cavity to…”
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Design and characterization of dielectric filled TM$_{110}$ microwave cavities for ultrafast electron microscopy by Verhoeven, W, van Rens, J. F. M, Kemper, A. H, Rietman, E. H, van Doorn, H. A, Koole, I, Kieft, E. R, Mutsaers, P. H. A, Luiten, O. J

“…Microwave cavities oscillating in the TM$_{110}$ mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity…”
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Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM$_{110}$ mode for ultrafast electron microscopy by van Rens, J. F. M, Verhoeven, W, Franssen, J. G. H, Lassise, A. C, Stragier, X. F. D, Kieft, E. R, Mutsaers, P. H. A, Luiten, O. J

“…Ultramicroscopy, Volume 184, Part B, January 2018, Pages 77-89 We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in…”
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Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM 110 mode for ultrafast electron microscopy by van Rens, J F M, Verhoeven, W, Franssen, J G H, Lassise, A C, Stragier, X F D, Kieft, E R, Mutsaers, P H A, Luiten, O J

“…We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM mode as dynamic optical elements for ultrafast electron…”
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Time-resolved pinhole camera imaging and extreme ultraviolet spectrometry on a hollow cathode discharge in xenon by Kieft, E R, van der Mullen, J J A M, Kroesen, G M W, Banine, V

“…A pinhole camera, an extreme ultraviolet (EUV) spectrometer, a fast gatable multichannel plate EUV detector, and a digital camera have been installed on the…”
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Time-of-flight electron energy loss spectroscopy using TM 110 deflection cavities by Verhoeven, W, van Rens, J F M, van Ninhuijs, M A W, Toonen, W F, Kieft, E R, Mutsaers, P H A, Luiten, O J

“…We demonstrate the use of two TM resonant cavities to generate ultrashort electron pulses and subsequently measure electron energy losses in a time-of-flight…”
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