Search Results - "Kerzerho, V."

First long-term trajectory of an ocean sunfish (Mola mola L.) from the northwestern Mediterranean by Rouyer, Tristan, Landreau, A, Derridj, O, Bonhommeau, S, Frejafond, R, Wendling, B, Kerzerho, V

“…The ocean sunfish is a large fish for which many aspects of its ecology and biology are still poorly known. Electronic tagging was used to provide the first…”
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A novel protocol for rapid deployment of heart rate data storage tags in Atlantic bluefin tuna Thunnus thynnus reveals cardiac responses to temperature and feeding by Rouyer, T, Bonhommeau, S, Bernard, S, Kerzerho, V, Derridj, O, Bjarnason, Á, Allal, H, Steffensen, J F, Deguara, S, Wendling, B, Bal, G, Thambithurai, D, Mckenzie, D J

“…The Atlantic bluefin tuna (ABFT) is a highly prized species of large pelagic fish. Studies of their environmental physiology may improve understanding and…”
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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits by El Badawi, H., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Lefevre, F.

“…On-line performance monitoring of RF integrated circuits throughout their operating lifetime is a promising way to enhance their reliability. This paper…”
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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits by El Badawi, H., Azais, Florence, Bernard, S., Comte, M., Kerzerho, V., Lefevre, F.

“…In order to reduce the costs of industrial testing of analog and Radio Frequency (RF) integrated circuits, a widely studied solution is indirect testing…”
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Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit by Badawi, H. El, Azais, F., Bernard, S., Comte, M., Kerzerho, V., Lefevre, F.

“…This paper focuses on test cost reduction for RF circuits based on the use of an indirect test strategy. The implementation of a two-tier adaptive test flow is…”
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A First Step for an INL Spectral-Based BIST: The Memory Optimization by Kerzérho, V., Bernard, S., Cauvet, P., Janik, J. M.

“…Integral non-linearity (INL) is the main static parameter of analog-to-digital converter. This paper presents a comparison between different INL test…”
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Implementing indirect test of RF circuits without compromising test quality: a practical case study by El Badawi, H., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Lefevre, F., Gorenflot, I.

“…Cost reduction is a crucial step in testing AMS/RF circuits, and one way of achieving this is to implement an indirect test strategy. Although this strategy…”
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs by Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. El, Flottes, M.-L., Girard, P., Kerzerho, V., Latorre, L., Lefevre, F., Rouzeyre, B., Valea, E., Vayssadel, T., Virazel, A.

“…Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological…”
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Toward Adaptation of ADCs to Operating Conditions through On-chip Correction by Kerzerho, V., Guillaume-Sage, L., Azais, F., Comte, M., Renovell, M., Bernard, S.

“…This paper discusses the need for on-chip correction of mixed-signal integrated circuits, and particularly Analog-to-Digital Converters (ADCs), for in-situ…”
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A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy by Larguech, S., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Renovell, M.

“…A promising solution to reduce the testing costs of analog/RF circuits is the alternate test strategy, which permits to replace costly specification…”
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A generic methodology for building efficient prediction models in the context of alternate testing by Larguech, S., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Renovell, M.

“…A promising solution to reduce the testing costs of analog/RF circuits is the alternate test strategy, which permits to replace costly specification…”
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New implementions of predictive alternate analog/RF test with augmented model redundancy by Ayari, H., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Renovell, M.

“…This paper discusses new implementations of the predictive alternate test strategy that exploit model redundancy in order to improve test confidence. The key…”
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Making predictive analog/RF alternate test strategy independent of training set size by Ayari, H., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Potin, O., Renovell, M.

“…This paper presents an alternate test implementation based on model redundancy that permits to achieve lower prediction errors than a classical implementation,…”
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Smart selection of indirect parameters for DC-based alternate RF IC testing by Ayari, H., Azais, F., Bernard, S., Comte, M., Renovell, M., Kerzerho, V., Potin, O., Kelma, C.

“…In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC…”
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A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs by Kerzerho, V., Cauvet, P., Bernard, S., Azais, F., Comte, M., Renovell, M.

“…Testing mixed-signal circuits remains one of the most difficult challenges within the semiconductor industry. In this article, the authors present a novel DFT…”
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A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC by Kerzérho, V., Bernard, S., Azaïs, F., Comte, M., Potin, O., Shan, C., Bontorin, G., Renovell, M.

“…The histogram-based technique is commonly used for testing of Analog-to-Digital Converters (ADC). One of the parameters measured thanks to this technique is…”
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits? by El Badawi, H., Azais, F., Bernard, S., Comte, M., Kerzerho, V., Lefevre, F.

“…Indirect testing of analog and RF integrated circuits is a widely studied approach, which has the benefits of relaxing requirements on test equipment and…”
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A multi-converter DFT technique for complex SIP: Concepts and validation by Kerzerho, V., Cauvet, P., Bernard, S., Azais, F., Comte, M., Renovell, M.

“…This paper presents a new technique called ldquoAnalog Network of Convertersrdquo that allows to test a set of ADCs and DACs embedded in a complex circuit as…”
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Adaptive LUT-based system for in situ ADC auto-correction by Bernard, S, Azaïs, F, Comte, M, Potin, O, Kerzérho, V, Renovell, M

“…Complex chips may today include several Analog-to-Digital and Digital-to-Analog Converters. These modules interface the external analog word with the internal…”
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ANC-based method for testing converters with random-phase harmonics by Kerzérho, V, Azais, F, Comte, M, Cauvet, P, Bernard, S, Renovell, M

“…In this paper, we present an extension of the ANC ("Analogue Network of Converters")-based method to characterize the harmonic components of a set of…”
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