Search Results - "Kerns, B.M."

Statistical Characterization and Process Control for Improved Growth of La2−xSrxCuO4 Films by Clayhold, J. A., Pelleg, O., Bollinger, A. T., Logvenov, G., Kerns, B. M., Schroer, M. D., Rench, D. W., Bozovic, I.

“…We have used combinatorial molecular beam epitaxy (COMBE) technique to deposit thin cuprate films with continuous spread in chemical composition, as well as…”
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Constraints on Models of Electrical Transport in Optimally Doped La2−xSrxCuO4 from Measurements of Radiation-Induced Defect Resistance by Clayhold, J. A., Pelleg, O., Ingram, D. C., Bollinger, A. T., Logvenov, G., Rench, D. W., Kerns, B. M., Schroer, M. D., Sundling, R. J., Bozovic, I.

“…Precise measurements of the temperature dependence of additional resistivity caused by defect scattering were used to constrain models of carrier transport in…”
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