Search Results - "Kazemi, Zainab"

Photoluminescence and Stability of Sputtered SiO x Layers by Hosseini-Saber, Seyed Mohammad Ali, Muydinov, Ruslan, Ahmadi, Najme, Ibaceta-Jaña, Josefa, Kazemi, Zainab, Seeger, Stefan, Gundlach, Heiko, Gernert, Ulrich, Szyszka, Bernd, Eichler, Hans Joachim

“…SiO x layers with thicknesses of about 300–1000 nm are produced by sputtering silicon onto glass and quartz substrates. Silicon is oxidized during deposition,…”
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Photoluminescence and Stability of Sputtered SiOx Layers by Hosseini-Saber, Seyed Mohammad Ali, Muydinov, Ruslan, Ahmadi, Najme, Ibaceta-Jaña, Josefa, Kazemi, Zainab, Seeger, Stefan, Gundlach, Heiko, Gernert, Ulrich, Szyszka, Bernd, Eichler, Hans Joachim

“…SiOx layers with thicknesses of about 300–1000 nm are produced by sputtering silicon onto glass and quartz substrates. Silicon is oxidized during deposition,…”
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Atomic force microscope base nanolithography for reproducible micro and nanofabrication by Dehzangi, Arash, Larki, Farhad, Majlis, Burhanuddin Y., Kazemi, Zainab, Ariannejad, MohammadMahdi, Abdullah, A. Makarimi, Nasery, Mahmood Goodarz, Navasery, Manizheh, Saion, Elias B., Halimah, Mohamed K., Khalilzadeh, Nasrin, Hutagalung, Sabar D.

“…Atomic force microscopy nanolithography (AFM) is a strong fabrication method for micro and nano structure due to its high spatial resolution and positioning…”
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