Search Results - "Karulkar, PC"

Ultra violet sensors based on nanostructured ZnO spheres in network of nanowires: a novel approach by Hullavarad, SS, Hullavarad, NV, Karulkar, PC, Luykx, A, Valdivia, P

“…Abstract The ZnO nanostructures consisting of micro spheres in a network of nano wires were synthesized by direct vapor phase method. X-ray Photoelectron…”
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Ultra violet sensors based on nanostructured ZnO spheres in network of nanowires: a novel approach by Hullavarad, SS, Hullavarad, NV, Karulkar, PC, Luykx, A, Valdivia, P

“…The ZnO nanostructures consisting of micro spheres in a network of nano wires were synthesized by direct vapor phase method. X-ray Photoelectron Spectroscopy…”
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Redistribution of pads on a singulated IC die using laser direct-write ablation by Chengping Zhang, Bartholomew, R., Karulkar, P.C.

“…The use of laser direct-write technology is demonstrated for rapid turnaround redistribution of pads on known good integrated circuit dice. The technology,…”
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Quality of gate oxides grown on state-of-the-art SIMOX and ZMR SOI substrates by Karulkar, P.C.

“…The quality of 25-nm gate oxides formed on state-of-the-art SIMOX and ZMR silicon-on-insulator (SOI) substrates was studied using NMOSFETs. Circular, edgeless,…”
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Characterization of etching of silicon dioxide and photoresist in a fluorocarbon plasma by Karulkar, Pramod C., Wirzbicki, Mark A.

“…Reactive ion etching of silicon dioxide and positive photoresist in CHF3–C2F6–O2–He plasma in a parallel‐plate etcher is studied using the response surface…”
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Ultra-thin SOI MOSFETs at high temperature by Karulkar, P.C.

“…Integrated circuits operating at elevated temperatures are of interest in several applications such as automotive, well logging, aircraft, and spacecraft…”
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Detection of pinholes in the insulator deposited on aluminum metallization by Karulkar, Pramod C.

“…A method for detecting defects and pinholes in the insulator layer deposited on the aluminum metallization is described. This technique decorates the locations…”
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An AFM study of surface morphology of commercial 6" SOI wafers by Neal, T.R., Karulkar, P.C.

“…Work reported in this paper involved an extensive Atomic Force Microscopic investigation of the surface quality of 6" SIMOX SOI wafers without any epitaxy in…”
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Highly photoconducting O2-doped CdS films deposited by spray pyrolysis by Richards, D., El-Korashy, A. M., Stirn, R. J., Karulkar, P. C.

“…CdS films have been prepared by spraying in air solutions of thiourea with either cadmium chloride or cadmium acetate with varying mole ratio and substrate…”
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XPS/AES investigation of cross contamination in a plasma etcher by Karulkar, Pramod C., Tran, Ngoc C.

“…Although dedication of plasma etching equipment strictly to a single process is becoming a common practice in IC labs, a large number of older plasma systems…”
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