Search Results - "Kang Shao-peng"
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Wafer map defect pattern classification based on multi-scale depthwise separable convolution
Published in 2023 International Symposium of Electronics Design Automation (ISEDA) (08-05-2023)“…Wafer map defect recognition can help engineers quickly locate problems in the IC manufacturing process, which is critical for improving the yield and…”
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Conference Proceeding -
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Development Actuality and Application of Registration Technology in Augmented Reality
Published in 2008 International Symposium on Computational Intelligence and Design (01-10-2008)“…The registration in augmented reality is a process which merges virtual objects generated by computer with real world image caught by camera. This paper…”
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Conference Proceeding
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Design of UAV Telepresence and Simulation Platform Based on VR
Published in 2008 International Conference on Cyberworlds (01-09-2008)“…A "man-in-the-onboard-loop" solving scheme is proposed in order to overcome the disadvantages of UAV control method and solve the problems on UAV pilot…”
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Conference Proceeding