Search Results - "Kang, Bongkoo"
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Active Balancing of Li-Ion Battery Cells Using Transformer as Energy Carrier
Published in IEEE transactions on industrial electronics (1982) (01-02-2017)“…A circuit for balancing Li-ion battery cells is proposed. This circuit requires one small transformer and N + 3 bilateral switches to equalize the charging…”
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2
Modularized Design of Active Charge Equalizer for Li-Ion Battery Pack
Published in IEEE transactions on industrial electronics (1982) (01-11-2018)“…A modularized design of an active charge equalizer and a charge equalization algorithm for a Li-ion battery pack are proposed in this paper. The equalizer…”
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3
Active Cell Balancing of Li-Ion Batteries Using LC Series Resonant Circuit
Published in IEEE transactions on industrial electronics (1982) (01-09-2015)“…This paper proposes a new active cellbalancing method for Li-ion batteries. It uses an LC series resonant circuit as an energy carrier, which transfers the…”
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4
Quasi-Resonant Passive Snubber for Improving Power Conversion Efficiency of a DC–DC Step-Down Converter
Published in IEEE transactions on power electronics (01-03-2018)“…A quasi-resonant passive snubber for the conventional dc-dc step-down converter is proposed. The snubber uses six passive components to achieve a zero-current…”
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5
Improvement of Power-Conversion Efficiency of a DC-DC Boost Converter Using a Passive Snubber Circuit
Published in IEEE transactions on industrial electronics (1982) (01-04-2012)“…This paper proposes a method of improving the power-conversion efficiency of a direct-current-direct-current boost converter. The proposed method uses a…”
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6
High-Efficiency Asymmetric Forward-Flyback Converter for Wide Output Power Range
Published in IEEE transactions on power electronics (01-01-2017)“…This paper proposes an asymmetric forward-flyback dc-dc converter that has high power-conversion efficiency η e over a wide output power range. To solve the…”
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7
Active Charge Equalizer of Li-Ion Battery Cells Using Double Energy Carriers
Published in Energies (Basel) (15-06-2019)“…In this work, a new active balancing circuit is proposed. This circuit consists of a cell-access network and an energy-transfer network. The cell-access…”
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8
Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Published in Microelectronics and reliability (01-09-2018)“…This paper presents a method to measure the threshold voltage degradation ΔVth along the channel direction due to electrical stress in MOSFETs. This method…”
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9
Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET
Published in Microelectronics and reliability (01-09-2019)“…This paper presents an investigation of the effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of SiO2 dielectric nMOSFET…”
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10
Effects of film thickness and Sn concentration on electrical properties of solution-processed zinc tin oxide thin film transistors
Published in Thin solid films (01-10-2013)“…This paper investigates the effect of Sn concentration and film thickness on properties of zinc tin oxide (ZTO) thin film transistors (TFTs) fabricated using a…”
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Journal Article Conference Proceeding -
11
Linear frequency modulation of voltage-controlled oscillator using delay-line feedback
Published in IEEE microwave and wireless components letters (01-06-2005)“…This letter proposes a structure for a voltage-controlled oscillator (VCO) circuit which operates in a frequency range of 4.0-4.3 GHz and can achieve a highly…”
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12
Design of 6-18 GHz Wideband Phase Shifters Using Radial Stubs
Published in IEEE microwave and wireless components letters (01-03-2007)“…A 6-18 GHz wideband phase shifter is proposed. This phase shifter consists of one Lange coupler, four radial stubs, and four switching diodes and bias…”
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13
Low-Cost Drive Circuit for AC-Direct LED Lamps
Published in IEEE transactions on power electronics (01-10-2015)“…This paper proposes a drive circuit for ac-direct LED lamps. The proposed circuit consists only of a line filter, an LED bridge, a load inductor, a…”
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Journal Article -
14
Voltage dependent degradation of HfSiON/SiO2 nMOSFETs under positive bias temperature instability
Published in Microelectronics and reliability (01-11-2014)“…[Display omitted] •PBTI stress generated shallow traps in HfSiON dielectric.•The exponent of power-law for ΔVth increased exponentially with stress…”
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Journal Article -
15
Impact of Off-State Stress and Negative Bias Temperature Instability on Degradation of Nanoscale pMOSFET
Published in IEEE electron device letters (01-02-2012)“…This letter investigates the impact of dynamic stress on the degradation of a nanoscale p-channel metal-oxide-semiconductor field-effect transistor (pMOSFET)…”
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16
High-efficiency Bidirectional Buck–Boost Converter for Residential Energy Storage System
Published in Energies (Basel) (06-10-2019)“…This paper proposes a bidirectional dc–dc converter for residential micro-grid applications. The proposed converter can operate over an input voltage range…”
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17
Circuit Structure and Control Method to Reduce Size and Harmonic Distortion of Interleaved Dual Buck Inverter
Published in Energies (Basel) (01-03-2020)“…A new circuit structure and control method for a high power interleaved dual-buck inverter are proposed. The proposed inverter consists of six switches, four…”
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Journal Article -
18
Effect of off-State Stress and Drain Relaxation Voltage on Degradation of a Nanoscale nMOSFET at High Temperature
Published in IEEE electron device letters (01-07-2011)“…This paper investigates the degradation mechanism of a nanoscale n-channel metal-oxide-semiconductor field-effect transistor (nMOSFET) that is subjected to…”
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19
Compact Single-Stage Micro-Inverter with Advanced Control Schemes for Photovoltaic Systems
Published in Energies (Basel) (2019)“…This paper proposes a grid-connected single-stage micro-inverter with low cost, small size, and high efficiency to drive a 320 W class photovoltaic panel. This…”
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Journal Article -
20
Method to predict length dependency of negative bias temperature instability degradation in p-MOSFETs
Published in Japanese Journal of Applied Physics (01-08-2016)“…We propose a method to predict the length dependency of the magnitude of degradation caused by negative bias temperature instability (NBTI) stress applied to a…”
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