Search Results - "Kamei, Takahiro"

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    Individual identification of goldfish from eye morphology: the eye mark method by Yoshida, Masayuki, Terabayashi, Itsumi, Kamei, Takahiro, Misawa, Akari, Yamamoto, Masaki, Umino, Tetsuya

    Published in Zoological science (01-11-2013)
    “…We developed an individual identification method for goldfish based on morphological variation of the iris. Each goldfish has a few dark lines (eye marks) in…”
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    Journal Article
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    Variability Analysis of Scaled Crystal Channel and Poly-Si Channel FinFETs by Yongxun Liu, Kamei, T., Matsukawa, T., Endo, K., O'uchi, S., Tsukada, J., Yamauchi, H., Ishikawa, Y., Hayashida, T., Sakamoto, K., Ogura, A., Masahara, M.

    Published in IEEE transactions on electron devices (01-03-2012)
    “…The threshold voltage Vt variability in the scaled crystal channel and poly-Si channel double-gate fin-type metal-oxide-semiconductor field-effect transistors…”
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    Journal Article
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    Fin-Height Effect on Poly-Si/PVD-TiN Stacked-Gate FinFET Performance by Hayashida, T., Endo, K., Liu, Y., O'uchi, S., Matsukawa, T., Mizubayashi, W., Migita, S., Morita, Y., Ota, H., Hashiguchi, H., Kosemura, D., Kamei, T., Tsukada, J., Ishikawa, Y., Yamauchi, H., Ogura, A., Masahara, M.

    Published in IEEE transactions on electron devices (01-03-2012)
    “…We compared the electrical characteristics, including mobility and on -state current I on , of n + -poly-Si/PVD-TiN stacked-gate FinFETs with different fin…”
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    Journal Article
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    Gate Structure Dependence of Variability in Polycrystalline Silicon Fin-Channel Flash Memories by Liu, Yongxun, Kamei, Takahiro, Matsukawa, Takashi, Endo, Kazuhiko, O'uchi, Shinichi, Tsukada, Junichi, Yamauchi, Hiromi, Ishikawa, Yuki, Hayashida, Tetsuro, Sakamoto, Kunihiro, Ogura, Atsushi, Masahara, Meishoku

    Published in Japanese Journal of Applied Physics (01-06-2013)
    “…Polycrystalline silicon (poly-Si) fin-channel tri-gate (TG)- and double-gate (DG)-type flash memories with a thin n + -poly-Si floating gate (FG) and different…”
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    Journal Article
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    69.2: New R2PAT Printing Method for Fabricating TFT Electrodes by Tanaka, Masanobu, Ishihara, Hirotsugu, Shimamura, Toshiki, Machida, Akio, Kamei, Takahiro, Ogawa, Masataka

    “…We have developed a low contact pressure Residual ink Removed Pattern Transfer (R2PAT) printing method which allows fully additive, vacuum‐free TFT electrode…”
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    Journal Article
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    Soft-Material-Based Highly Reliable Tri-Axis Tactile Thin-Film Sensors for Robotic Manipulation Tasks by Tsukamoto, Kei, Ebisui, Akira, Goto, Tetsuro, Sakakura, Yoshiaki, Kobayashi, Ken, Sato, Satoshi, Kamei, Takahiro, Imai, Yutaka, Nomoto, Kazumasa

    Published in 2021 IEEE Sensors (31-10-2021)
    “…Tactile sensing is essential for intelligent robot control such as for dexterous manipulation tasks. To provide reliable sensors that can withstand industrial…”
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    Conference Proceeding
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    P‐138: Rollable Multi‐Touch Organic Capacitive Pressure Sensor for Multi‐Directional User Interactions by Ebisui, Akira, Kaneko, Hiroki, Tsukamoto, Kei, Harada, Tomoko, Goto, Tetsuro, Sakakura, Yoshiaki, Miyawaki, Manami, Hasegawa, Hayato, Kobayashi, Ken, Sato, Satoshi, Kamei, Takahiro, Nomoto, Kazumasa

    “…We have developed a rollable multi‐touch pressure sensor that works with a radius down to 5 mm, a high dynamic range of 1–300 kPa, and a spatial resolution…”
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    Journal Article
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    Friction force microscopy study of the Langmuir-Blodgett films with different molecular structures by FUJIWARA, I, KAMEI, T, SETO, J

    Published in Japanese Journal of Applied Physics (01-09-1995)
    “…The microscopic frictional properties of Langmuir-Blodgett (LB) films were investigated with a friction force microscope (FFM). At first, the microscopic…”
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    Journal Article
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    Demonstration of Split-Gate Type Trigate Flash Memory With Highly Suppressed Over-Erase by Kamei, Takahiro, Yongxun Liu, Matsukawa, T., Endo, K., O'uchi, S., Tsukada, J., Yamauchi, H., Ishikawa, Y., Hayashida, T., Sakamoto, K., Ogura, A., Masahara, M.

    Published in IEEE electron device letters (01-03-2012)
    “…The functional split-gate type trigate flash memory cell transistors have successfully been fabricated for the first time, and their threshold voltage (V t )…”
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    Journal Article
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