Search Results - "Kalayci, Y"

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    Calculated valence electronic structure of 3d metals for use in the X-ray intensity ratio studies by Dagistanli, H., Kalayci, Y., Mutlu, R.H.

    “…3d occupation numbers of the transition elements corresponding to various types of atomic configurations are calculated by means of the linear muffin-tin…”
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    Journal Article
  3. 3

    Influence of the alloying effect on nickel K-shell fluorescence yield in Ni–Si alloys by Kalayci, Y., Agus, Y., Ozgur, S., Efe, N., Zararsiz, A., Arikan, P., Mutlu, R.H.

    “…Alloying effects on the K-shell fluorescence yield ω K of nickel in Ni–Si binary alloy system have been studied by energy dispersive X-ray fluorescence. It is…”
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    Journal Article
  4. 4

    Valence electronic structure of Ni in Ni–Si alloys from relative K X-ray intensity studies by Kalayci, Y., Aydinuraz, A., Tugluoglu, B., Mutlu, R.H.

    “…The Kβ-to-Kα X-ray intensity ratio of Ni in Ni3Si, Ni2Si and NiSi has been determined by energy dispersive X-ray fluorescence technique. It is found that the…”
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    Journal Article
  5. 5

    A miniaturized Ka-band MMIC high-gain medium power amplifier in coplanar line technique by using a conventional 0.5 /spl mu/m MESFET technology by Kalayci, Y., Tempel, R., Lutke, W., Akpinar, M., Wolff, I.

    “…This paper presents a miniaturized Ka-band MMIC high-gain medium power amplifier in coplanar line technique by using a conventional 0.5 /spl mu/m GaAs-MESFET…”
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    Conference Proceeding
  6. 6

    Miniaturising of K-Band Coplanar MMIC-Amplifiers by Using Lumped Elements by Kalayci, Y., Tempel, R., Hopf, B., Borkes, J. J., Grundler, R., Wolff, I.

    Published in 1994 24th European Microwave Conference (01-09-1994)
    “…As MMICs become more widespread in commercial applications the costs of production gain increased attention. For the MMIC-Designer it is important to reduce…”
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    Conference Proceeding
  7. 7

    Circuit-Internal Characterization of MMICs using Two-Dimensional Electro-Optic Field Mapping in Combination with Microwave CAD Techniques by David, G., Tempel, R, Ising, A., Kalayci, Y., Wolff, I., Jager, D.

    Published in 1994 24th European Microwave Conference (01-09-1994)
    “…For the first time, distributions of microwave signals in an MMIC are measured by electro-optic field mapping techniques and compared with results of microwave…”
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    Conference Proceeding