Search Results - "KISIELOWSKI, C.F"

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  1. 1
    Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopy

    Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopy by MAHALINGAM, K, EYINK, K.G, BROWN, G.J, DORSEY, D.L, KISIELOWSKI, C.F, THUST, A

    Published in Journal of microscopy (Oxford) (01-06-2008)
    “…Employing exit-plane wave function (EPWF) reconstruction in high-resolution transmission electron microscopy (HRTEM), we have developed an approach to atomic…”
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    Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity

    Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity by Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specht, P., Yuan, G., Frei, H.

    Published in Micron (Oxford, England : 1993) (01-01-2015)
    “…Transmission electron microscopy (TEM) has become an indispensable technique for studying heterogeneous catalysts. In particular, advancements of…”
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