Search Results - "KERKHOFF, H. G"

Observation of many new argon valence satellites near threshold by BECKER, U, LANGER, B, SHIRLEY, D. A, KERKHOFF, H. G, KUPSCH, M, SZOSTAK, D, WEHLITZ, R, HEIMANN, P. A, LIU, S. H, LINDLE, D. W, FERRETT, T. A

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Subshell photoionization of Xe between 40 and 1000 eV by BECKER, U, SZOSTAK, D, KERKHOFF, H. G, KUPSCH, M, LANGER, B, WEHITZ, R, YAGISHITA, A, HAYAISHI, T

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Near-threshold resonance enhancement of neon valence satellites studied with synchrotron radiation by BECKER, U, HÖLZEL, R, KERKHOFF, H. G, LANGER, B, SZOSTAK, D, WEHLITZ, R

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A new test generation approach for embedded analogue cores in SoC by Stancic, M., Fang, L., Weusthof, M.H.H., Tijink, R.M.W., Kerkhoff, H.G.

“…This paper proposes a new test-generation approach for embedded analogue cores in SoC. The key features of this approach are the developed testability-analysis…”
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Testability analysis of analog systems by Hemink, G.J., Meijer, B.W., Kerkhoff, H.G.

“…A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The…”
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Electron-ejection asymmetries by molecular orientation following K-shell excitation of CO by BECKER, U, HÖLZEL, R, KERKHOFF, H. G, LANGER, B, SZOSTAK, D, WEHLITZ, R

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Testable design and testing of micro-electro-fluidic arrays by Kerkhoff, H.G., Acar, M.

“…The testable design and testing of a fully software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control and interface electronics is…”
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On the maximization of the sustained switching activity in a processor by Cantoro, R., Reorda, M. Sonza, Rohani, A., Kerkhoff, H. G.

“…Recently, several application areas in the test domain (e.g., burn-in and aging monitoring) started to require suitable input stimuli, able to maximize the…”
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Defect-oriented testing of Josephson logic circuits and systems by Kerkhoff, H.G., Speek, H.

“…In this paper, defect-oriented testing of low temperature superconducting Josephson logic systems is used as a basis for structural test generation. This…”
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Testing of a microanalysis system by Kerkhoff, H.G.

“…During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes…”
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Computer-aided test flow in core-based design by Zivkovic, V.A, Tangelder, R.J.W.T, Kerkhoff, H.G

“…This paper copes with the efficient test-pattern generation in a core-based design. A consistent Computer-Aided Test (CAT) flow is proposed based on the…”
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Structural testing of the HYPRES niobium process by Joseph, A.A., Sese, J., Flokstra, J., Kerkhoff, H.G.

“…The HYPRES 3.0 /spl mu/m niobium (Nb) process has proven to be capable of realizing complex low temperature superconductor (LTS) rapid single flux quantum…”
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Test structures and their application in structural testing of digital RSFQ circuits by Joseph, Arun A., Heuvelmans, Sander, Gerritsma, Gerrit J., Kerkhoff, Hans G.

“…As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should…”
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The detection of defects in a niobium tri-layer process by Joseph, A.A., Heuvelmans, S., Gerritsma, G.J., Kerkhoff, H.G.

“…Niobium (Nb) LTS processes are emerging as the technology for future ultra high-speed systems especially in the digital domain. As the number of Josephson…”
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VHDL-AMS fault simulation for testing DNA bio-sensing arrays by Kerkhoff, H.G., Zhang, X., Liu, H., Richardson, A., Nouet, P., Azais, F.

“…The market of microelectronic fluidic arrays for biomedical applications, like DNA determination, is rapidly increasing. In order to evaluate these systems in…”
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On-line dependability enhancement of multiprocessor SoCs by resource management by Ter Braak, T D, Burgess, S T, Hurskainen, H, Kerkhoff, H G, Vermeulen, B, Zhang, X

“…This paper describes a new approach towards dependable design of homogeneous multi-processor SoCs in an example satellite-navigation application. First, the…”
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Photoionization of helium above the He+(n=2) threshold: autoionization and final-state symmetry by LINDLE, D. W, FERRETT, T. A, BECKER, U, KOBRIN, P. H, TRUESDALE, C. M, KERKHOFF, H. G, SHIRLEY, D. A

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Helium and neon photoelectron satellites at threshold by HEIMANN, P. A, BECKER, U, KERKHOFF, H. G, LANGER, B, SZOSTAK, D, WEHLITZ, R, LINDLE, D. W, FERRETT, T. A, SHIRLEY, D. A

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On-chip tap-delay measurements for a digital delay-line used in high-speed inter-chip data communications by Petre, O., Kerkhoff, H.G.

“…During the last few years, new synchronization techniques to send data between ICs at increasingly high data-rates have been developed. Some of them rely on…”
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An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures by Zivkovic, Va, Tangelder, Rjwt, Kerkhoff, Hg

“…In this paper the implementation of the test strategy in a so-called Very Long Instruction Word Transport Triggered Architecture (VLIW-TTA) is discussed. The…”
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