Search Results - "KARANYI, J"
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Current-voltage anomalies on polycrystalline GdSi2/p-Si Schottky junctions due to grain boundaries
Published in Vacuum (01-08-1995)Get full text
Conference Proceeding Journal Article -
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A Transient Method for Measuring Current-Voltage Characteristics with Negative Differential Resistance Regions
Published in Physica status solidi. A, Applied research (01-09-1997)Get full text
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Thermal decomposition of bulk and heteroepitaxial (100) InP surfaces: A combined in situ scanning electron microscopy and mass spectrometric study
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (01-09-1998)“…The thermal decomposition of bulk and heteroepitaxial (100) InP surfaces is studied by in situ scanning electron microscopy combined with mass spectrometry…”
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Morphology and electrical behaviour of Pd/sub 2/Si/p-Si junctions
Published in ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) (2000)“…Dendrite like morphology was observed in Pd/sub 2/Si/p-Si junctions. The obtained high ideality factors and the significant difference between the apparent…”
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Conference Proceeding -
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Current-voltage anomalies on polycrystalline GdSi 2/ p-Si Schottky junctions due to grain boundaries
Published in Vacuum (1995)“…The current-voltage characteristics of epitaxial orthorhombic, textured orthorhombic, polycrystalline orthorhombic, and polycrystalline hexagonal GdSi…”
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Journal Article