Search Results - "Kátai, Sz"

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    Plasma analyser for plasma-assisted surface process diagnostics up to 100 mbar by Kátai, Sz, Tass, Z, Bori, L, Hárs, Gy, Deák, P

    Published in Vacuum (2000)
    “…Ion beam mass spectrometer (IBMS) has been developed for in situ, real-time monitoring of the ion composition of a plasma in the vicinity of the substrate…”
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    Journal Article Conference Proceeding
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    High-Resolution Thermal Processing of Semiconductors Using Pulsed-Laser Interference Patterning by Kelly, M. K., Rogg, J., Nebel, C. E., Stutzmann, M., Kátai, Sz

    Published in Physica status solidi. A, Applied research (01-04-1998)
    “…Interference patterns from overlapping beams of an intense pulsed laser are used to realize high‐resolution thermal processing for direct structuring of…”
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    Journal Article
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    Characterization of nucleation and growth of MW-CVD diamond films by spectroscopic ellipsometry and ion beam analysis methods by Pintér, I., Petrik, P., Szilágyi, E., Kátai, Sz, Deák, P.

    Published in Diamond and related materials (01-10-1997)
    “…The time evolution of diamond film nucleation and growth have been investigated by spectroscopic ellipsometry (SE). Rutherford backscattering spectrometry…”
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    Journal Article