Search Results - "Junge, K.E."

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    Optical properties and band structure of Ge 1− yC y and Ge-rich Si 1− x− yGe xC y alloys by Junge, K.E., Voss, N.R., Lange, R., Dolan, J.M., Zollner, Stefan, Dashiell, M., Hits, D.A., Orner, B.A., Jonczyk, R., Kolodzey, J.

    Published in Thin solid films (1998)
    “…We measured the dielectric function of Ge 1− y C y and Ge-rich Si 1− x− y Ge x C y alloys from 1.6 to 5.2 eV using spectroscopic ellipsometry. These alloys…”
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    Journal Article
  2. 2

    Dielectric response of thick low dislocation-density Ge epilayers grown on (001) Si by Junge, Kelly E., Lange, Rüdiger, Dolan, Jennifer M., Zollner, Stefan, Dashiell, M., Orner, B. A., Kolodzey, J.

    Published in Applied physics letters (23-12-1996)
    “…Spectroscopic ellipsometry was used to measure the dielectric functions of epitaxial and bulk Ge at photon energies from 1.5 to 5.2 eV. The epitaxial Ge was…”
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