Search Results - "Jun-Yu Ko"

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  1. 1
    Interface Characterization of HfO2/GaSb MOS Capacitors With Ultrathin Equivalent Oxide Thickness by Using Hydrogen Plasma Treatment

    Interface Characterization of HfO2/GaSb MOS Capacitors With Ultrathin Equivalent Oxide Thickness by Using Hydrogen Plasma Treatment by Ming-Li Tsai, Jun-Yu Ko, Shin-Yuan Wang, Chao-Hsin Chien

    Published in IEEE transactions on electron devices (01-09-2016)
    “…We investigate p-type GaSb MOS capacitors with various HfO 2 thicknesses grown using an atomic layer deposition. GaSb surfaces treated with ex-situ chemical…”
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  2. 2
    Interface Characterization of HfO sub(2)/GaSb MOS Capacitors With Ultrathin Equivalent Oxide Thickness by Using Hydrogen Plasma Treatment

    Interface Characterization of HfO sub(2)/GaSb MOS Capacitors With Ultrathin Equivalent Oxide Thickness by Using Hydrogen Plasma Treatment by Tsai, Ming-Li, Ko, Jun-Yu, Wang, Shin-Yuan, Chien, Chao-Hsin

    Published in IEEE transactions on electron devices (01-09-2016)
    “…We investigate p-type GaSb MOS capacitors with various HfO sub(2) thicknesses grown using an atomic layer deposition. GaSb surfaces treated with ex-situ…”
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  3. 3
    Interface Characterization of HfO 2 /GaSb MOS Capacitors With Ultrathin Equivalent Oxide Thickness by Using Hydrogen Plasma Treatment

    Interface Characterization of HfO 2 /GaSb MOS Capacitors With Ultrathin Equivalent Oxide Thickness by Using Hydrogen Plasma Treatment by Tsai, Ming-Li, Ko, Jun-Yu, Wang, Shin-Yuan, Chien, Chao-Hsin

    Published in IEEE transactions on electron devices (01-09-2016)
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