Search Results - "Journal of electronic testing"

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead by Guin, Ujjwal, DiMase, Daniel, Tehranipoor, Mohammad

“…The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected…”
Get full text

Machine Learning for Hardware Security: Opportunities and Risks by Elnaggar, Rana, Chakrabarty, Krishnendu

“…Recently, machine learning algorithms have been utilized by system defenders and attackers to secure and attack hardware, respectively. In this work, we…”
Get full text

A Review of Various Defects in PCB by Sankar, V. Udaya, Lakshmi, Gayathri, Sankar, Y. Siva

“…Printed Circuit Boards (PCBs) are the building blocks for all electronic products. Fabrication of a PCB involves various mechanical and chemical processes. As…”
Get full text

Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration by Yu, Shifeng, Dai, Junjie, Li, Junhui

“…In this paper, the reliability of copper pillar micro-bump under random vibration is investigated. Three kinds of copper pillar solder joints with different…”
Get full text

Fatigue Life Based Study of Electronic Package Mounting Locations on Printed Circuit Boards Subjected to Random Vibration Loads by Muthuram, N., Saravanan, S.

Get full text

YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards by Yunpeng, Gao, Rui, Zhang, Mingxu, Yang, Sabah, Fahad

Get full text

A Novel Two-Stage Model Based SCA against secAES by Wu, XiaoNian, Li, JinLin, Zhang, RunLian, Zhang, HaiLong

Get full text

Editorial by Agrawal, Vishwani D.

Get full text

Test Modules for Enhanced Testability of Single Flux Quantum Integrated Circuits by Qoutb, Abdelrahman G., Kawa, Jamil, Friedman, Eby G.

Get full text

Reliability Analysis for a GaAs LNA with Temperature Stress by Lin, Qian, Wang, Mei-qian

Get full text

PCB Defect Recognition by Image Analysis using Deep Convolutional Neural Network by Zhang, Jiantao, Shi, Xinyu, Qu, Dong, Xu, Haida, Chang, Zhengfang

Get full text

Generating Synthetic Layout Test Patterns using Deep Learning by Mahmoud, Adel, El-Kharashi, M. Watheq, Salama, Cherif

Get full text

Equivalent Circuit and Damage Threshold Study of Communication Interfaces under HEMP by Feng, Yibo, Sun, Lu, Lu, Jiarun, Li, Zhenxiao, Tian, Jin, Qiu, Yang

Get full text

Investigating and Improving the Performance of Radiation-Hardened SRAM Cell with the Use of Multi-Voltage Transistors by Ahirwar, Rachana, Pattanaik, Manisha, Srivastava, Pankaj

Get full text

Efficient Selective Image Fusion: A PCB Diagnosis Approach and Implementation by Wu, Xueqin, Chen, Yikai, Wang, Zekai, Tian, Chenming, Shen, Zhonghua

Get full text

Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT by Mouleeswaran, S. K., Ramesh, K., Manikandan, K., Anbalagan, VivekYoganand

“…In recent years, the Industrial Internet of Things (IoT) has grown significantly. Automation along with intelligence introduces a slew of cyber risks while…”
Get full text

An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization Algorithm by Zheng, Leiqing, Arasteh, Bahman, Mehrabani, Mahsa Nazeri, Abania, Amir Vahide

“…The enhancement of software system quality is achieved through a process called software testing, which is a time and cost-intensive stage of software…”
Get full text

Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models by Dhar, Manali, Mukherjee, Chiradeep, Banerjee, Ananya, Manna, Debasmita, Panda, Saradindu, Maji, Bansibadan

“…The semiconductor industry has encountered the physical constraints of current semiconductor materials and the impending end of Moore's forecast. The recent…”
Get full text

Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation by Khairullah, Shawkat Sabah

“…With the increasing interest in embedding digital devices in safety-critical cyber-physical systems (CPSs), such as industrial automation, aerospace, and…”
Get full text

High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBM by Li, Gen, Li, Wenhai, Wen, Tianzhu, Sun, Weichao, Tang, Xi

“…The challenge caused by redundant feature interference in high-dimensional fault feature data of analog circuits, will undermines the efficacy of conventional…”
Get full text