Search Results - "Josell, D"

Curvature enhanced adsorbate coverage mechanism for bottom-up superfilling and bump control in damascene processing by Moffat, T.P., Wheeler, D., Kim, S.-K., Josell, D.

“…Superconformal electrodeposition is explained by the curvature enhanced adsorbate coverage (CEAC) mechanism. A CEAC model is used to quantitatively explain…”
Get full text

Heat transfer through nanoscale multilayered thermal barrier coatings at elevated temperatures by Josell, D., Bonevich, J.E., Nguyen, T.M., Johnson, R.N.

“…Heat transfer through thermal barrier coatings (TBCs) composed of alternating nanometer thick layers of aluminum oxide and 7% yttria stabilized zirconia (7YSZ)…”
Get full text

Stability in thin film multilayers and microlaminates: the role of free energy, structure, and orientation at interfaces and grain boundaries by Lewis, A.C., Josell, D., Weihs, T.P.

“…In polycrystalline multilayer systems, the free energies of the interfaces and grain boundaries will determine the relative stability of each layer as well as…”
Get full text

Superconformal electrodeposition in submicron features by Josell, D, Wheeler, D, Huber, W H, Moffat, T P

“…Superconformal electrodeposition is explained based on a local growth velocity that increases with coverage of a catalytic species adsorbed on the…”
Get full text

Backcontact CdSe/CdTe windowless solar cells by Kim, D.U., Hangarter, C.M., Debnath, R., Ha, J.Y., Beauchamp, C.R., Widstrom, M.D., Guyer, J.E., Nguyen, N., Yoo, B.Y., Josell, D.

“…This paper details the fabrication and properties of CdSe/CdTe thin film photovoltaic devices with a dual back contact geometry. Device fabrication involves…”
Get full text

Infrared emission imaging as a tool for characterization of hydrogen storage materials by Oguchi, H., Heilweil, E.J., Josell, D., Bendersky, L.A.

“…Combinatorial thin films provide an opportunity for studying a variety of properties over a wide range of compositions and microstructures on a single…”
Get full text

Orientation and magnetic properties of FePt and CoPt films grown on MgO(1 1 0) single-crystal substrate by electron-beam coevaporation by Yu, Minghui, Ohguchi, H., Zambano, A., Takeuchi, I., Liu, J.P., Josell, D., Bendersky, L.A.

“…We have studied the orientation and magnetic properties of FePt and CoPt films deposited by electron-beam co-evaporation on MgO(1 1 0) single-crystal…”
Get full text

Hillock and whisker growth on Sn and SnCu electrodeposits on a substrate not forming interfacial intermetallic compounds by WILLIAMS, M. E, MOON, K.-W, BOETTINGER, W. J, JOSELL, D, DEAL, A. D

“…Intermetallic compound (IMC) formation at the interface between the tin (Sn) plating and the copper (Cu) substrate of electronic components has been thought to…”
Get full text

Interceptive Orthodontic Treatment may be Effective in Reducing the Severity of Developing Malocclusion by Josell, Stuart D., DMD, MDent Sc

“…Article Title and Bibliographic Information Dental effects of interceptive orthodontic treatment in a Medicaid population: interim results from a randomized…”
Get full text

The formation of f.c.c. titanium in titanium-aluminum multilayers by Van Heerden, D., Josell, D., Shechtman, D.

“…The Ti layers in AlTi multilayers are shown to transform from hexagonal close packed in the as-deposited multilayers to face centered cubic on ion milling in…”
Get full text

Determination of the CoTi congruent melting point and thermodynamic reassessment of the Co-Ti system by DAVYDOV, A. V, KATTNER, U. R, JOSELL, D, BLENDELL, J. E, WATERSTRAT, R. M, SHAPIRO, A. J, BOETTINGER, W. J

“…New experimental results and a thermodynamic re-evaluation of the Co-Ti system are presented. Using differential thermal analysis (DTA) and a visual…”
Get full text

Tensile testing low density multilayers: Aluminum/titanium by Josell, D., van Heerden, D., Read, D., Bonevich, J., Shechtman, D.

“…Yield stresses, ultimate tensile strengths, and specific strengths of aluminum/titanium multilayer thin films are determined from the results of uniaxial…”
Get full text

Simulating Cu electrodeposition in high aspect ratio features: Effect of control mode and uncompensated resistance in S-NDR systems by Braun, T.M., Josell, D., Moffat, T.P.

“…Void-free Cu electrodeposition in high aspect ratio features requires, at a minimum, an additive package containing micromolar halide and polyether that…”
Get full text

Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers by Bonevich, J., van Heerden, D., Josell, D.

“…The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address…”
Get full text

Comment on “Dimensionally Induced Structural Transformations in Titanium-Aluminum Multilayers” by Bonevich, J., Josell, D.

Get full text

A new method for tensile testing of thin films by Ruud, J.A., Josell, D., Spaepen, F., Greer, A.L.

Get full text

Combinatorial investigation of structural quality of Au/Ni contacts on GaN by Davydov, A.V., Bendersky, L.A., Boettinger, W.J., Josell, D., Vaudin, M.D., Chang, K.-S., Takeuchi, I.

“…A combinatorial library of Au/Ni metallizations on GaN was microstructurally characterized by X-ray diffraction (XRD), electron back-scattered diffraction…”
Get full text

Measuring the interface stress: Silver/nickel interfaces by Josell, D., Bonevich, J. E., Shao, I., Cammarata, R. C.

“…Interface stress is a surface thermodynamics quantity associated with the reversible work of elastically straining an internal solid interface. In a…”
Get full text

Habits affecting dental and maxillofacial growth and development by Josell, S D

“…In concluding this discussion, it is apparent that altered oral function or rest position may have a significant influence on the developing orofacial region…”
Get more information

Thermal transport through thin films: Mirage technique measurements on aluminum/titanium multilayers by Gonzalez, E. J., Bonevich, J. E., Stafford, G. R., White, G., Josell, D.

“…Thermal transport properties of multilayer thin films both normal and parallel to the layers were measured. Al/Ti multilayer films 3 μm thick, with individual…”
Get full text