CTEAS: a graphical-user-interface-based program to determine thermal expansion from high-temperature X-ray diffraction
The coefficient of thermal expansion analysis suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second‐rank thermal expansion tensor using hkl value...
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Published in: | Journal of applied crystallography Vol. 46; no. 2; pp. 550 - 553 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
Published: |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01-04-2013
Blackwell Publishing Ltd |
Subjects: | |
Online Access: | Get full text |
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Summary: | The coefficient of thermal expansion analysis suite (CTEAS) has been developed to calculate and visualize thermal expansion properties of crystalline materials in three dimensions. The software can be used to determine the independent terms of the second‐rank thermal expansion tensor using hkl values, corresponding dhkl listings and lattice constants obtained from powder X‐ray diffraction patterns collected at different temperatures. Using CTEAS, a researcher can also visualize the anisotropy of this essential material property in three dimensions. In‐depth understanding of the thermal expansion of crystalline materials can be a useful tool in understanding the dependence of the thermal properties of materials on temperature when correlated with the crystal structure. |
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Bibliography: | istex:FD042C86E8D7975FDDE8C2968C11F842E64A21D7 ark:/67375/WNG-F427B2GQ-9 ArticleID:JCRTO5030 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 BNL-103100-2013-JA DE-AC02-98CH10886 USDOE SC OFFICE OF SCIENCE (SC) |
ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S0021889813002938 |