Search Results - "Jeyasingh, R G D"

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  1. 1

    An Ultra-Low Reset Current Cross-Point Phase Change Memory With Carbon Nanotube Electrodes by Jiale Liang, Jeyasingh, R. G. D., Hong-Yu Chen, Wong, H. P.

    Published in IEEE transactions on electron devices (01-04-2012)
    “…Solid-state memory technology is undergoing a renaissance of new materials and novel device concepts for higher scalability as the mainstream technology, i.e.,…”
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    Journal Article
  2. 2

    Low-Energy Robust Neuromorphic Computation Using Synaptic Devices by Kuzum, D., Jeyasingh, R. G. D., Shimeng Yu, Wong, H.-S P.

    Published in IEEE transactions on electron devices (01-12-2012)
    “…Brain-inspired computing is an emerging field, which aims to reach brainlike performance in real-time processing of sensory data. The challenges that need to…”
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    Journal Article
  3. 3

    Adaptive Keeper Design for Dynamic Logic Circuits Using Rate Sensing Technique by Jeyasingh, R G D, Bhat, N, Amrutur, B

    “…The increasing variability in device leakage has made the design of keepers for wide OR structures a challenging task. The conventional feedback keepers (CONV)…”
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    Journal Article
  4. 4

    Electrothermal Modeling and Design Strategies for Multibit Phase-Change Memory by Zijian Li, Jeyasingh, R. G. D., Jaeho Lee, Asheghi, M., Wong, H.-S Philip, Goodson, K. E.

    Published in IEEE transactions on electron devices (01-12-2012)
    “…Electrothermal transport and crystallization dynamics govern the speed and bit stability of multibit phase-change memory (PCM). This paper develops a transient…”
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    Journal Article
  5. 5

    Investigation of Trap Spacing for the Amorphous State of Phase-Change Memory Devices by Jeyasingh, R. G. D., Kuzum, D., Wong, H-S P.

    Published in IEEE transactions on electron devices (01-12-2011)
    “…The subthreshold conduction in the amorphous state of the phase-change material is dominated by the hopping of the carriers through the trap states or…”
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    Journal Article
  6. 6

    One-Dimensional Thickness Scaling Study of Phase Change Material (\hbox\hbox\hbox) Using a Pseudo 3-Terminal Device by SangBum Kim, Byoung-Jae Bae, Yuan Zhang, Jeyasingh, R G D, Youngkuk Kim, In-Gyu Baek, Soonoh Park, Seok-Woo Nam, Wong, H.-S P

    Published in IEEE transactions on electron devices (01-05-2011)
    “…To address the scalability of phase change memory (PCM), we study a 1-D thickness scaling effect on threshold switching voltage ( V th ), V th drift, high…”
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    Journal Article
  7. 7

    Grain Boundaries, Phase Impurities, and Anisotropic Thermal Conduction in Phase-Change Memory by Zijian Li, Jaeho Lee, Reifenberg, J. P., Asheghi, M., Jeyasingh, R. G. D., Wong, H. P., Goodson, K. E.

    Published in IEEE electron device letters (01-07-2011)
    “…Thermal conduction strongly influences the programming energy and speed in phase-change-memory devices. The thermal conductivity of the crystalline phase of Ge…”
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    Journal Article
  8. 8

    First demonstration of phase change memory device using solution processed GeTe nanoparticles by Jeyasingh, R. G. D., Caldwell, M. A., Milliron, D. J., Wong, H.-S P.

    “…We present the first demonstration of a functional Phase Change Memory (PCM) device fabricated using solution processed GeTe phase change nanoparticle. The…”
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    Conference Proceeding
  9. 9

    Scaling behavior of PCM cells in off-state conduction by Chen, J., Jeyasingh, R. G. D., Gao, B., Lu, Y., Deng, Y. X., Liu, X. Y., Kang, J. F., Wong, H.-S P.

    “…A novel phase change memory (PCM) cell with Additional Top Electrode (ATE) is introduced to investigate the scaling behavior of the off-state with the…”
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    Conference Proceeding
  10. 10

    Direct Measurement of Trap Spacing in Phase Change Memory Cells Using ATE Devices by Jeyasingh, R G D, Kuzum, D, Wong, H.-S P

    “…The electrical conduction in the amorphous state of the phase change material is through the localized states. The density of these trap states or the trap…”
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    Conference Proceeding
  11. 11

    Recent progress of phase change memory (PCM) and resistive switching random access memory (RRAM) by Wong, H.-S P, SangBum Kim, Byoungil Lee, Caldwell, M A, Jiale Liang, Yi Wu, Jeyasingh, R G D, Shimeng Yu

    “…Conventional memories such as SRAM, DRAM, and FLASH have set a very high cost/performance standard. Yet, recent advances in new materials, device technologies…”
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    Conference Proceeding