Search Results - "Jeyasingh, R G D"
-
1
An Ultra-Low Reset Current Cross-Point Phase Change Memory With Carbon Nanotube Electrodes
Published in IEEE transactions on electron devices (01-04-2012)“…Solid-state memory technology is undergoing a renaissance of new materials and novel device concepts for higher scalability as the mainstream technology, i.e.,…”
Get full text
Journal Article -
2
Low-Energy Robust Neuromorphic Computation Using Synaptic Devices
Published in IEEE transactions on electron devices (01-12-2012)“…Brain-inspired computing is an emerging field, which aims to reach brainlike performance in real-time processing of sensory data. The challenges that need to…”
Get full text
Journal Article -
3
Adaptive Keeper Design for Dynamic Logic Circuits Using Rate Sensing Technique
Published in IEEE transactions on very large scale integration (VLSI) systems (01-02-2011)“…The increasing variability in device leakage has made the design of keepers for wide OR structures a challenging task. The conventional feedback keepers (CONV)…”
Get full text
Journal Article -
4
Electrothermal Modeling and Design Strategies for Multibit Phase-Change Memory
Published in IEEE transactions on electron devices (01-12-2012)“…Electrothermal transport and crystallization dynamics govern the speed and bit stability of multibit phase-change memory (PCM). This paper develops a transient…”
Get full text
Journal Article -
5
Investigation of Trap Spacing for the Amorphous State of Phase-Change Memory Devices
Published in IEEE transactions on electron devices (01-12-2011)“…The subthreshold conduction in the amorphous state of the phase-change material is dominated by the hopping of the carriers through the trap states or…”
Get full text
Journal Article -
6
One-Dimensional Thickness Scaling Study of Phase Change Material (\hbox\hbox\hbox) Using a Pseudo 3-Terminal Device
Published in IEEE transactions on electron devices (01-05-2011)“…To address the scalability of phase change memory (PCM), we study a 1-D thickness scaling effect on threshold switching voltage ( V th ), V th drift, high…”
Get full text
Journal Article -
7
Grain Boundaries, Phase Impurities, and Anisotropic Thermal Conduction in Phase-Change Memory
Published in IEEE electron device letters (01-07-2011)“…Thermal conduction strongly influences the programming energy and speed in phase-change-memory devices. The thermal conductivity of the crystalline phase of Ge…”
Get full text
Journal Article -
8
First demonstration of phase change memory device using solution processed GeTe nanoparticles
Published in 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01-09-2011)“…We present the first demonstration of a functional Phase Change Memory (PCM) device fabricated using solution processed GeTe phase change nanoparticle. The…”
Get full text
Conference Proceeding -
9
Scaling behavior of PCM cells in off-state conduction
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01-04-2012)“…A novel phase change memory (PCM) cell with Additional Top Electrode (ATE) is introduced to investigate the scaling behavior of the off-state with the…”
Get full text
Conference Proceeding -
10
Direct Measurement of Trap Spacing in Phase Change Memory Cells Using ATE Devices
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01-05-2011)“…The electrical conduction in the amorphous state of the phase change material is through the localized states. The density of these trap states or the trap…”
Get full text
Conference Proceeding -
11
Recent progress of phase change memory (PCM) and resistive switching random access memory (RRAM)
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01-11-2010)“…Conventional memories such as SRAM, DRAM, and FLASH have set a very high cost/performance standard. Yet, recent advances in new materials, device technologies…”
Get full text
Conference Proceeding