Search Results - "Jevtic, Milan"
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Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements
Published in Sensors and actuators. A. Physical. (15-06-2008)“…Low frequency noise measurements can be used as a tool in diagnostics of silicon diaphragm-based piezoresistive pressure sensors after the sensor encapsulation…”
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The voltage pulse degraded Ti/4H–SiC Schottky diodes studied with I– V and low frequency noise measurements
Published in Diamond and related materials (2007)“…In this paper we discuss the results obtained after ESD voltage was stress applied to 4H–Silicon Carbide (4H–SiC) Schottky diodes. The Human Body Model (HBM)…”
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The interpretation of the reasons for encounter 'cough' and 'sadness' in four international family medicine populations
Published in Informatics in primary care (2012)“…This is a study of the relationships between common reasons for encounter (RfEs) and common diagnoses (episode titles) within episodes of care (EoCs) in family…”
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Study of the electrical cycling stressed large area Schottky diodes using I– V and noise measurements
Published in Microelectronics and reliability (2007)“…Large area commercial Al/n-Si Schottky diodes were subjected to an electrical cycling stress in order to cause degradation of diodes with local contact…”
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Revisiting the concept of 'chronic disease' from the perspective of the episode of care model. Does the ratio of incidence to prevalence rate help us to define a problem as chronic?
Published in Informatics in primary care (2012)“…This is a study of the epidemiology of acute and chronic episodes of care (EoCs) in the Transition Project in three countries. We studied the duration of EoCs…”
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THE EFFECTS OF DIGITAL NATIVES' EXPECTATIONS OF TECH HOTEL SERVICE QUALITY ON CUSTOMER SATISFACTION
Published in International Journal for Quality Research (01-01-2024)“…This paper aims to investigate the significance of the impact of customer expectations of the use of digital technology services by hotels on their level of…”
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On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering
Published in Materials science in semiconductor processing (01-08-2007)“…Silicon–germanium films, doped with boron, were deposited on oxidised silicon substrates by RF magnetron sputtering. The post-deposition dopant activation and…”
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Low frequency noise as a tool to study optocouplers with phototransistors
Published in Microelectronics and reliability (01-07-2004)“…An approach to analyze the optocouplers with phototransistors by low frequency noise measurements is presented in this paper. The analysis is based on the…”
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An international comparative family medicine study of the Transition Project data from the Netherlands, Malta and Serbia. Is family medicine an international discipline? Comparing incidence and prevalence rates of reasons for encounter and diagnostic titles of episodes of care across populations
Published in Family practice (01-06-2012)“…This is a study of the epidemiology of family medicine (FM) in three practice populations from the Netherlands, Malta and Serbia. Incidence and prevalence…”
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An international comparative family medicine study of the Transition Project data from the Netherlands, Malta and Serbia. Is family medicine an international discipline? Comparing diagnostic odds ratios across populations
Published in Family practice (01-06-2012)“…This is an international study of the epidemiology of family medicine (FM) in three practice populations from the Netherlands, Malta and Serbia. Diagnostic…”
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An international comparative family medicine study of the Transition Project data from the Netherlands, Malta, Japan and Serbia. An analysis of diagnostic odds ratios aggregated across age bands, years of observation and individual practices
Published in Family practice (01-06-2012)“…This is a study of the process of diagnosis in family medicine (FM) in four practice populations from the Netherlands, Malta, Serbia and Japan. Diagnostic odds…”
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Noise and structural properties of reactively sputtered RuO2thin films
Published in Thin solid films (2006)Get full text
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Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements
Published in CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005 (2005)“…Silicon Carbide (SiC) Schottky diodes were stressed with high voltage pulses of 3 to 6KV in an ESD experiment. Diode degradations were studied by I-V and low…”
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Schottky diode in HV CMOS smart power technology and its demonstration for charge pump application
Published in CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005 (2005)“…In this paper we analyze a possibility of manufacturing and implementation of Schottky diodes in a HV CMOS smart power technology. With small layout…”
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Conference Proceeding -
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An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator
Published in Microelectronics (01-11-2002)“…In this paper we suggest an alternative method for the analysis of low frequency noise of transistors based on measurements of phase noise of a test…”
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Noise and structural properties of reactively sputtered RuO 2 thin films
Published in Thin solid films (2006)“…Ruthenium dioxide thin films were reactively rf sputtered on SiO 2/Si substrates and annealed in the temperature range from 150 to 500 °C. The structural and…”
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Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell
Published in IEEE transactions on components and packaging technologies (01-03-1999)“…In this paper, it is assumed that low-frequency noise source in thick-film resistors are fluctuations of the trap occupations by electrons, tunneling through…”
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Noise and structural properties of reactively sputtered RuO2 thin films
Published in Thin solid films (21-02-2006)“…Ruthenium dioxide thin films were reactively rf sputtered on SiO2/Si substrates and annealed in the temperature range from 150 to 500 DDGC. The structural and…”
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Modelling of Dual-Gate MOSFET 1/f Noise in Linear Region
Published in EUROCON 2007 - The International Conference on "Computer as a Tool" (01-09-2007)“…This paper presents experimental and numerical results for the dual-gate MOSFET (DGMOSFET) normalized 1/f noise parameter B/I D 2 in linear working region. In…”
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Conference Proceeding