Search Results - "Jevtic, Milan"

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  1. 1

    Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements by Jevtic, Milan M, Smiljanic, Miloljub A

    Published in Sensors and actuators. A. Physical. (15-06-2008)
    “…Low frequency noise measurements can be used as a tool in diagnostics of silicon diaphragm-based piezoresistive pressure sensors after the sensor encapsulation…”
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    Journal Article
  2. 2

    The voltage pulse degraded Ti/4H–SiC Schottky diodes studied with I– V and low frequency noise measurements by Hadzi-Vukovic, Jovan M, Jevtic, Milan M

    Published in Diamond and related materials (2007)
    “…In this paper we discuss the results obtained after ESD voltage was stress applied to 4H–Silicon Carbide (4H–SiC) Schottky diodes. The Human Body Model (HBM)…”
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    Journal Article
  3. 3

    The interpretation of the reasons for encounter 'cough' and 'sadness' in four international family medicine populations by Soler, Jean K, Okkes, Inge, Oskam, Sibo, Van Boven, Kees, Zivotic, Predrag, Jevtic, Milan, Dobbs, Frank, Lamberts, Henk

    Published in Informatics in primary care (2012)
    “…This is a study of the relationships between common reasons for encounter (RfEs) and common diagnoses (episode titles) within episodes of care (EoCs) in family…”
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    Journal Article
  4. 4

    Study of the electrical cycling stressed large area Schottky diodes using I– V and noise measurements by JEVTIC, Milan M, HADZI-VUKOVIC, Jovan M

    Published in Microelectronics and reliability (2007)
    “…Large area commercial Al/n-Si Schottky diodes were subjected to an electrical cycling stress in order to cause degradation of diodes with local contact…”
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    Journal Article
  5. 5

    Revisiting the concept of 'chronic disease' from the perspective of the episode of care model. Does the ratio of incidence to prevalence rate help us to define a problem as chronic? by Soler, Jean K, Okkes, Inge, Oskam, Sibo, Van Boven, Kees, Zivotic, Predrag, Jevtic, Milan, Dobbs, Frank, Lamberts, Henk

    Published in Informatics in primary care (2012)
    “…This is a study of the epidemiology of acute and chronic episodes of care (EoCs) in the Transition Project in three countries. We studied the duration of EoCs…”
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    Journal Article
  6. 6

    THE EFFECTS OF DIGITAL NATIVES' EXPECTATIONS OF TECH HOTEL SERVICE QUALITY ON CUSTOMER SATISFACTION by Jevtic, Boris, Beslac, Milan, Janjusic, Dragan, Jevtic, Milan

    Published in International Journal for Quality Research (01-01-2024)
    “…This paper aims to investigate the significance of the impact of customer expectations of the use of digital technology services by hotels on their level of…”
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    Journal Article
  7. 7

    On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering by Jelenkovic, Emil V., Jevtic, Milan M., Tong, K.Y., Pang, G.K.H., Cheung, W.Y., Jha, Shrawan K.

    “…Silicon–germanium films, doped with boron, were deposited on oxidised silicon substrates by RF magnetron sputtering. The post-deposition dopant activation and…”
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    Journal Article
  8. 8

    Low frequency noise as a tool to study optocouplers with phototransistors by Jevtić, Milan M

    Published in Microelectronics and reliability (01-07-2004)
    “…An approach to analyze the optocouplers with phototransistors by low frequency noise measurements is presented in this paper. The analysis is based on the…”
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    Journal Article
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    Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements by Jevtic, M., Hadzi-Vukovic, J., Dinu, D.

    “…Silicon Carbide (SiC) Schottky diodes were stressed with high voltage pulses of 3 to 6KV in an ESD experiment. Diode degradations were studied by I-V and low…”
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    Conference Proceeding
  14. 14
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    Schottky diode in HV CMOS smart power technology and its demonstration for charge pump application by Hadzi-Vukovic, J., Jevtic, M., Rothleitner, H., Del Croce, P., Ladurner, M., Wachter, F.

    “…In this paper we analyze a possibility of manufacturing and implementation of Schottky diodes in a HV CMOS smart power technology. With small layout…”
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    Conference Proceeding
  16. 16

    An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator by Jevtić, Milan M, Hadži-Vuković, Jovan, Ramović, Rifat

    Published in Microelectronics (01-11-2002)
    “…In this paper we suggest an alternative method for the analysis of low frequency noise of transistors based on measurements of phase noise of a test…”
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    Journal Article
  17. 17

    Noise and structural properties of reactively sputtered RuO 2 thin films by Jevtić, Milan M., Jelenković, Emil V., Tong, K.Y., Pang, G.K.H.

    Published in Thin solid films (2006)
    “…Ruthenium dioxide thin films were reactively rf sputtered on SiO 2/Si substrates and annealed in the temperature range from 150 to 500 °C. The structural and…”
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    Journal Article
  18. 18

    Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell by Jevtic, M.M., Stanimirovic, Z., Mrak, I.

    “…In this paper, it is assumed that low-frequency noise source in thick-film resistors are fluctuations of the trap occupations by electrons, tunneling through…”
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    Journal Article
  19. 19

    Noise and structural properties of reactively sputtered RuO2 thin films by Jevtić, Milan M., Jelenković, Emil V., Tong, K.Y., Pang, G.K.H.

    Published in Thin solid films (21-02-2006)
    “…Ruthenium dioxide thin films were reactively rf sputtered on SiO2/Si substrates and annealed in the temperature range from 150 to 500 DDGC. The structural and…”
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    Journal Article
  20. 20

    Modelling of Dual-Gate MOSFET 1/f Noise in Linear Region by Videnovic-Misic, M., Jevtic, M.M.

    “…This paper presents experimental and numerical results for the dual-gate MOSFET (DGMOSFET) normalized 1/f noise parameter B/I D 2 in linear working region. In…”
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    Conference Proceeding