Search Results - "Jentzsch, Eyck"

Cross-Level Processor Verification via Endless Randomized Instruction Stream Generation with Coverage-guided Aging by Bruns, Niklas, Herdt, Vladimir, Jentzsch, Eyck, Drechsler, Rolf

“…We propose a novel cross-level verification approach for processor verification at the Register-Transfer Level (RTL). The foundation is a randomized…”
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A Scalable RISC-V Hardware Platform for Intelligent Sensor Processing by Bernardo, Paul Palomero, Schmid, Patrick, Bringmann, Oliver, Iftekhar, Mohammed, Sadiye, Babak, Mueller, Wolfgang, Koch, Andreas, Jentzsch, Eyck, Sauer, Axel, Feldner, Ingo, Ecker, Wolfgang

“…This paper presents a demonstrator chip for an industrial audio event detection application developed as part of the Scale4Edge project. The project aims at…”
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The Scale4Edge RISC-V Ecosystem by Ecker, Wolfgang, Adelt, Peer, Mueller, Wolfgang, Heckmann, Reinhold, Krstic, Milos, Herdt, Vladimir, Drechsler, Rolf, Angst, Gerhard, Wimmer, Ralf, Mauderer, Andreas, Stahl, Rafael, Emrich, Karsten, Mueller-Gritschneder, Daniel, Becker, Bernd, Scholl, Philipp, Jentzsch, Eyck, Schlamelcher, Jan, Gruttner, Kim, Bernardo, Paul Palomero, Bringmann, Oliver, Damian, Mihaela, Oppermann, Julian, Koch, Andreas, Bormann, Jorg, Partzsch, Johannes, Mayr, Christian, Kunz, Wolfgang

“…This paper introduces the project Scale4Edge. The project is focused on enabling an effective RISC-V ecosystem for optimization of edge applications. We…”
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Efficient Cross-Level Testing for Processor Verification: A RISC- V Case-Study by Herdt, Vladimir, Grosse, Daniel, Jentzsch, Eyck, Drechsler, Rolf

“…Extensive processor verification at the Register-Transfer Level (RTL) is crucial to avoid bugs. Therefore, simulation-based approaches are prevalent but they…”
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Bits, Flips and RISCs by Gerlin, Nicolas, Kaja, Endri, Vargas, Fabian, Lu, Li, Breitenreiter, Anselm, Chen, Junchao, Ulbricht, Markus, Gomez, Maribel, Tahiraga, Ares, Prebeck, Sebastian, Jentzsch, Eyck, Krstic, Milos, Ecker, Wolfgang

“…Electronic systems can be submitted to hostile environments leading to bit-flips or stuck-at faults and, ultimately, a system malfunction or failure. In…”
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Multi-agent Software Tool for Management of Design Process in Microelectronics by Gorodetsky, Vladimir, Karsaev, Oleg, Konushy, Victor, Matzke, Wolf-Ekkehard, Jentzsch, Eyck, Ermolayev, Vadim

“…The paper presents a software tool to support the management of design process in microelectronics. It is developed as a multi-agent prototype intended for…”
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