Search Results - "Jana, Sanjay K."

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  1. 1

    Effects of threading dislocations on drain current dispersion and slow transients in unpassivated AlGaN/GaN/Si heterostructure field-effect transistors by Ghosh, Saptarsi, Dinara, Syed Mukulika, Mukhopadhyay, Partha, Jana, Sanjay K., Bag, Ankush, Chakraborty, Apurba, Chang, Edward Yi, kabi, Sanjib, Biswas, Dhrubes

    Published in Applied physics letters (18-08-2014)
    “…Current transient analysis combined with response to pulsed bias drives have been used to explore the possibilities of threading dislocations affecting the…”
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    Journal Article
  2. 2

    An unified analytical model for design consideration of doped cubic and undoped hexagonal AlGaN/GaN MIS gate HEMTs by Ghosh, Saptarsi, Bag, Ankush, Jana, Sanjay K., Mukhopadhyay, Partha, Dinara, Syed Mukulika, Kabi, Sanjib, Biswas, Dhrubes

    Published in Solid-state electronics (01-06-2014)
    “…•A physics based analytical model for GaN/AlGaN MISHEMTs is proposed.•The model is applicable for all of the cubic, Ga-polar, and N-polar topologies.•A…”
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    Journal Article
  3. 3

    Evolution and analysis of nitride surface and interfaces by statistical techniques: A correlation with RHEED through kinetic roughening by Bag, Ankush, Kumar, Rahul, Mukhopadhyay, Partha, Mahata, Mihir K., Chakraborty, Apurba, Ghosh, Saptarsi, Jana, Sanjay K., Biswas, Dhrubes

    Published in Electronic materials letters (01-07-2015)
    “…In-situ RHEED and ex-situ AFM characterizations have been employed to investigate transformations of surface topography with the thickness of PAMBE grown AlGaN…”
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    Journal Article
  4. 4

    Reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure by Chakraborty, Apurba, Ghosh, Saptarsi, Mukhopadhyay, Partha, Jana, Sanjay K., Dinara, Syed Mukulika, Bag, Ankush, Mahata, Mihir K., Kumar, Rahul, Das, Subhashis, Das, Palash, Biswas, Dhrubes

    Published in Electronic materials letters (01-03-2016)
    “…The reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure is investigated by current-voltage measurement in temperature range from 298 K to…”
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    Journal Article
  5. 5