Search Results - "Jain, F. C."
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1
Ge-ZnSSe Spatial Wavefunction Switched (SWS) FETs to Implement Multibit SRAMs and Novel Quaternary Logic
Published in Journal of electronic materials (01-11-2013)“…This paper describes novel multibit static random-access memories (SRAMs) implemented using four-channel spatial wavefunction switched field-effect transistors…”
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Journal Article Conference Proceeding -
2
Novel Multistate Quantum Dot Gate FETs Using SiO2 and Lattice-Matched ZnS-ZnMgS-ZnS as Gate Insulators
Published in Journal of electronic materials (01-11-2013)“…Multistate behavior has been achieved in quantum dot gate field-effect transistor (QDGFET) configurations using either SiO x -cladded Si or GeO x -cladded Ge…”
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Journal Article Conference Proceeding -
3
Spatial Wavefunction-Switched (SWS) InGaAs FETs with II–VI Gate Insulators
Published in Journal of electronic materials (01-08-2011)“…This paper presents the implementation of a novel InGaAs field-effect transistor (FET), using a ZnSe-ZnS-ZnMgS-ZnS stacked gate insulator, in a spatial…”
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Journal Article Conference Proceeding -
4
Novel Quantum Dot Gate FETs and Nonvolatile Memories Using Lattice-Matched II–VI Gate Insulators
Published in Journal of electronic materials (01-08-2009)“…This paper presents the successful use of ZnS/ZnMgS and other II–VI layers (lattice-matched or pseudomorphic) as high- k gate dielectrics in the fabrication of…”
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Journal Article Conference Proceeding -
5
The role of H2O2 outer diffusion on the performance of implantable glucose sensors
Published in Biosensors & bioelectronics (15-02-2009)“…The performance of an implantable glucose sensor is strongly dependent on the ability of their outer membrane to govern the diffusion of the various…”
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6
Fabrication and Simulation of an Indium Gallium Arsenide Quantum-Dot-Gate Field-Effect Transistor (QDG-FET) with ZnMgS as a Tunnel Gate Insulator
Published in Journal of electronic materials (01-11-2013)“…An indium gallium arsenide quantum-dot-gate field-effect transistor using Zn 0.95 Mg 0.05 S as the gate insulator is presented in this paper, showing three…”
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Journal Article Conference Proceeding -
7
S-Graded Buffer Layers for Lattice-Mismatched Heteroepitaxial Devices
Published in Journal of electronic materials (01-12-2011)“…We have conducted a theoretical study of the equilibrium strain and misfit dislocation density profiles for “S-graded” buffer layers of In x Ga 1− x As on GaAs…”
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Journal Article -
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Indium Gallium Arsenide Quantum Dot Gate Field-Effect Transistor Using II–VI Tunnel Insulators Showing Three-State Behavior
Published in Journal of electronic materials (01-10-2012)“…This paper presents an indium gallium arsenide (InGaAs) quantum dot gate field-effect transistor (QDG-FET) that exhibits an intermediate “ i ” state in…”
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Journal Article Conference Proceeding -
9
Overshoot Graded Layers for Mismatched Heteroepitaxial Devices
Published in Journal of electronic materials (01-08-2008)“…We have studied the use of overshoot graded layers for the control of the dislocation density in mismatched heteroepitaxial layers. Graded ZnS y Se 1– y…”
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10
Nonvolatile Memory Effect in Indium Gallium Arsenide-Based Metal–Oxide–Semiconductor Devices Using II–VI Tunnel Insulators
Published in Journal of electronic materials (01-08-2011)“…This paper reports the successful use of ZnSe/ZnS/ZnMgS/ZnS/ZnSe as a gate insulator stack for an InGaAs-based metal–oxide–semiconductor (MOS) device, and…”
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Journal Article Conference Proceeding -
11
Critical Layer Thickness in Exponentially Graded Heteroepitaxial Layers
Published in Journal of electronic materials (01-08-2010)“…Exponentially graded semiconductor layers are of interest for use as buffers in heteroepitaxial devices because of their tapered dislocation density and strain…”
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12
A quantitative model for the interpretation of RAV (rocking curve azimuthal variation) results from heteroepitaxial semiconductor layers
Published in Journal of crystal growth (15-03-2010)“…Here we present a new quantitative model for the interpretation of the asymmetric broadening of the full width at half maximum (FWHM) of X-ray rocking curves…”
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13
An Investigation of Quantum Dot Super Lattice Use in Nonvolatile Memory and Transistors
Published in Journal of electronic materials (01-02-2018)“…Site-specific self-assembled colloidal quantum dots (QDs) will deposit in two layers only on p -type substrate to form a QD superlattice (QDSL). The QDSL…”
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14
Elastic strains in heteroepitaxial ZnSe1-xTex on InGaAs/InP (001)
Published in Journal of electronic materials (01-06-2006)“…Here we report on the elastic strains in ZnSe1-xTex (x < 0.9) epitaxial layers grown using photo-assisted metalorganic vapor phase epitaxy on…”
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Conference Proceeding Journal Article -
15
Effect of Epilayer Tilt on Dynamical X-ray Diffraction from Uniform Heterostructures with Asymmetric Dislocation Densities
Published in Journal of electronic materials (01-11-2013)“…In this work we extend the dynamical theory of Bragg x-ray diffraction to account for a tilted, asymmetrically defected, uniform-composition epitaxial layer…”
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Journal Article Conference Proceeding -
16
Relaxation Dynamics and Threading Dislocations in ZnSe and ZnSySe1−y/GaAs (001) Heterostructures
Published in Journal of electronic materials (01-09-2013)“…The design of lattice-mismatched semiconductor devices requires a predictive model for strains and threading dislocation densities. Previous work enabled…”
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Journal Article -
17
Plastic Flow and Dislocation Compensation in ZnSySe1−y/GaAs (001) Heterostructures
Published in Journal of electronic materials (01-11-2012)“…An important goal of lattice-mismatched semiconductor device design is control of threading dislocation densities, which are of particular importance for…”
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18
Electrical properties of oxidized polycrystalline silicon as a gate insulator for n-type 4H-SiC MOS devices
Published in Solid-state electronics (01-12-2005)“…MOS capacitors were produced on n-type 4H-SiC using oxidized polycrystalline silicon (polyoxide). The polyoxide samples grown by dry oxidation without an…”
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Comparison of X-ray diffraction methods for determination of the critical layer thickness for dislocation multiplication
Published in Journal of electronic materials (01-05-1999)“…We present a comparison of x-ray diffraction methods for the determination of the critical layer thickness for dislocation multiplication in mismatched…”
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20
X-ray characterization of dislocation density asymmetries in heteroepitaxial semiconductors
Published in Applied physics letters (19-05-2008)“…We demonstrate an x-ray rocking curve method which allows detection of an asymmetry in the dislocation densities in an heteroepitaxial (001) zinc blende…”
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