Search Results - "Jain, F. C."

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  1. 1

    Ge-ZnSSe Spatial Wavefunction Switched (SWS) FETs to Implement Multibit SRAMs and Novel Quaternary Logic by Gogna, P., Suarez, E., Lingalugari, M., Chandy, J., Heller, E., Hasaneen, E.-S., Jain, F.-C.

    Published in Journal of electronic materials (01-11-2013)
    “…This paper describes novel multibit static random-access memories (SRAMs) implemented using four-channel spatial wavefunction switched field-effect transistors…”
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    Journal Article Conference Proceeding
  2. 2

    Novel Multistate Quantum Dot Gate FETs Using SiO2 and Lattice-Matched ZnS-ZnMgS-ZnS as Gate Insulators by Lingalugari, M., Baskar, K., Chan, P.-Y., Dufilie, P., Suarez, E., Chandy, J., Heller, E., Jain, F. C.

    Published in Journal of electronic materials (01-11-2013)
    “…Multistate behavior has been achieved in quantum dot gate field-effect transistor (QDGFET) configurations using either SiO x -cladded Si or GeO x -cladded Ge…”
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    Journal Article Conference Proceeding
  3. 3

    Spatial Wavefunction-Switched (SWS) InGaAs FETs with II–VI Gate Insulators by Jain, F. C., Miller, B., Suarez, E., Chan, P.-Y., Karmakar, S., Al-Amoody, F., Gogna, M., Chandy, J., Heller, E.

    Published in Journal of electronic materials (01-08-2011)
    “…This paper presents the implementation of a novel InGaAs field-effect transistor (FET), using a ZnSe-ZnS-ZnMgS-ZnS stacked gate insulator, in a spatial…”
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    Journal Article Conference Proceeding
  4. 4

    Novel Quantum Dot Gate FETs and Nonvolatile Memories Using Lattice-Matched II–VI Gate Insulators by Jain, F. C., Suarez, E., Gogna, M., Alamoody, F., Butkiewicus, D., Hohner, R., Liaskas, T., Karmakar, S., Chan, P.-Y., Miller, B., Chandy, J., Heller, E.

    Published in Journal of electronic materials (01-08-2009)
    “…This paper presents the successful use of ZnS/ZnMgS and other II–VI layers (lattice-matched or pseudomorphic) as high- k gate dielectrics in the fabrication of…”
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    Journal Article Conference Proceeding
  5. 5

    The role of H2O2 outer diffusion on the performance of implantable glucose sensors by VADDIRAJU, S, BURGESS, D. J, JAIN, F. C, PAPADIMITRAKOPOULOS, F

    Published in Biosensors & bioelectronics (15-02-2009)
    “…The performance of an implantable glucose sensor is strongly dependent on the ability of their outer membrane to govern the diffusion of the various…”
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    Journal Article
  6. 6

    Fabrication and Simulation of an Indium Gallium Arsenide Quantum-Dot-Gate Field-Effect Transistor (QDG-FET) with ZnMgS as a Tunnel Gate Insulator by Chan, P.-Y., Gogna, M., Suarez, E., Al-Amoody, F., Karmakar, S., Miller, B. I., Heller, E. K., Ayers, J. E., Jain, F. C.

    Published in Journal of electronic materials (01-11-2013)
    “…An indium gallium arsenide quantum-dot-gate field-effect transistor using Zn 0.95 Mg 0.05 S as the gate insulator is presented in this paper, showing three…”
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    Journal Article Conference Proceeding
  7. 7

    S-Graded Buffer Layers for Lattice-Mismatched Heteroepitaxial Devices by Xhurxhi, S., Obst, F., Sidoti, D., Bertoli, B., Kujofsa, T., Cheruku, S., Correa, J. P., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.

    Published in Journal of electronic materials (01-12-2011)
    “…We have conducted a theoretical study of the equilibrium strain and misfit dislocation density profiles for “S-graded” buffer layers of In x Ga 1− x As on GaAs…”
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    Journal Article
  8. 8

    Indium Gallium Arsenide Quantum Dot Gate Field-Effect Transistor Using II–VI Tunnel Insulators Showing Three-State Behavior by Chan, P.-Y., Suarez, E., Gogna, M., Miller, B.I., Heller, E.K., Ayers, J.E., Jain, F.C.

    Published in Journal of electronic materials (01-10-2012)
    “…This paper presents an indium gallium arsenide (InGaAs) quantum dot gate field-effect transistor (QDG-FET) that exhibits an intermediate “ i ” state in…”
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    Journal Article Conference Proceeding
  9. 9

    Overshoot Graded Layers for Mismatched Heteroepitaxial Devices by Ocampo, J.F., Suarez, E., Jain, F.C., Ayers, J.E.

    Published in Journal of electronic materials (01-08-2008)
    “…We have studied the use of overshoot graded layers for the control of the dislocation density in mismatched heteroepitaxial layers. Graded ZnS y Se 1– y…”
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    Journal Article
  10. 10

    Nonvolatile Memory Effect in Indium Gallium Arsenide-Based Metal–Oxide–Semiconductor Devices Using II–VI Tunnel Insulators by Chan, P.-Y., Gogna, M., Suarez, E., Karmakar, S., Al-Amoody, F., Miller, B. I., Jain, F. C.

    Published in Journal of electronic materials (01-08-2011)
    “…This paper reports the successful use of ZnSe/ZnS/ZnMgS/ZnS/ZnSe as a gate insulator stack for an InGaAs-based metal–oxide–semiconductor (MOS) device, and…”
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    Journal Article Conference Proceeding
  11. 11

    Critical Layer Thickness in Exponentially Graded Heteroepitaxial Layers by Sidoti, D., Xhurxhi, S., Kujofsa, T., Cheruku, S., Reed, J., Bertoli, B., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.

    Published in Journal of electronic materials (01-08-2010)
    “…Exponentially graded semiconductor layers are of interest for use as buffers in heteroepitaxial devices because of their tapered dislocation density and strain…”
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    Journal Article
  12. 12

    A quantitative model for the interpretation of RAV (rocking curve azimuthal variation) results from heteroepitaxial semiconductor layers by Yarlagadda, B., Rodriguez, A., Li, P., Velampati, R., Ocampo, J.F., Ayers, J.E., Jain, F.C.

    Published in Journal of crystal growth (15-03-2010)
    “…Here we present a new quantitative model for the interpretation of the asymmetric broadening of the full width at half maximum (FWHM) of X-ray rocking curves…”
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    Journal Article
  13. 13

    An Investigation of Quantum Dot Super Lattice Use in Nonvolatile Memory and Transistors by Mirdha, P., Parthasarathy, B., Kondo, J., Chan, P.-Y., Heller, E., Jain, F. C.

    Published in Journal of electronic materials (01-02-2018)
    “…Site-specific self-assembled colloidal quantum dots (QDs) will deposit in two layers only on p -type substrate to form a QD superlattice (QDSL). The QDSL…”
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    Journal Article
  14. 14

    Elastic strains in heteroepitaxial ZnSe1-xTex on InGaAs/InP (001) by YARLAGADDA, B, RODRIGUEZ, A, LI, P, MILLER, B. I, JAIN, F. C, AYERS, J. E

    Published in Journal of electronic materials (01-06-2006)
    “…Here we report on the elastic strains in ZnSe1-xTex (x < 0.9) epitaxial layers grown using photo-assisted metalorganic vapor phase epitaxy on…”
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    Conference Proceeding Journal Article
  15. 15

    Effect of Epilayer Tilt on Dynamical X-ray Diffraction from Uniform Heterostructures with Asymmetric Dislocation Densities by Rago, P.B., Jain, F.C., Ayers, J.E.

    Published in Journal of electronic materials (01-11-2013)
    “…In this work we extend the dynamical theory of Bragg x-ray diffraction to account for a tilted, asymmetrically defected, uniform-composition epitaxial layer…”
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    Journal Article Conference Proceeding
  16. 16

    Relaxation Dynamics and Threading Dislocations in ZnSe and ZnSySe1−y/GaAs (001) Heterostructures by Kujofsa, T., Cheruku, S., Yu, W., Outlaw, B., Xhurxhi, S., Obst, F., Sidoti, D., Bertoli, B., Rago, P. B., Suarez, E. N., Jain, F. C., Ayers, J. E.

    Published in Journal of electronic materials (01-09-2013)
    “…The design of lattice-mismatched semiconductor devices requires a predictive model for strains and threading dislocation densities. Previous work enabled…”
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    Journal Article
  17. 17

    Plastic Flow and Dislocation Compensation in ZnSySe1−y/GaAs (001) Heterostructures by Kujofsa, T., Yu, W., Cheruku, S., Outlaw, B., Xhurxhi, S., Obst, F., Sidoti, D., Bertoli, B., Rago, P.B., Suarez, E.N., Jain, F.C., Ayers, J.E.

    Published in Journal of electronic materials (01-11-2012)
    “…An important goal of lattice-mismatched semiconductor device design is control of threading dislocation densities, which are of particular importance for…”
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    Journal Article
  18. 18

    Electrical properties of oxidized polycrystalline silicon as a gate insulator for n-type 4H-SiC MOS devices by Li, P., Rodriguez, A., Yarlagadda, B., Velampati, R., Ayers, J.E., Jain, F.C.

    Published in Solid-state electronics (01-12-2005)
    “…MOS capacitors were produced on n-type 4H-SiC using oxidized polycrystalline silicon (polyoxide). The polyoxide samples grown by dry oxidation without an…”
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    Journal Article
  19. 19

    Comparison of X-ray diffraction methods for determination of the critical layer thickness for dislocation multiplication by ZHANG, X. G, LI, P, PARENT, D. W, ZHAO, G, AYERS, J. E, JAIN, F. C

    Published in Journal of electronic materials (01-05-1999)
    “…We present a comparison of x-ray diffraction methods for the determination of the critical layer thickness for dislocation multiplication in mismatched…”
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    Journal Article
  20. 20

    X-ray characterization of dislocation density asymmetries in heteroepitaxial semiconductors by Yarlagadda, B., Rodriguez, A., Li, P., Velampati, R., Ocampo, J. F., Suarez, E. N., Rago, P. B., Shah, D., Ayers, J. E., Jain, F. C.

    Published in Applied physics letters (19-05-2008)
    “…We demonstrate an x-ray rocking curve method which allows detection of an asymmetry in the dislocation densities in an heteroepitaxial (001) zinc blende…”
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    Journal Article