Search Results - "Jaeger, D.L."

Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography by Schmucker, S.W., Kumar, N., Abelson, J.R., Daly, S.R., Girolami, G.S., Bischof, M.R., Jaeger, D.L., Reidy, R.F., Gorman, B.P., Alexander, J., Ballard, J.B., Randall, J.N., Lyding, J.W.

“…Fabrication of ultrasharp probes is of interest for many applications, including scanning probe microscopy and electron-stimulated patterning of surfaces…”
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Electrostatic analysis of ungated field emission diodes by Jaeger, D.L., Hren, J.J., Zhirnov, V.V.

“…In this paper, comparisons between numerical and experimental approximations of electrostatic fields and field enhancement factors for ungated field emission…”
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Electrostatic simulations of diamond coated field emitter tips by Jaeger, D.L., Hren, J.J., Zhimov, V.V.

“…In this work, we examine the role that geometry and materials play in the distribution of electric fields in diode type diamond coated field emitter tips…”
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