Search Results - "Jacqueline, Sebastien"
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Silicon based system in package: Improvement of passive integration process to avoid TBMS failure
Published in Microelectronics and reliability (01-08-2008)“…Because of its large dimension and its high level of integration, the PICS (Passive Integration Connecting Substrate) developed by NXP prone to top to bottom…”
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Journal Article Conference Proceeding -
2
ESD sensitivity investigation on a wide range of high density embedded capacitors
Published in Microelectronics and reliability (01-08-2008)“…This work presents some results from electrical (TDDB, TLP, HBM and MM) measurements and ESD calculations/simulations on passive components such as capacitors…”
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Journal Article Conference Proceeding -
3
Outstanding reliability performances of Silicon capacitors for 200°C automotive applications
Published in 2020 IEEE 70th Electronic Components and Technology Conference (ECTC) (01-06-2020)“…In the race of miniaturization, manufacturers of automotive devices always require smaller electronic components. To save space and in the same time improve…”
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Conference Proceeding -
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Low profile integrated passive devices with 3D high density capacitors ideal for embedded and die stacking solutions
Published in 2012 4th Electronic System-Integration Technology Conference (01-09-2012)“…* The low profile IPDIA technology capability is limited by the density of the trench capacitor, more explicitly by the depth of the trench. * The 80μm Low…”
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Conference Proceeding