Search Results - "JUNG, Seungjae"

Refine Results
  1. 1

    Low temperature solution-processed graphene oxide/Pr0.7Ca0.3MnO3 based resistive-memory device by Kim, Insung, Siddik, Manzar, Shin, Jungho, Biju, Kuyyadi P, Jung, Seungjae, Hwang, Hyunsang

    Published in Applied physics letters (25-07-2011)
    “…We propose a graphene oxide (GO)/Pr0.7Ca0.3MnO3 (PCMO) based resistance random access memory (RRAM) device. Both active layers were prepared by a sol-gel…”
    Get full text
    Journal Article
  2. 2

    Improved Switching Variability and Stability by Activating a Single Conductive Filament by PARK, Jubong, JUNG, Seungjae, LEE, Wootae, KIM, Seonghyun, SHIN, Jungho, LEE, Daeseok, WOO, Jiyong, HWANG, Hyunsang

    Published in IEEE electron device letters (01-05-2012)
    “…We successfully fabricated a single-filament-activated resistive memory having limited conductive filament (CF) source through a novel fabrication technique…”
    Get full text
    Journal Article
  3. 3

    Improved Switching Uniformity and Speed in Filament-Type RRAM Using Lightning Rod Effect by PARK, Jubong, JO, Minseok, LEE, Joonmyoung, JUNG, Seungjae, KIM, Seonghyun, LEE, Wootae, SHIN, Jungho, HWANG, Hyunsang

    Published in IEEE electron device letters (01-01-2011)
    “…Improved switching uniformity and speed were demonstrated using a filament-type resistive memory. By using a gradual reset operation, a leaky high resistance,…”
    Get full text
    Journal Article
  4. 4
  5. 5

    Excellent State Stability of Cu/SiC/Pt Programmable Metallization Cells for Nonvolatile Memory Applications by LEE, Wootae, PARK, Jubong, SON, Myungwoo, LEE, Joonmyoung, JUNG, Seungjae, KIM, Seonghyun, PARK, Sangsu, SHIN, Jungho, HWANG, Hyunsang

    Published in IEEE electron device letters (01-05-2011)
    “…We have investigated silicon carbide (SiC) as a new programmable metallization cell material for nonvolatile memory applications. Our Cu/SiC/Pt devices showed…”
    Get full text
    Journal Article
  6. 6

    Operation Voltage Control in Complementary Resistive Switches Using Heterodevice by Daeseok Lee, Jubong Park, Seungjae Jung, Godeuni Choi, Joonmyoung Lee, Seonghyun Kim, Jiyong Woo, Siddik, M., Eujun Cha, Hyunsang Hwang

    Published in IEEE electron device letters (01-04-2012)
    “…For the high-density memory application of resistive random access memory (ReRAM), we study the complementary resistive switch (CRS) behavior of a HfO x -based…”
    Get full text
    Journal Article
  7. 7

    Excellent resistive switching in nitrogen-doped Ge2Sb2Te5 devices for field-programmable gate array configurations by Kim, Seonghyun, Park, Jubong, Jung, Seungjae, Lee, Wootae, Woo, Jiyong, Cho, Chunhum, Siddik, Manzar, Shin, Jungho, Park, Sangsu, Hun Lee, Byoung, Hwang, Hyunsang

    Published in Applied physics letters (07-11-2011)
    “…The nitrogen-doped Ge2Sb2Te5 (GST) programmable metallization cell is investigated to address the low switching voltage and need for a high resistance ratio,…”
    Get full text
    Journal Article
  8. 8

    Varistor-type bidirectional switch (JMAX>107A/cm2, selectivity∼104) for 3D bipolar resistive memory arrays by Wootae Lee, Jubong Park, Jungho Shin, Jiyong Woo, Seonghyun Kim, Choi, G., Seungjae Jung, Sangsu Park, Daeseok Lee, Euijun Cha, Hyung Dong Lee, Soo Gil Kim, Chung, S., Hyunsang Hwang

    Published in 2012 Symposium on VLSI Technology (VLSIT) (01-06-2012)
    “…We demonstrate a varistor-type bidirectional switch (VBS) with excellent selection property for future 3D bipolar resistive memory array. A highly non-linear…”
    Get full text
    Conference Proceeding
  9. 9

    Self-formed Schottky barrier induced selector-less RRAM for cross-point memory applications by Park, Sangsu, Jung, Seungjae, Siddik, Manzar, Jo, Minseok, Park, Jubong, Kim, Seonghyun, Lee, Wootae, Shin, Jungho, Lee, Daeseok, Choi, Godeuni, Woo, Jiyong, Cha, Euijun, Lee, Byoung Hun, Hwang, Hyunsang

    “…We propose a selector‐less Pr0.7Ca0.3MnO3 (PCMO) based resistive‐switching RAM (RRAM) for high‐density cross‐point memory array applications. First, we…”
    Get full text
    Journal Article
  10. 10

    Asymmetric MIMO System Design Based on OFDMA-TDD for Unmanned Ground Systems by Jisang You, Joonsung Choi, Seungjae Jung, Joonhyuk Kang

    “…The unmanned ground system (UGS) demands the high data rate and link reliability in battlefield and hazardous environment. Also, more radio resources should be…”
    Get full text
    Conference Proceeding
  11. 11

    New Set/Reset Scheme for Excellent Uniformity in Bipolar Resistive Memory by PARK, Jubong, JO, Minseok, JUNG, Seungjae, LEE, Joonmyoung, LEE, Wootae, KIM, Seonghyun, PARK, Sangsu, SHIN, Jungho, HWANG, Hyunsang

    Published in IEEE electron device letters (01-03-2011)
    “…We proposed a new set/reset operation scheme to improve the switching uniformity of filament-type resistive memory. By controlling the magnitude of the sweep…”
    Get full text
    Journal Article
  12. 12

    Improved switching uniformity of a carbon-based conductive-bridge type ReRAM by controlling the size of conducting filament by Park, Jubong, Jo, Minseok, Lee, Joonmyoung, Jung, Seungjae, Lee, Wootae, Kim, Seonghyun, Park, Sangsu, Shin, Jungho, Hwang, Hyunsang

    Published in Microelectronic engineering (01-06-2011)
    “…We investigated the resistive switching properties of a amorphous carbon-based ReRAM device. In order to minimize the fluctuations of switching parameters, we…”
    Get full text
    Journal Article
  13. 13

    In-Depth Study on the Effect of Active-Area Scale-Down of Solution-Processed \hbox by Jung, Seungjae, Kong, Jaemin, Kim, Tae-Wook, Song, Sunghoon, Lee, Kwanghee, Lee, Takhee, Hwang, Hyunsang, Jeon, Sanghun

    Published in IEEE electron device letters (01-06-2012)
    “…The effect of active-area scale-down and improved memory performance of solution-processed TiO_x were investigated using devices with active areas ranging from…”
    Get full text
    Journal Article
  14. 14

    The effect of KrF laser annealing within an ultrashort time on metal-alumina-nitride-oxide-silicon-type flash memory devices by Heo, Sungho, Chang, Man, Ju, Yongkyu, Jung, Seungjae, Hwang, Hyunsang

    Published in Applied physics letters (27-10-2008)
    “…The effect of laser annealing (LA) within an ultrashort time on metal-alumina-nitride-oxide-silicon-type flash memory device is investigated. Conventional…”
    Get full text
    Journal Article
  15. 15

    Effect of \hbox\hbox\hbox Thermal Barrier on Reset Operations in Filament-Type Resistive Memory by Wootae Lee, Siddik, M., Seungjae Jung, Jubong Park, Seonghyun Kim, Jungho Shin, Joonmyoung Lee, Sangsu Park, Myungwoo Son, Hyunsang Hwang

    Published in IEEE electron device letters (01-11-2011)
    “…We have investigated the effect of a Ge 2 Sb 2 Te 5 (GST) thermal barrier on the reset operations in TiN/Cu/SiC/Pt devices. When the GST film was introduced as…”
    Get full text
    Journal Article
  16. 16

    Excellent Selector Characteristics of Nanoscale \hbox for High-Density Bipolar ReRAM Applications by Son, Myungwoo, Lee, Joonmyoung, Park, Jubong, Shin, Jungho, Choi, Godeuni, Jung, Seungjae, Lee, Wootae, Kim, Seonghyun, Park, Sangsu, Hwang, Hyunsang

    Published in IEEE electron device letters (01-11-2011)
    “…We herein present a nanoscale vanadium oxide (VO 2 ) device with excellent selector characteristics such as a high on/off ratio (>; 50), fast switching speed…”
    Get full text
    Journal Article
  17. 17

    Impact of high-pressure deuterium oxide annealing on the blocking efficiency and interface quality of metal-alumina-nitride-oxide-silicon-type flash memory devices by Chang, Man, Hasan, Musarrat, Jung, Seungjae, Park, Hokyung, Jo, Minseok, Choi, Hyejung, Hwang, Hyunsang

    Published in Applied physics letters (05-11-2007)
    “…We have investigated the effect of high-pressure deuterium oxide annealing (HPDOA) on metal-alumina-nitride-oxide-silicon-type flash memory device. HPDOA was…”
    Get full text
    Journal Article
  18. 18

    Proton Irradiation Effects on Resistive Random Access Memory With ZrO /HfO Stacks by Daeseok Lee, Joonmyoung Lee, Seungjae Jung, Seonghyun Kim, Jubong Park, Biju, K. P., Minhyeok Choe, Takhee Lee, Hyunsang Hwang

    Published in IEEE transactions on nuclear science (01-12-2011)
    “…In this study, we investigated proton irradiation effects on resistive random access memory (ReRAM) comprising ZrO x /HfO x stacks. After irradiation, changes…”
    Get full text
    Journal Article
  19. 19

    Self-Selective Characteristics of Nanoscale \hbox Devices for High-Density ReRAM Applications by Myungwoo Son, Xinjun Liu, Sadaf, S. M., Daeseok Lee, Sangsu Park, Wootae Lee, Seonghyun Kim, Jubong Park, Jungho Shin, Seungjae Jung, Moon-Ho Ham, Hyunsang Hwang

    Published in IEEE electron device letters (01-05-2012)
    “…We herein present a hybrid-type memory device in which threshold switching and bipolar resistive switching are combined. The nanoscale vanadium oxide (VO x )…”
    Get full text
    Journal Article
  20. 20

    Multibit Operation of \hbox -Based ReRAM by Schottky Barrier Height Engineering by Jubong Park, Biju, K P, Seungjae Jung, Wootae Lee, Joonmyoung Lee, Seonghyun Kim, Sangsu Park, Jungho Shin, Hyunsang Hwang

    Published in IEEE electron device letters (01-04-2011)
    “…We demonstrated multibit operation using a 250-nm Ir/TiO x / TiN resistive random access memory by Schottky barrier height engineering. A Schottky barrier was…”
    Get full text
    Journal Article