Search Results - "JERGEL, M"

Diindenoperylene thin-film structure on MoS2 monolayer by Mrkyvkova, N., Hodas, M., Hagara, J., Nadazdy, P., Halahovets, Y., Bodik, M., Tokar, K., Chai, J. W., Wang, S. J., Chi, D. Z., Chumakov, A., Konovalov, O., Hinderhofer, A., Jergel, M., Majkova, E., Siffalovic, P., Schreiber, F.

“…Research on two-dimensional (2D) atomic crystals is one of the highly progressive topics in (opto)electronics, as the van der Waals (vdW) interactions enable…”
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Silver Nanoparticle Monolayer-to-Bilayer Transition at the Air/Water Interface as Studied by the GISAXS Technique: Application of a New Paracrystal Model by Vegso, K, Siffalovic, P, Jergel, M, Weis, M, Benkovicova, M, Majkova, E, Luby, S, Kocsis, T, Capek, I

“…An original diffraction model for the analysis of grazing-incidence small-angle X-ray scattering (GISAXS) from the nanoparticle Langmuir films was developed…”
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Intrinsic anomalous surface roughening of TiN films deposited by reactive sputtering by Auger, M. A., Vázquez, L., Cuerno, R., Castro, M., Jergel, M., Sánchez, O.

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Effect of crystallinity on UV degradability of poly[methyl(phenyl)silane] by energy-resolved electrochemical impedance spectroscopy by Schauer, F., Tkáč, L., Ožvoldová, M., Nádaždy, V., Gmucová, K., Jergel, M., Šiffalovič, P.

“…Low stability and degradability of polymers by ambient air, UV irradiation or charge transport are major problems of molecular electronics devices. Recent…”
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Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment by Colombi, P., Agnihotri, D. K., Asadchikov, V. E., Bontempi, E., Bowen, D. K., Chang, C. H., Depero, L. E., Farnworth, M., Fujimoto, T., Gibaud, A., Jergel, M., Krumrey, M., Lafford, T. A., Lamperti, A., Ma, T., Matyi, R. J., Meduna, M., Milita, S., Sakurai, K., Shabel'nikov, L., Ulyanenkov, A., Van der Lee, A., Wiemer, C.

“…X‐ray reflectometry (XRR) is a well established technique to evaluate quantitatively electron density, thickness and roughness of thin layers. In this paper,…”
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Real-Time Tracking of Superparamagnetic Nanoparticle Self-Assembly by Siffalovic, P., Majkova, E., Chitu, L., Jergel, M., Luby, S., Capek, I., Satka, A., Timmann, A., Roth, S. V.

“…The spontaneous self‐assembly process of superparamagnetic nanoparticles in a fast‐drying colloidal drop is observed in real time. The grazing‐incidence…”
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Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging by Korytár, D., Vagovič, P., Végsö, K., Šiffalovič, P., Dobročka, E., Jark, W., Áč, V., Zápražný, Z., Ferrari, C., Cecilia, A., Hamann, E., Mikulík, P., Baumbach, T., Fiederle, M., Jergel, M.

“…While channel‐cut crystals, in which the diffracting surfaces in an asymmetric cut are kept parallel, can provide beam collimation and spectral beam shaping,…”
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Behavior of giant magnetoresistance in Co–Cu–Co pseudo spin-valves after magnetic annealing by Jergel, M., Halahovets, Y., Šiffalovič, P., Végsö, K., Senderák, R., Majková, E., Luby, Š.

“…The Co/Cu/Co pseudo spin-valves were e-beam evaporated onto silicon substrates covered with thermal oxide. The X-ray diffraction and X-ray reflectivity showed…”
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Oxide nanoparticle arrays for sensors of CO and NO2 gases by Luby, S., Chitu, L., Jergel, M., Majkova, E., Siffalovic, P., Caricato, A.P., Luches, A., Martino, M., Rella, R., Manera, M.G.

“…Metal oxide sensors with active films from Fe2O3 and CoFe2O4 hexagonally assembled nanoparticle (NP) arrays were studied. NPs were synthesized by…”
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Structure and morphology evolution of ALN films grown by DC sputtering by Auger, M.A., Vázquez, L., Jergel, M., Sánchez, O., Albella, J.M.

“…Aluminium nitride (AlN) films have been deposited on (100) oriented silicon substrates by dc reactive magnetron sputtering for different deposition times (10≤…”
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Modified Langmuir-Blodgett deposition of nanoparticles - measurement of 2D to 3D ordered arrays by Chitu, L., Siffalovic, P., Majkova, E., Jergel, M., Vegso, K., Luby, S., Capek, I., Satka, A., Perlich, J., Timmann, A., Roth, S., Keckes, J., Maier, G.

“…The ordered nanoparticle monolayers and multilayers over macroscopic areas were prepared by the modified Langmuir-Blodgett method. Using this approach, the…”
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Characterization of Mo/Si soft X-ray multilayer mirrors by grazing-incidence small-angle X-ray scattering by Siffalovic, P., Majkova, E., Chitu, L., Jergel, M., Luby, S., Keckes, J., Maier, G., Timmann, A., Roth, S.V., Tsuru, T., Harada, T., Yamamoto, M., Heinzmann, U.

“…The morphology of buried interfaces plays a key role in high performing Mo/Si soft X-ray mirrors. We show that grazing-incidence small-angle X-ray scattering…”
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On ultra-thin oxide/Si and very-thin oxide/Si structures prepared by wet chemical process by Pincik, E., Kobayashi, H., Rusnak, J., Kim, W.B., Brunner, R., Malinovsky, L., Matsumoto, T., Imamura, K., Jergel, M., Takahashi, M., Higashi, Y., Kucera, M., Mikula, M.

“…The properties of ultra-thin oxide/Si and very-thin oxide/Si structures prepared by wet chemical oxidation in nitric acid aqueous solutions (NAOS) and…”
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The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers — Preliminary results from the second round-robin by Matyi, R.J., Depero, L.E., Bontempi, E., Colombi, P., Gibaud, A., Jergel, M., Krumrey, M., Lafford, T.A., Lamperti, A., Meduna, M., Van der Lee, A., Wiemer, C.

“…X-ray reflectometry (XRR) is a unique technique for thin film analysis providing information on thickness, density, and roughness. The Versailles Project on…”
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Structural characteristics and morphology of SmxCe1-xO2-x/2 thin films by HARTMANOVA, M, JERGEL, M, MANSILLA, C, HOLGADO, J. P, ZEMEK, J, JUREK, K, KUNDRACIK, F

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Relationship between effective ionic radii, structure and electro-mechanical properties of zirconia stabilized with rare earth oxides M2O3 (M = Yb, Y, Sm) by Hartmanová, M., Lomonova, E. E., Kubel, F., Schneider, J., Buršíková, V., Jergel, M., Navrátil, V., Kundracik, F.

“…Zirconia stabilized with various concentrations of rare earth oxides of Yb, Sm and Y with different effective ionic radii ratio between the dopant and host…”
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Measurement of nanopatterned surfaces by real and reciprocal space techniques by Siffalovic, P., Vegso, K., Jergel, M., Majkova, E., Keckes, J., Maier, G., Cornejo, M., Ziberi, B., Frost, F., Hasse, B., Wiesmann, J.

“…A newly developed laboratory grazing-incidence small-angle X-ray scattering GISAXS system capable of statistical measurements of surface morphology at the…”
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Passivation of defect states in Si-based and GaAs structures by Pinčík, E., Kobayashi, H., Brunner, R., Takahashi, M., Liu, Yueh-Ling, Ortega, L., Imamura, K., Jergel, M., Rusnák, J.

“…Formation of defect states on semiconductor surfaces, at its interfaces with thin films and in semiconductor volumes is usually predetermined by such…”
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Nanometer-scale period Sc/Cr multilayer mirrors and their thermal stability by Majkova, E., Chushkin, Y., Jergel, M., Luby, S., Holy, V., Matko, I., Chenevier, B., Toth, L., Hatano, T., Yamamoto, M.

“…Results of comprehensive characterization of Sc/Cr multilayers for soft X-ray mirrors working in the water window range (2.4–4.4 nm) are presented. Multilayer…”
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On a presence of SimHn clusters in a-Si:H/c-Si structures by KOPANI, M, PINCIK, E, KOBAYASHI, H, TAKAHASHI, M, FUJIWARA, N, BRUNNER, R, JERGEL, M, ORTEGA, L

“…Dominant aim of the paper was to verify the existence of the SimHn clusters in a-Si:H layers. Thin layers were deposited by plasma-enhanced chemical vapor…”
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