Search Results - "JENKON CHEN"

Mechanism of Threshold Voltage Shift (Δ V th ) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs by Liu, Chuan-Hsi, Lee, Ming T., Lin, Chih-Yung, Chen, Jenkon, Loh, Y. T., Liou, Fu-Tai, Schruefer, Klaus, Katsetos, Anastasios A., Yang, Zhijian, Rovedo, Nivo, Hook, Terence B., Wann, Clement, Chen, Tze-Chiang

“…The physical mechanism responsible for negative bias temperature instability, which is basic to the minimization of this degradation mode, is investigated, and…”
Get full text

Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-Grown oxides and NO RTA treatment by LIU, Chuan H, LIN, Hsiu-Shan, LEE, J. H, HUANG, M, HSIUNG, Chiung-Sheng, HUANG-LU, S, HSU, Chen-Chung, LIANG, Alan Y, JENKON CHEN, HSIEH, W. Y, YEN, P. W, CHIEN, S. C, LIN, Yu-Yin, LOH, Y. T, CHANG, Yih J, LIOU, Fu-Tai, CHEN, M. G, PAN, T. M, KAO, C. J, HUANG, K. T, LIN, S. H, SHENG, Y. C, CHANGE, Wen-Tung

Get full text

High performance 50 nm CMOS devices for microprocessor and embedded processor core applications by Shih-Fen Huang, Chih-Yung Lin, Yu-Shyang Huang, Schafbauer, T., Eller, M., Yao-Ching Cheng, Shui-Ming Cheng, Sportouch, S., Wei Jin, Rovedo, N., Grassmann, A., Yimin Huang, Brighten, J., Liu, C.H., von Ehrenwall, B., Chen, N., Jia Chen, Park, O.S., Commons, M., Thomas, A., Ming-Tsan Lee, Rauch, S., Clevenger, L., Kaltalioglu, E., Pak Leung, Jenkon Chen, Schiml, T., Wann, C.

“…50 nm CMOS transistors for high performance and low active power applications are presented. Good short-channel effect control is achieved down to 35 nm gate…”
Get full text

LWIR 128×128 GaAs/AlGaAs multiple quantum well hybrid focal plane array by KOZLOWSKI, L. J, WILLIAMS, G. M, SULLIVAN, G. J, FARLEY, C. W, ANDERSON, R. J, CHEN, J, CHEUNG, D. T, TENNANT, W. E, DEWAMES, R. E

Get full text

256×256 hybrid HgCdTe infrared focal plane arrays by BAILEY, R. B, KOZLOWSKI, L. J, CHEN, J, BUI, D. Q, VURAL, K, EDWALL, D. D, GILL, R. V, BEN VANDERWYCK, A, GERTNER, E. R, GUBALA, M. B

Get full text

Mechanism and process dependence of negative bias temperature instability (NBTI) for pMOSFETs with ultrathin gate dielectrics by Liu, C.H., Lee, M.T., Chih-Yung Lin, Chen, J., Schruefer, K., Brighten, J., Rovedo, N., Hook, T.B., Khare, M.V., Shih-Fen Huang, Wann, C., Tze-Chiang Chen, Ning, T.H.

“…This work mainly focuses on the NBTI (Negative Bias Temperature Instability) mechanism and investigates the degree of degradation caused by NBTI stress for…”
Get full text

256 x 256 hybrid HgCdTe infrared focal plane arrays by Bailey, R B, Kozlowski, L J, Chen, Jenkon, Bui, D Q, Vural, K, Edwall, D D, Gil, R V, Vanderwyck, A B, Gertner, E R, Gubala, M B

“…Hybrid HgCdTe 256 x 256 focal plane arrays have been developed to meet the sensitivity, resolution, and field-of-view requirements of high-performance…”
Get full text

Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N/sub 2/O-grown oxides and NO RTA treatment by Liu, C.H., Hsiu-Shan Lin, Yu-Yin Lin, Chen, M.G., Pan, T.M., Kao, C.J., Huang, K.T., Lin, S.H., Sheng, Y.C., Wen-Tung Chang, Lee, J.H., Huang, M., Chiung-Sheng Hsiung, Huang-Lu, S., Chen-Chung Hsu, Liang, A.Y., Jenkon Chen, Hsieh, W.Y., Yen, P.W., Chien, S.C., Loh, Y.T., Chang, Y.J., Fu-Tai Liou

“…Ultra-thin gate dielectrics processed by remote plasma nitridation (RPN) of N/sub 2/O-grown oxides subsequently followed by NO RTA treatment (N/sub 2/O+RPN+NO…”
Get full text