Search Results - "Ives, N.A." :: Katalog Arama

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Detection of Gold in the Facet of a Failed Semiconductor Laser Diode by Chaney, J.A., Yeoh, T.S., Ives, N.A., Leung, M.S., Feinberg, Z.D., Ho, J.G.

Published in 2007 Conference on Lasers and Electro-Optics (CLEO) (01-05-2007)
“…The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 3D TOF-SIMS. Gold, a deep level trap, was found between the…”

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Detection of gold in the facet of a failed semiconductor laser diode by Chaney, J.A., Yeoh, T.S., Ives, N.A., Leung, M.S., Feinberg, Z.D., Ho, J.G.

Published in 2007 Quantum Electronics and Laser Science Conference (01-05-2007)
“…The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 31) TOF-SIMS. Gold, a deep level trap, was found between the…”

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