Search Results - "Ismael, Daniel"
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1
Reliability Assessment of 2.5D Module using Chip to Wafer Hybrid Bonding
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Wafer to wafer hybrid bonding has been established to form fine pitch interconnections for high density I/O applications [1], [2]. However, this approach has…”
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Conference Proceeding -
2
Yield Improvement in Chip to Wafer Hybrid Bonding
Published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (01-05-2022)“…Chip to Wafer Hybrid Bonding is an attractive way to achieve ultra-fine pitch interconnect down to 6μm. Conventional way such as solder interconnects has…”
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Conference Proceeding -
3
Matar, Nabil: An Arab Ambassador in the Mediterranean World: The Travels of Muhammad ibn 'Uthmān al-Miknāsī, 1779-1788, Nueva York, Routledge, 2015
Published in Rey desnudo (01-12-2015)Get full text
Journal Article -
4
Thermo-compression bonding for 2.5D fine pitch copper pillar bump interconnections on TSV interposer
Published in 2014 IEEE 16th Electronics Packaging Technology Conference (EPTC) (01-12-2014)“…The use of portable electronic devices like smart phones and tablets results in high demand for more function, smaller dimensions and reduced power consumption…”
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Conference Proceeding -
5
Process Development of Via Formation by Laser Drilling on Insulating Resin
Published in 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC) (07-12-2022)“…To realize continuous miniaturization, improved performance and efficiency while minimizing cost of emerging new and highly functional electronic devices, the…”
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Conference Proceeding -
6
Development of High Density Fan Out Wafer Level Package (HD FOWLP) with Multi-layer Fine Pitch RDL for Mobile Applications
Published in 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) (01-05-2016)“…Recently, Fan-out Wafer Level Packaging (FOWLP) has been emerged as a promising technology to meet the ever increasing demands of the consumer electronic…”
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Conference Proceeding -
7
Stealth Dicing Challenges for MEMS Wafer Applications
Published in 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) (01-05-2017)“…In our digital world, microelectromechanical system (MEMS) are here to stay and will open the doors for the next exciting wave in the advancement of technology…”
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Conference Proceeding -
8
Development of Chip to Wafer Assembly with CuSnAg Microbump on Solder on Pad Interposer using Thermocompression and Solder Reflow
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Chip to wafer (C2W) bonding to form interconnect is not new to the industry. However, if the bottom wafer has thick (i,e ≥ 10um) Cu RDL layers, the CTE…”
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9
Chip-to-Wafer Hybrid Bonding for high performance 2.5D applications
Published in 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC) (07-12-2022)“…Chip to wafer hybrid bonding is the prefer choice for high performance 2.5D application as it offered very high dense I/O population down to 10¼m pitch with…”
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Conference Proceeding -
10
Relation d’agence dans l’exploitation de transport des taxis et taxis-bus dans la ville de Kinshasa
Published in Akofena (01-08-2021)“…Résumé : Cet article analyse la relation d’agence dans l’exploitation de transport de taxis et taxis-bus dans la ville de Kinshasa. Les kinois ont développé…”
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Journal Article -
11
Multi-Chip Stacked Memory Module Development using Chip to Wafer (C2W) Hybrid Bonding for Heterogeneous Integration Applications
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28-05-2024)“…The present study focuses on multi-chip stacked memory module development, and it encompasses a comprehensive overview of critical aspects, key learnings,…”
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Conference Proceeding -
12
Development of 4 die stack module using Hybrid bonding approach
Published in 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) (01-05-2023)“…Die stacking is commonly used in memory modules. Solder micro-bumps and through silicon via (TSVs) are common interconnects, and it may not viable or suitable…”
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Conference Proceeding -
13
Dielectric Stack Optimization for Die-level Warpage Reduction for Chip-to-Wafer Hybrid Bonding
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28-05-2024)“…Chip-to-wafer hybrid bonding is a promising packaging technology for bumpless and high-density interconnection. However, this approach presents numerous…”
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Conference Proceeding -
14
Process Development of micro-bump flip chip bonding with Non-Conductive Film
Published in 2018 IEEE 20th Electronics Packaging Technology Conference (EPTC) (01-12-2018)“…Non-Conductive Film (NCF) is one of the packaging technology used for micro-bump flip chip bonding beside capillary underfill. The bonding process used with…”
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15
Laser Drilling of Thru Mold Vias (TMVs) for FOWLP Application
Published in 2018 IEEE 20th Electronics Packaging Technology Conference (EPTC) (01-12-2018)“…Present study focuses on high aspect ratio Thru Mold Via (TMV) fabrication using nanosecond laser drill tool. Epoxy mold compound (EMC) with 25um filler size…”
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Conference Proceeding -
16
Active Device Performance after Fan-out Wafer-level Packaging Process
Published in 2018 IEEE 20th Electronics Packaging Technology Conference (EPTC) (01-12-2018)“…For the study of active device effect by fan-out wafer level packaging process, fan-out assembly processes were simulated by using actual CMOS device wafers as…”
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Conference Proceeding -
17
Process and Reliability of Large Fan-Out Wafer Level Package Based Package-on-Package
Published in 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) (01-05-2017)“…This paper presents, the development of large multi-chip fan-out wafer level package (FOWLP) based Package-on-Package (PoP) using mold-First FOLWP integration…”
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Conference Proceeding -
18
Development of chip on wafer bonding with non conductive film using gang bonder
Published in 2017 IEEE 19th Electronics Packaging Technology Conference (EPTC) (01-12-2017)“…Non-Conductive Film (NCF) is an attractive option for tacking the chip on the wafer before sending the tacked sample to gang bonder to form the solder…”
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Conference Proceeding -
19
Study of C2W Bonding Using Cu Pillar with Side-Wall Plated Solder
Published in 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) (01-05-2017)“…Cu-Cu is a prefer choice of interconnects as it offered lower electrical resistance, no risk of shorting between the bump and higher reliability as compared to…”
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Conference Proceeding -
20
Ultra-fine pitch Cu-Cu bonding of 6μm bump pitch for 2.5D application
Published in 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) (01-11-2016)“…Ultra-fine pitch (6μm) interconnects are essential for high-end application-products that demands high speed and high bandwidth inter-chip communication…”
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Conference Proceeding