Search Results - "Isaacs, Phil"
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1
Cleanliness Requirements: A Moving Target
Published in 2019 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-02-2019)“…During the last 25 years, major shifts occurred in the electronic assembly industry, such as the transition to contract manufacturing and reduction or…”
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2
Understanding Creep Corrosion Field Fails
Published in 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-02-2020)“…Dendrites, Electrochemical Migration (ECM) and parasitic leakage, are usually caused by process related contamination. For example, excess flux, poor handling,…”
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3
What makes no-clean flux residue benign?
Published in 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-01-2016)“…Since the conversion to lead-free solders, no-clean flux has become the predominate flux used in electronic card assembly and test (ECAT) manufacturing…”
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4
Evaluation of no-clean flux residues remaining after secondary process operations
Published in 2018 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-02-2018)“…In an ideal world, manufacturing devices would work all of the time, however, every company receives customer returns for a variety of reasons. If these…”
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5
Selection and Qualification of a Local Rework Supplier
Published in 2019 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-02-2019)“…In the electronics industry there is a drive to reduce the total cost of manufacturing, while maintaining the quality and reliability of the product. The drive…”
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6
Critical success factors for electronic manufacturing services
Published in 2016 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-01-2016)“…Ongoing developments in the electronics industry continue to be driven by alternative or disruptive technologies that are discovered in pursuit of satisfying…”
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7
Comparison of ionic contamination test methods to determine their ability to reliably predict performance risks
Published in 2017 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-02-2017)“…In the Electronic Manufacturing Services Industry, one of the known failure mechanisms is caused by the presence of ionic contamination. Ionic contamination…”
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8
Process considerations for lead free assemblies
Published in 2017 Pan Pacific Microelectronics Symposium (Pan Pacific) (01-02-2017)“…Often, challenges occur when transitioning legacy designed products from leaded solder materials to a RoHS compliant material set. The increased process…”
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Conference Proceeding