Search Results - "Irwin, Tim L."

Compendium of Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA by Cochran, Donna J., Kniffin, Scott D., Buchner, Stephen P., LaBel, Kenneth A., O'Bryan, Martha V., Ladbury, Raymond L., Sanders, Anthony B., Hawkins, Donald K., Cox, Stephen R., Poivey, Christian F., Oldham, Timothy R., Kim, Hak, Irwin, Tim L., Friendlich, Mark R., Dung-Phan, Anthony M., Carts, Martin A., Berg, Melanie D., Seidleck, Christina M., Forney, James D.

“…Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include…”
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Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA by Cochran, D.J., Kniffin, S.D., Ladbury, R.L., O'Bryan, M.V., Poivey, C.F., Kim, H., Irwin, T.L., Phan, A.M., Carts, M.A., Forney, J.D., LaBel, K.A., Reed, R.A., Sanders, A.B., Hawkins, D.K., Cox, S.R., Howard, J.W., DiBari, R.C., Buchner, S.P., Palor, C.D.

“…We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include…”
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Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA by Cochran, D.J., Buchner, S.P., Irwin, T.L., Kniffin, S.D., Ladbury, R.L., Palor, C.D., LaBel, K.A., Marshall, C.J., Reed, R.A., Sanders, A.B., Hawkins, D.K., Flanigan, R.J., Cox, S.R., O'Bryan, M.V., Carts, M.A., Poivey, C.F., Howard, J.W., Kim, H.S., Forney, J.D., Marshall, P.W.

“…We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include…”
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